ZEISS MultiSEM 505/506
The World’s Fastest Scanning Electron Microscopes
Unleash the acquisition speed of up to 91 parallel electron beams – to image samples in the centimeter scale at nanometer resolution. This unique scanning electron microscope is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and MultiSEM will acquire high-contrast images automatically.
Revolutionize the Speed of Electron Microscopy
Multiple electron beams working in parallel give you unprecedented gross imaging speed. Acquiring an area of 1 mm2 at 4 nm pixel size takes only a few minutes. The unrivaled acquisition speed of more than 1 TB per hour enables imaging of large volumes (> 1 mm3) at nanometer resolution. Optimized detectors collect the secondary electron signals very efficiently, providing you with high contrast images at low noise levels.
Caption: Mouse brain section, maximum acquisition speed of 1.22 gigapixels/second. Courtesy of J. Lichtman, Harvard University, Cambridge, MA, USA.
Image Huge Samples at Nanometer Resolution
Don’t sacrifice sample size for nanometer resolution. MultiSEM is equipped with a sample holder covering an area of 10 cm × 10 cm and built for continuous 24/7 operation. You can finally image the entire sample and discover everything you need to answer your scientific questions. You get the detailed picture‚ without losing the macroscopic context.
Electron Microscopy with ZEN Imaging Software
By introducing ZEN to MultiSEM, we bring the standard software for ZEISS light microscopes to the world of electron microscopy. Control MultiSEM in a straightforward, intuitive way: Smart auto-tuning routines support you as you capture optimal images with high resolution and quality. You quickly set up even complex automated acquisition procedures, adapted and tuned to your sample imaging.
The ZEISS MultiSEM Family
MultiSEM 505
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MultiSEM 506
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---|---|---|
Number of beams |
61 |
91 |
Scan arrangement |
Image tile consists of 61 sub images arranged in a hexagonal pattern |
Image tile consists of 91 sub images arranged in a hexagonal pattern |
Field of view at 12 µm pitch size |
108 μm |
132 μm |
Field of view at 15 µm pitch size (optional) |
135 μm |
165 μm |
The Technology Behind ZEISS MultiSEM
Multiple Electron Beams and Detectors in Parallel
MultiSEM uses multiple electron beams (green: illumination path) and detectors in parallel. A finely tuned detection path (red) collects a large yield of secondary electrons (SE) for imaging. Each beam carries out a synchronized scanning routine at one sample position, resulting in a single sub image. The electron beams are arranged in a hexagonal pattern. The full image is formed by merging all image tiles. A parallel computer setup is used for fast data recording, ensuring high total imaging speed. Image acquisition and workflow control are fully separated in the MultiSEM system.
External Publications
- Brain mapping in high resolution (nature.com)
- Connectomics (Cell Press Nucleus)
- High throughput data acquisition with a multi-beam SEM
- Mission (im)possible – mapping the brain becomes a reality
- High-resolution, high-throughput imaging with MultiSEM 505
- Multiple-Beam Scanning Electron Microscopy (Microscopy Today)
- Further advancing the throughput of a multi-beam SEM