![Quantitative EBSD-Untersuchungen von weichmagnetischen Werkstoffen mit ZEISS Sigma 300]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.100.100.230,0,824,594.file/screensaver-routine-metallography-3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.360.360.230,0,824,594.file/screensaver-routine-metallography-3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg"} "Quantitative EBSD-Untersuchungen von weichmagnetischen Werkstoffen mit ZEISS Sigma 300")
Die Revolution für die metallografische Routine
Bahnbrechende Mikroskoplösungen für die Metallanalyse im Überblick
Die Eigenschaften eines Metalls und sein Verhalten im Einsatz werden durch seine Mikrostruktur bestimmt. Alle wichtigen mechanischen Eigenschaften, das Korrosions- und das Ermüdungsverhalten ergeben sich aus der Kombination von Korngröße, Zusammensetzung, Phasengröße/-verteilung, Einschlüssen und lokalen mikrostrukturellen Abweichungen.
ZEISS bietet ein Portfolio mit erstklassigen Lösungen, die verschiedenste Mikroskopierverfahren für die metallografische Routine und die Qualitätskontrolle abdecken:
![Optimierte Bildanalyse mit Machine Learning]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.100.67.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.360.240.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.768.512.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg"} "Optimierte Bildanalyse mit Machine Learning")
![Optimierte Bildanalyse mit Machine Learning]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.100.80.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.360.289.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.768.616.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg"} "Optimierte Bildanalyse mit Machine Learning")
Optimierte Bildanalyse mit Machine Learning
Vor der quantitativen Analyse eines Bilds oder eines 3D-Datensatzes steht immer die Segmentierung. Dabei wird das Bild in verschiedene Bereiche unterteilt, die dann auf gewisse Weise voneinander unterschieden werden. Die anschließende Analyse der Bereiche liefert dann aussagekräftige, umsetzbare Daten. Diese Bereiche sind beispielsweise einzelne Körner, Einschlüsse, Poren, verschiedene Phasen, Schichten oder andere Elemente, die näher untersucht werden müssen.
Doch in bestimmten Bereichen kann die Segmentierung eine Herausforderung darstellen:
- Bereiche können ähnliche Farben/einen ähnlichen Kontrast aufweisen
- Bereiche können sich nur durch ihre Textur unterscheiden
- Artefakte/Kratzer können falsch positive Ergebnisse liefern
- Rauschen in 3D-Datensätzen verhindert eine präzise Segmentierung
- Die Analyse von Mehrkanalbildern (RGB oder mehr) ist zunehmend komplex
![ZEISS ZEN Intellesis überwindet diese Hindernisse bei der Segmentierung mit geführtem Machine Learning.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.100.75.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.360.270.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.768.576.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg"} "ZEISS ZEN Intellesis überwindet diese Hindernisse bei der Segmentierung mit geführtem Machine Learning.")
![ZEISS ZEN Intellesis überwindet diese Hindernisse bei der Segmentierung mit geführtem Machine Learning.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.100.104.file/zen-intellesis-monitor_2021.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.360.375.file/zen-intellesis-monitor_2021.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.768.800.file/zen-intellesis-monitor_2021.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg"} "ZEISS ZEN Intellesis überwindet diese Hindernisse bei der Segmentierung mit geführtem Machine Learning.")
ZEISS ZEN Intellesis überwindet diese Hindernisse bei der Segmentierung mit geführtem Machine Learning. Anwender nehmen das Training im Rahmen eines einfachen grafischen Workflows vor, anschließend wird jedes Pixel anhand von mehr als 30 verschiedenen Parametern untersucht, um so jeden Bereich der richtigen Kategorie zuzuweisen. Dieser Vorgang wird laufend wiederholt. So wird das Machine-Learning-Modell trainiert und seine Leistungsfähigkeit und Treffergenauigkeit werden erhöht. Anschließend können die Anwender dann automatisch das Machine Learning auf den gesamten Datensatz anwenden und Hunderte von Bildern oder 3D-Datensätze in einem Format segmentieren, das sich mühelos analysieren lässt. Ganz ohne Vorkenntnisse im Machine Learning bringt ZEISS ZEN Intellesis die Vorteile der künstlichen Intelligenz an den Arbeitsplatz jedes Mikroskopanwenders.
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![ZEISS Axioscope für die Materialforschung]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg"} "ZEISS Axioscope für die Materialforschung")
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Downloads
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Mikroskopische Methoden in der Metallographie
mit ZEISS Axio Observer
Dateigröße: 5 MB -
Erweiterte Segmentierung für Industriewerkstoffe mit Machine Learning
ZEISS ZEN Intellesis ist ein Modul für die ZEISS ZEN Mikroskopsteuerungssoftware.
Dateigröße: 1 MB
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ZEISS Microscopy Solutions for Steel and Other Metals
Multi-modal characterization and advanced analysis options for industry and research
Dateigröße: 14 MB
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![Vorschaubild von Mikroskopische Methoden in der Metallographie]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/fb6996fc-cb2a-4db2-a36d-0ce22fd1614e/DE_wp_Microscopic_Methods_Metallography.pdf.jpg"} "Download Mikroskopische Methoden in der Metallographie")
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