Precision and Efficiency in 3D X-ray Microscopy

• Designed to flexibly address dynamic needs
• Increases return on investment
• Provides greater accessibility to a wider array of users

ZEISS introduces its latest innovation in the field of 3D X-ray microscopy: the ZEISS VersaXRM 730^®. This cutting-edge system sets a new standard in performance, choice, and accessibility.

In view of the rapid pace of technological development, design and quality engineers require advanced tools that can keep pace with the new challenges. The ZEISS VersaXRM 730 is engineered to meet these dynamic needs by delivering breakthrough resolution, faster throughput, and reduced time-to-results, accelerating productivity in various research environments. The system’s intuitive guidance and control software, the award-winning ZEN navx^™, enhances accessibility, catering to users at all experience levels. FAST Mode facilitates one-minute tomographies, significantly speeding up 3D imaging by utilizing continuous sample motion data collection.

Development, quality control and non-destructive inspection of new parts in the manufacturing industry requires efficient scanning, precise component selection, and high resolution, non-destructive imaging to enable device evaluation and improvement. "Featuring innovative, patented technologies wrapped in an award-winning software environment, the ZEISS VersaXRM 730 delivers breakthrough performance, increased processing speed and time to results that represent a dramatic advance in 3D X-ray microscopy, with broad applications benefiting research and quality control in the fields of automotive, electronics, aerospace, medical devices, additive manufacturing, and many other industries." said Daniel Sims, Head of Business Unit Industrial Microscopy Solutions at ZEISS. "We’ve capitalized on the most proven and versatile XRM platform, representing our commitment to excellence and once again advancing the field of 3D X-ray microscopy."

The ZEN navx guidance and control system is a systematic approach of built-in guidance, automated workflows, and intelligent system insights. It enables even the newest user in a busy environment to be immediately productive, achieve results more easily and efficiently, and obtain the right data the first time without extensive training. It also allows experienced users to explore the full versatility of the platform. ZEN navx provides system and sample protection with its built-in SmartShield. Additionally, ZEN navx File Transfer Utility (FTU) automatically transfers data from the microscope to other locations so that users have their information where they need it, when they need it.

"The new navx software has been instrumental in improving workflows for acquiring 3D datasets," said Professor André Phillion from the Department of Materials Science and Engineering at McMaster University, Ontario, Canada. "Due to the safety and built-in sample knowledge, we find it especially useful when training young researchers to be independent system users. It has also helped to reduce the time needed for setting up a sample run."

The optional flat panel extension (FPX) on the ZEISS VersaXRM series further increases versatility, delivering one-minute tomographies via FAST Mode. FAST Mode enables true, nearly real-time 3D navigation for all samples thanks to full integration with the Volume Scout workflow in ZEN navx. A combination of detector designs, including the high resolution 40x-Prime detector with 450 nm spatial resolution, allows for the widest range of sample sizes and types to be studied efficiently and accurately. With more X-ray photons available on ZEISS VersaXRM, users can now achieve even faster time to results for varied sample sizes without compromising resolution.

ZEISS VersaXRM 730 is also equipped with game-changing AI, unlocking entirely new application capabilities. The highly effective DeepRecon Pro, a module from the Advanced Reconstruction Toolkit, is now a standard feature on ZEISS VersaXRM platforms, with a high-performance workstation and two-year software license. Innovation in throughput and image quality performance across both hardware and software help users to achieve maximum impact with their research.

ZEISS VersaXRM 730 and VersaXRM 615 are both available now. ZEISS invites researchers and engineers to experience the power of perfect tomographies, for every user, every sample, every time with these systems.