Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.
● High resolution surface sensitive information and materials contrast.
● Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.
![Scanning Electron Microscopes (SEM)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.100.33.file/sem-wallpaper-80.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.360.120.file/sem-wallpaper-80.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.768.256.file/sem-wallpaper-80.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1024.341.file/sem-wallpaper-80.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1280.427.file/sem-wallpaper-80.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original.image_file.1440.480.file/sem-wallpaper-80.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper-80.jpg/_jcr_content/renditions/original./sem-wallpaper-80.jpg"} "Scanning Electron Microscopes (SEM)")
![ZEISS SmartSEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo-smartsem-controller.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo-smartsem-controller.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo-smartsem-controller.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg"} "ZEISS SmartSEM")