Helping You Engineer the Alloys of the Future
Advance Aluminum with a Full Multiscale Microscopy Portfolio
Metallurgists and engineers continue to push the boundaries of what is possible to achieve in construction and mobility, to challenge the accepted wisdom of what metals can do, faced with ever increasing resource scarcity. The higher the requirements of automotive, structural and transportation alloys, the greater the need for understanding and engineering metals at the micron and nanometer scale.
ZEISS solutions can help you extract information from aluminum samples on scales from the millimeter to the nanometer, whether imaging and measuring features, chemical and crystallographic analysis of inclusions, grains and phases, or textural and structural information in three dimensions, in turn meeting the needs of your customers and our world.
Assess and Quantify Surface Finishes and Roughness
Good control of surface finish and roughness is key for many applications: wear resistance, cosmetic appearance, or coating. Varying surface finishes may be created by methods such as grinding, grit blasting, coating, or corrosion. Each technique creates different surface features: these may be beneficial or detrimental depending on the application. Coatings may also be applied to your materials – functional, protective, or cosmetic – and the surface properties of coatings will dominate the behavior of your component in service. Quantifying and assessing the surface properties is key for routine quality assurance as well as research and development into new coating and surface preparation methods.
- Roughness
- Peak height
- Volume and shape of asperities or pits
- Embedded particles
- Damage assessment – wear, scratches, or impact
- Surface contamination
- Coating thickness and profile
- 3D mapping
Using ZEISS confocal microscopes, your surfaces can be mapped with high planar resolution (0.5 µm) and extremely high lateral resolution (120 nm) to build up a complete 3D picture of your surface. ConfoMap software offers you a full suite of surface analysis features including full dimensional and statistical measurement, ISO roughness measurement, and advanced visualization capabilities. ZEISS scanning electron microscopes and EDS systems further support all your needs for high depth of field imaging, compositional analysis, and large-area mapping.