![Makrodetail eines RGB-LED-Bands]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.100.100.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.360.360.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.768.768.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.1024.1024.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.1280.1280.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.1440.1440.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/display-led-photonics-microscopy-solutions.jpg/_jcr_content/renditions/original.image_file.1442.1442.300,0,1742,1442.file/display-led-photonics-microscopy-solutions.jpg"} "Makrodetail eines RGB-LED-Bands")
Beschleunigen Sie die Entwicklung und Herstellung mit fortschrittlicher Mikroskopie
Höhere Produktionsmengen defektfreier Komponenten
Die Verbrauchernachfrage nach helleren und interaktiveren Displays in elektronischen Produkten treibt innovative Entwicklungen in der stark umkämpften Display-Branche voran. Neue Display-Technologien wie LCDs und starre Leuchtdioden (OLED) können inzwischen in großen Mengen und zu geringen Kosten hergestellt werden. Premium-Verbraucherprodukte bieten bereits heute flexible OLED- und microLED-Displays.
OLED-, microLED- und Photonik-Anwendungen sind komplexe Systeme, in denen empfindliche, schwer zu analysierende Materialien verwendet werden, deren Entwicklung und Herstellung fortschrittliche Mikroskopietechnologien erfordern.
3D‑Tomografie eines Bildsensors
3D-FIB-SEM-Tomografie-Datensatz eines Bildsensors, aufgenommen mit ZEISS Crossbeam. Volumen: 15,5 × 15,3 × 11,2 µm3, Voxelgröße (15 nm)3. Diese Technik kommt beispielsweise bei der Untersuchung der räumlichen Rissausbreitung in 3D‑Datensätzen zur Anwendung.
3D‑Tomografie eines Smartphone-Kameramoduls
![3D‑Röntgenbild eines Smartphone-Kameramoduls]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.100.100.file/smartphone-camera-module-3d-xrm.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.360.360.file/smartphone-camera-module-3d-xrm.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.768.768.file/smartphone-camera-module-3d-xrm.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/smartphone-camera-module-3d-xrm.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/smartphone-camera-module-3d-xrm.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/smartphone-camera-module-3d-xrm.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/electronics-and-semiconductor/microscopy-solutions-for-semiconductor-and-electronics/smartphone-camera-module-3d-xrm.jpg/_jcr_content/renditions/original./smartphone-camera-module-3d-xrm.jpg"} "3D‑Röntgenbild eines Smartphone-Kameramoduls")
3D‑Rekonstruktion eines Smartphone-Kameramoduls
3D‑Rekonstruktion eines Smartphone-Kameramoduls
Zerstörungsfreies 3D‑Röntgen-Imaging eines Kameramoduls, Auflösung: 18 µm/Voxel; zeigt den CMOS-Bildsensor und andere mechanische Komponenten.
Aufgenommen mit ZEISS Xradia Versa-Röntgenmikroskop
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Analyse eines Smartphone-Kameraobjektivs
Analyse eines Smartphone-Kameraobjektivs
Virtueller Querschnitt mit Fokus auf die aus sechs Schichten bestehenden optischen Linse, Auflösung: 18 µm/Voxel.
Aufgenommen mit ZEISS Xradia Versa-Röntgenmikroskop und Compton-Streuung sowie einem proprietären Lichtquellen-Filter von ZEISS
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