![Revolutionizing microstructural analysis of steel and alloys]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg"} "Revolutionizing microstructural analysis of steel and alloys")
Revolutionizing microstructural analysis of steel and alloys
Resolve the metals industries' research and routine characterization challenges
Steel continues to play a vital role in the infrastructure, transportation and connectivity development of the world. Steel is constantly undergoing innovation, from novel advanced high-strength steels (AHSS), particularly for high-end automotive applications, new alloys for construction, and stronger more resilient alloys. Microscopy is needed at every step of the process - from routine assessment to research and development - to provide multidimensional data on all aspects of your microstructure.
ZEISS solutions unlock the secrets of steel.
![Nanoscale 3D Imaging of Buried Features]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.100.75.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.360.270.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.768.576.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg"} "Nanoscale 3D Imaging of Buried Features")
Nanoscale 3D Imaging of Buried Features
Metals and alloys are three dimensional, and require a three dimensional approach to characterize their microstructure. Sometimes the tiniest features have a great impact on macrostructural performance.
Using a ZEISS Crossbeam focused ion beam scanning electron microscope (FIB-SEM) with femtosecond laser opens a range of new analytical possibilities to fully understand your samples in three dimensions.
- Locate your region of interest with high resolution ZEISS X-ray microscopes to precisely locate and analyze buried features
- Relocate features in the ZEISS Crossbeam and prepare highly polished cross-sections through regions of interest
- Extremely rapid milling with ZEISS Crossbeam Laser can remove regions of your sample to access deeply buried features fast
- Quickly and reliably prepare lamellae for transmission electron microscopy
- Slice and image through features of interest - build up a complete picture in 3D by taking images, EDS maps, or EBSD maps of every single slice
- Assess advanced steels, dissimilar joints, inclusions, precipitates, dual-phase alloys, and other complex microstructures
Impact of Non-metallic Inclusions on Steel and Alloys
Non-metallic inclusions are present in all grades of steel and related alloys. They affect the behavior of the steel in service, usually negatively, with potential effects including dynamic fracture toughness reduction, lowered impact energy absorption, and a local reduction in corrosion resistance. Very large inclusions (usually introduced by contamination) can even lead to catastrophic failure of the steel. Determining the size, type, and distribution of inclusions is important for routine quality assurance as well as understanding steel properties.
ZEISS ZEN Non-metallic Inclusions (NMI) modules make analysis fast and straightforward with simple workflow and easy-to-use gallery view of inclusions plus inspection of individual fields and inclusions. The fully automated setting of color thresholds, stripping out artifacts, and automatic detection of steel rolling direction make detection and mapping of inclusions more reliable, mitigating issues with sample preparation. Extremely high precision and reproducibility in the hardware enables reliable mapping of large areas while still allowing you to automatically return to any field or inclusion of interest for deeper analysis or reclassification.
What's more, you can supercharge your research into NMI in the scanning electron microscope, imaging and characterizing individual inclusions with high resolution and analytical flexibility.
![Ore and sinter analysis ]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,1278,959.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,1278,959.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.576.0,0,1278,959.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.768.0,0,1278,959.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg"} "Ore and sinter analysis ")
![Ore and sinter analysis ]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.575.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.767.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg"} "Ore and sinter analysis ")
Ore and Sinter Analysis
Increased demand for steel pressures the market for advanced ferrous and non-ferrous alloys, leading to technological, environmental, and social challenges in metal production. Working with more complex mineralogy and lower grade ores to concentrate the desired constituents is energy and time intensive. The relative mineral fractions used in iron ore sinter and the quality of coke/coal used for iron production and smelting all affect process efficiency, as well as the amount/type of slag and waste produced.
To improve these processes, reduce energy consumption, and allow a better understanding of the mineralogy, interrogation of your ore and sinter sample is required.
With ZEISS solutions for mineralogy and sinter, you combine
- image processing
- 3D mapping
- core sampling
- standards-based quantitative EDS
- image analysis
- reporting toolkits to interrogate even the most challenging samples
![New Frontiers in Analytical Metallography]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.100.56.0,3,700,397.file/analytical-metallography.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.360.203.0,3,700,397.file/analytical-metallography.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/analytical-metallography.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/analytical-metallography.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/analytical-metallography.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/analytical-metallography.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/analytical-metallography.png/_jcr_content/renditions/original.image_file.700.394.0,3,700,397.file/analytical-metallography.png"} "New Frontiers in Analytical Metallography")
![ZEISS Axio Imager 2 for Materials Research]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.100.100.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.360.360.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.768.768.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1024.1024.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.407,0,1487,1080.file/axio-imager-z2_product_mrc.jpg"} "ZEISS Axio Imager 2 for Materials Research")
![ZEISS Axio Observer for Materials]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.100.100.0,0,1920,1920.file/axio-observer-ms_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.360.360.0,0,1920,1920.file/axio-observer-ms_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.768.768.0,0,1920,1920.file/axio-observer-ms_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.0,0,1920,1920.file/axio-observer-ms_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.0,0,1920,1920.file/axio-observer-ms_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.0,0,1920,1920.file/axio-observer-ms_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-observer-ms/axio-observer-ms_stage.jpg/_jcr_content/renditions/original.image_file.1920.1920.0,0,1920,1920.file/axio-observer-ms_stage.jpg"} "ZEISS Axio Observer for Materials")
![ZEISS Crossbeam - FIB-SEM for High Throughput 3D Analysis and Sample Preparation]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "ZEISS Crossbeam")
![ZEISS Crossbeam 550 Samplefab]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-samplefab_w-monitor_right-side.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-samplefab_w-monitor_right-side.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-samplefab_w-monitor_right-side.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-samplefab_w-monitor_right-side.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-samplefab_w-monitor_right-side.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-samplefab_w-monitor_right-side.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w-monitor_right-side.png/_jcr_content/renditions/original.image_file.1920.1920.file/crossbeam-550-samplefab_w-monitor_right-side.png"} "ZEISS Crossbeam 550 Samplefab")
![ZEISS EVO - Modular SEM Platform for Intuitive Operation, Routine Investigations and Research Applications]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "ZEISS EVO")
![ZEISS LSM 900 for Materials]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/lsm900-mat_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/lsm900-mat_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/lsm900-mat_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/lsm900-mat_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/lsm900-mat_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/lsm900-mat_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/confocal/lsm-900-mat/lsm900-mat_stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/lsm900-mat_stage.jpg"} "ZEISS LSM 900 for Materials")
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