Rasterelektronenmikroskope (SEM) ermöglichen Probenscans mit einem fokussierten Elektronenstrahl und erfassen Bilder mit Informationen zur Topografie und Zusammensetzung der Probe.
CSEMs (konventionelle SEMs mit thermischer Elektronenquelle) und FE-SEMs (Feldemissions-SEMs mit Feldemissions-Elektronenquelle) von ZEISS bieten hochauflösendes Imaging und überragenden Materialkontrast.
● Hochaufgelöste, oberflächenempfindliche Informationen und Materialkontrast.
● Weit verbreitet in Nanotechnologie, Materialforschung, Biowissenschaften, Halbleiter, Rohstoffe und Industrie.
![Scanning Electron Microscopes (SEM)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/sem-wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/sem-wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/sem-wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/sem-wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/sem-wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/sem-wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original./sem-wallpaper.jpg"} "Scanning Electron Microscopes (SEM)")
![ZEISS SmartSEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo-smartsem-controller.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo-smartsem-controller.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo-smartsem-controller.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg"} "ZEISS SmartSEM")