ZEISS Sigma​

From manufacturing cleanliness and engine wear prediction to steel production, environmental management, and additive manufacturing – particle analysis solutions with an electron microscope from ZEISS automate your workflows and increase reproducibility.​

Correlated analysis spanning light and electron microscopy​ in a seamless integrated workflow​

• Automatic integrated LM/EM reporting​
• Pinpoint sources of contamination​
• Make informed decisions faster​
• Continually improve production quality​
• Faster results: automated analysis instead of continuous individual analyses, plus faster particle inspection and testing with integrated machine learning algorithms​

ZEISS ZEN Intellesis enables particle identification by machine learning. The results can be accessed via the powerful ZEISS ZEN Connect software. ZEISS ZEN Intellesis then provides further insight into the particle distribution based on machine learning image segmentation and object classification. ​

For an SEM image (1), image analysis is used to segment all particles (2) and measure chosen features. Measurements can be displayed in the form of size distribution, for example. Intellesis Object Classification is used to further classify segmented particles and sort these into their sub-types (3). The particle count per type can be executed using this information. Object classification is performed for standard nano- and microplastic particles (polystyrene (PS, light blue), polyethylene (PE, green), polyamide–nylon 6 (PA, dark blue), and polyvinyl chloride (PVC, red)) on a polycarbonate filter imaged with ZEISS Sigma. This correlative study combines the high resolution of an electron microscope with the analytical capabilities of a Raman microscope. ​