ZEISS is revolutionizing customized automation in microscopy
Targeted solutions provide a rapid ROI for unique customer requirements
Jena, Germany | 11 January 2021 | ZEISS Research Microscopy Solutions
ZEISS today introduces ZEISS Solutions Lab, an innovative service, that provides its customers with rapid access to new applications for their microscopy systems or correlative microscopy suites. ZEISS Solutions Lab enables customers to select, or to drive demand for module-based workflows built on ZEISS software packages for a wide variety of requirements specific to their research needs.
Agile systematic to enhance microscope functionality
Analytical requirements can vary widely across applications and are traditionally difficult to address in a heterogenous marketplace. Developed for agile response, a fast-acting team and intelligent software toolkit are able to rapidly implement specialized solutions that enhance microscope functionality, provide specific measurement or analysis capabilities, or automate complicated workflows, unique to the customer requirements. By providing a rapid response approach, the ZEISS rapid applications development team supports a new market-driven path to long term development.
Rapid Return-on-Investment
Solutions developed by the ZEISS Solutions Lab team enable customers to be efficient with their advanced optical or electron microscopy, FIB-SEM, or X-ray microscopes from day one, allowing them to realize the value of their investments far earlier. They also provide access to advanced technology, enabling applications that may not have previously existed, or been practical to achieve. This provides built-in flexibility and longevity for what can be a significant capital equipment investment for higher-end systems, making them more accessible and viable in a routine workstream.
Dr. Bernhard Schwarz, head of ZEISS Software at ZEISS Research Microscopy Solutions , says, “The Solutions Lab is a unique response in the world of microscopy to the rapidly changing requirements of our customers, in both the industrial and academic research sectors, for solutions that focus on their immediate needs for micro- to nanoscale characterization of new or advanced materials or functionality. These solutions also make advanced microscopy systems easy to use for a wide variety of skillsets.”
To date, solutions have been created in the fields of geoscience, mining, metallurgy, additive manufacturing, and semiconductor R&D. Examples of just some of the unique applications include pore and particle analysis for both additive manufacturing and mining, hard phase analysis for cast iron, profilometry solutions for thin films, permeability prediction using thin sections, measurement of dendrite arms, and 3D surface exposure analysis.