Elevating 3D characterization with enhanced performance and efficiencies

• Designed to flexibly address dynamic needs
• Increases return on investment
• Provides greater accessibility to a wider array of users
  

Today, ZEISS launches its latest innovation in the field of X-ray microscopy: ZEISS VersaXRM 730^®. The new system offers researchers an unprecedented level of performance, choice, and accessibility.

As technology continues to evolve at a rapid pace, it is essential for researchers to have access to cutting-edge capabilities that can keep up with the changing landscape. ZEISS VersaXRM 730 is designed to meet these dynamic requirements, offering breakthrough resolution performance as well as faster throughput and time-to-results to accelerate productivity. The platform’s intuitive guidance and control system, the award-winning ZEN navx^™, takes accessibility to the next level, accommodating users of all skill levels. FAST Mode delivers one-minute tomographies, dramatically accelerating 3D imaging by using continuous sample motion data collection.

“Successful 3D X-ray microscopy requires efficient exploration, precise feature targeting, and powerful capabilities to enable new discoveries. With new, patented technologies wrapped in an award-winning software environment, ZEISS VersaXRM 730 delivers synergistic performance that is truly more than the sum of its parts”, said Martin Fischer, Head of Global Sales and Service. “We’ve capitalized on the most proven and versatile XRM platform, representing our commitment to excellence and once again advancing the field of 3D X-ray microscopy.”

The ZEN navx guidance and control system is a systematic approach of built-in guidance, automated workflows, and intelligent system insights. It enables even the newest user in a busy environment to be immediately productive, achieve experimental results more easily and efficiently, and obtain the right data the first time without extensive training. It also allows experienced users to explore the full versatility of the platform. ZEN navx provides system and sample protection with its built-in SmartShield. Additionally, ZEN navx File Transfer Utility (FTU) automatically transfers data from the microscope to other locations so that users have their information where they need it, when they need it.

“The new navx software has been instrumental in improving workflows for acquiring 3D datasets,” said Professor André Phillion from the Department of Materials Science and Engineering at McMaster University, Ontario, Canada. “Due to the safety and built-in sample knowledge, we find it especially useful when training young researchers to be independent system users. It has also helped to reduce the time needed for setting up a sample run.”

The optional flat panel extension (FPX) on the ZEISS VersaXRM series further increases versatility, delivering one-minute tomographies via FAST Mode. FAST Mode enables true, nearly real-time 3D navigation for all samples thanks to full integration with the Volume Scout workflow in ZEN navx. A combination of detector designs, including the high resolution 40x-Prime detector with 450 nm spatial resolution, allows for the widest range of sample sizes and types to be studied efficiently and accurately. With more X-ray photons available on ZEISS VersaXRM, users can now achieve even faster time to results for varied sample sizes without compromising resolution.

ZEISS VersaXRM 730 is also equipped with game-changing AI, unlocking entirely new application capabilities. The highly effective DeepRecon Pro, a module from the Advanced Reconstruction Toolkit, is now a standard feature on ZEISS VersaXRM platforms, with a high-performance workstation and two-year software license. Innovation in throughput and image quality performance across both hardware and software help users to achieve maximum impact with their research.

ZEISS VersaXRM 730 and VersaXRM 615 are both available now. ZEISS invites researchers to experience the power of perfect tomographies, for every user, every sample, every time with these systems.