ZEISS GeminiSEM
The class leader in sample flexibility
Discover the unknown and meet the highest demands in sub-nanometer imaging, analytics, and sample flexibility with a field emission SEM. The system enables high throughput analysis while providing excellent resolution at low voltage, high speed, and high probe current.
ZEISS GeminiSEM for industry
Experience a new quality in the inspection of your samples.
The system enables high throughput analysis while providing excellent resolution at low voltage, high speed, and high probe current. With its generous field of view and extremely spacious chamber, it is easy to examine even very large samples.
ZEISS GeminiSEM delivers efficient chemical composition and crystal orientation characterization with two diametrically opposed EDS ports and a coplanar EDS/EBSD configuration. Rely on shadow-free mapping at high speed.
Customize and automate your workflows: If you need to test materials to their technical limits, ZEISS puts an automated in-situ heating and mechanical stress lab at your disposal.
Fields of application at a glance
- Failure analysis on mechanical, optical, and electronic components
- Fracture analysis and metallography
- Surface, microstructure, and device characterization
- Compositional and phase distribution
- Impurity and inclusion determination