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ZEISS METROTOM 6 scout

METROTOM 6 scout​

The powerhouse of resolution for CT inspection and metrology​ ​

ZEISS METROTOM 6 scout digitizes complex parts, including internal geometries, at the most advanced level of detail. The result is a complete 3D image for GD&T analysis or target/actual comparisons. The CT metrology system is an excellent choice for digitizing small plastic parts.​

  • Extremely high resolution​
  • High level of precision​
  • Automatic object positioning​
  • All-in-one software
ZEISS METROTOM 6 Scout
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High-resolution measurements of small plastic parts​

ZEISS Metrotom 6 scout is the perfect solution for non-destructive inspection and 3D metrology of components. Advanced measurement performance and seamless workflow ensure maximum reliability and precision in defect detection.​
Reveal what's hidden with other technologies​ ​
Reveal what's hidden with other technologies​ ​

Reveal what's hidden with other technologies​ ​

Resolution​

When digitizing a part, ZEISS METROTOM 6 scout achieves outstanding sharpness of detail: Firstly, because it uses a high-resolution 3k X-ray detector to acquire the measurement data, and secondly, because each part is measured in the best possible measuring position and therefore always at the highest possible resolution. The result can be seen in the image: On the left, measurement data generated with the ZEISS METROTOM 6 scout and on the right, the usual standard.​

Guarantees high precision​

​Guarantees high precision​

Accuracy

The ZEISS METROTOM 6 scout uses mathematical intelligence to generate its precise 3D measurement data. During the entire measuring process, it combines perfectly interlinked algorithms with digital modeling of the measuring room. It also offers optimized mechanical stability for all components relevant to the measurement. The bottom line: Based on the measuring results, you can evaluate the quality of a part in a truly reliable and highly accurate way and conduct further analysis.​

Centers parts automatically​

A 5-axis kinematics system with an integrated centering table optimally positions the part in the measuring volume. Simply place it in the machine's measuring room - the rest is done by the software.​

All-in-one software​

  • Intuitive and powerful​
  • One solution for all process steps​

    One solution for all process steps​

    One single software, ZEISS INSPECT X-Ray, combines the control of the system and the metrological evaluation of the data. As a result, no additional software or intermediate steps are required. ​

    This ensures a seamless process and significantly simplifies the workflow from raw data acquisition to inspection and measurement reporting.​

  • Intuitive and powerful​

    Intuitive and powerful​

    ZEISS INSPECT X-Ray software provides full 3D analysis of CT data to evaluate part quality and optimize your manufacturing process. Individual sectional images enable you to view the volume layer by layer, revealing even the smallest details and defects. Detected defects can be analyzed in detail and automatically evaluated according to various criteria. In addition, you can load volume data from multiple components into a project, perform a trend analysis, and compare the analysis to CAD data. All measurement results are documented and summarized in a well-structured report. Intuitive operation and high performance: Analyzing CT data has never been easier! ​

ZEISS METROTOM​

Technical data

Feature

X-Ray source

225 kV

X-Ray detector

Resolution: 3008 x 2512 pixels

Measuring area

d: 240 mm ​
h: 400 mm​

Voxel size

2 µm - 80 µm​

Dimension

H. 2210 mm​
W. 2200 mm​
D. 1230 mm​

Weight

4800 kg

Field of application

First article inspection, tool correction, inspection during ongoing production​

Inspection features

Internal structures, wall thickness, material defects, pores, and shrinkage cavities​

Measuring tasks

GD&T analysis, nominal-actual comparison, assembly analysis​

Downloads

    • Preview image of EN_ZEISS METROTOM 6 scout_Flyer_online

      EN_ZEISS METROTOM 6 scout_Flyer_online

      Pages: 8
      File size: 612 KB
      Download
    • Preview image of EN, ZEISS X-Ray Series Brochure_Online

      EN, ZEISS X-Ray Series Brochure_Online

      Pages: 14
      File size: 1 MB
      Download

Contact us​

Interested in exploring our products or services further? We're excited to offer you more details or a live demo, either remotely or in person.​

ZEISS Metrology Shop

Easily order probes, measurement accessories, and more​

ZEISS Metrology Portal

Get access to the full range of systems and software services​

ZEISS Academy Metrology

Your personalized metrology training, available in different formats

Do you need more information?

Get in touch with us. Our experts will get back to you.

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