Oberkochen/Germany | 24 April 2018 | Industrial Metrology

The latest sensor systems from ZEISS offer increased efficiency along with greater flexibility for the user. At the Control trade fair in Stuttgart from 24 through 27 April 2018, the company will present several sensors from its portfolio.

The sensors featured at Control will include the next generation of roughness sensor, the ZEISS ROTOS, and the ZEISS DotScan. "Our enhanced sensors help make our customers' measurement processes even faster, more flexible and more holistic," says Andrzej Grzesiak, Head of Metrology Systems at the ZEISS Industrial Metrology business group.

The new enhanced ZEISS ROTOS roughness sensor can be used on coordinate measuring machines to perform standard-compliant surface waviness and roughness inspections – even on complex workpieces, and all in a single measurement run without any reclamping. This cutting-edge innovation simplifies and speeds up the measurement of all surface parameters from the drawing in a single process step. The sensor makes it is possible to check the size, form and location tolerances together with the roughness parameters on a single machine. Instead of requiring separate stylus instruments to capture more significant form deviations such as waviness or roughness, these can now be performed on a CNC-controlled CMM.

The innovative design of the new ZEISS ROTOS enables the inspection of nearly all workpiece characteristics. Thanks to the three rotatable axes and multiple stylus arms, it is also possible to measure deep boreholes and difficult-to-reach surfaces. Even overhead measurements are not a problem for this sensor. Programming the surface parameters is quick and easy because the ZEISS ROTOS is completely integrated in ZEISS CALYPSO, the company's measuring software. The benefits of this new sensor speak for themselves: "Companies no longer have to invest in separate systems for at-line roughness measurements and can efficiently perform inspections on one machine," explains Michael Zimmermann, Application Engineer at the ZEISS Industrial Metrology business group.

It will soon be possible to inspect sensitive, reflective and low-contrast surfaces more quickly than ever before with the ZEISS O-INSPECT multisensor measuring machine. Starting in May 2018, all new systems will come standard with an interface for the ZEISS DotScan chromatic-confocal white light sensor. Due to technical requirements, measuring machines already in use can still be operated with or retrofitted for the chromatic focus sensor (CFS). The switch to the ZEISS DotScan sensor for all multisensor measuring machine models will offer several advantages to customers. Unlike with a CFS sensor, operators using the ZEISS DotScan can switch it in and out as needed. "This saves a lot of time and increases flexibility – particularly at companies that manufacture very different products," says Christoph Stark, Product Manager at the ZEISS Industrial Metrology business group.

The sensor is available in three sizes for different measuring ranges: one, three and ten millimeters. Moreover, operators can now use a rotary table on the ZEISS O-INSPECT to optimum effect with the ZEISS DotScan for optical scanning. This feature was previously not available for the CFS sensor. "You save a considerable amount of time with the ZEISS DotScan," says Stark. The measuring speed of the sensor, which is dependent on several factors, ranges from 100 to 150 mm per second.

Thanks to the innovative integration of the sensor in all interfaces, the operator can insert the probing system in the measuring software and capture the data points on the component using the standard ZEISS CALYPSO user interface without any difficulty. The ZEISS O-INSPECT will be presented together with the ZEISS DotScan at Control 2018. Stark expects this new innovation to be a hit with customers: "We are confident that this sensor will significantly increase our customers' efficiency."