Name: Electron Microscopy for TEM Users
Start: 2023-06-20 11:01+02:00
End: 2023-06-21 11:01+02:00
Location: ZEISS Forum

Workshop

Electron Microscopy for TEM Users

ZEISS@Customer Center Oberkochen

Tue, 20 June 2023 - Wed, 21 June 2023

ZEISS Forum, Carl-Zeiss-Straße 22, 73447 Oberkochen

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Electron Microscopy for TEM Users | New Technologies

ZEISS Workshop

We have pleasure in inviting you to a User Workshop on Electron Microscopy.
We will be discussing all ZEISS EM technologies and provide insights into how these can support and complement your existing TEM solutions.

Imaging ultrathin sections on TEM grids is the most established method in electron microscopy, and has been applied in different fields of life science research for decades.
We would like to discuss how the Scanning Transmission Electron Microscopy mode of a state of the art SEM may provide additional benefit to those well-established methods.
Mounting the exact same sections used for TEM on solid substrates instead of on grids and using Back Scattered Contrast for imaging, comes with several benefits.
With the help of our invited scientific speakers, high ranking experts for these topics, we will be discussing these benefits in detail and hope to provide a valuable forum to share experiences and learn new skills.

We look forward to welcoming you to Oberkochen on June 20th / 21th, 2023

Event Agenda

Talks | June 20, 2023 | 5.00 pm | ZEISS Forum

	Session	Speaker
5 PM	Registration
5.30 PM	Welcome and Appreciation	Stefan Groß, ZEISS
5.40 PM	ZEISS Service concept - Best-Effort-Service for TEM products as from 01.10.2023	Stefan Groß, ZEISS
6 PM	Dinner in the ZEISS Forum with Museum Tour

Event Agenda

Talks | June 21, 2023 | 8.30 am | ZEISS Forum

	Session	Speaker
8.30 AM	Registration
8.45 AM	Ultrastructural investigation of stressed beta cells within the endocrine pancreas using Correlative Electron Microscopy - from STEM to TEM	Dr. Dagmar Kolb, Managing Director of Core Facility Ultrastructure Analysis, Graz
9.30 AM	State of the art SEMs - multi modal imaging tools for biomed applications	Jörg Lindenau, ZEISS
9.45 AM	Coffee Break
10.15 AM	Neurons on tape – assessing neurodegeneration by 2D and volume SEM	Dr. Martina Fetting, Head of SyNergy Nanoscale Hub, München
11.00 AM	Processing, analysis and visualization of EM data	Dieter Lauer, ZEISS
11.45 AM	Lunch
12.45 PM	Transfer to Microscopy Customer Center

Individual Hands-On Sessions

June 21, 2023 | 1 PM | ZEISS Microscopy Customer Center Europe

1 PM \| Session 1	Recent development in serial block face imaging - ZEISS GeminiSEM 360
1 PM \| Session 2	3D FIB-SEM Tomography - ZEISS Crossbeam 550
1 PM \| Session 3	STEM Imaging and Array Tomography - GeminiSEM 560
1 PM \| Session 4	arivis Image Processing
5 PM	Discussion
5.30 PM	End

Hotel Recommendation

The booking and the costs for the hotel are to be paid by the participant. Room capacities have been reserved until May 19, 2023. Please book via reservations.aalen@maxxhotel.com. Booking code: ZEISS TEM User Meeting

MAXX Hotel Aalen
Hugo-Theurer-Str. 6
73431 Aalen
T +49 7361 97340-0
reservations.aalen@maxxhotel.com
www.maxxhotel.com
Price single room with breakfast: 101,- Eur

Sessions

ZEISS GeminiSEM

Coccospheres made up of calcium carbonate plates which are secreted by the microalga coccolithophore. Image acquired with ZEISS Gemini. Courtesy of A. Gónzales Segura, D. Molina Fernández, I. Sánchez Almazo, University of Granda, Spain

ZEISS Crossbeam

Segmentation of cellular components from the high resolution datasets that can be captured using FIB SEM technology ensures that internal components can be characterized and quantified. This image shows a 3D reconstruction of algae Golgi body based on FIB-milling raw data. Courtesy of Dr Louise Hughes, Oxford Brookes University, UK

arivis Vision4D

arivis Vision4D is your modular software for multi-channel 2D, 3D and 4D images of almost unlimited size, highly scalable and independent of local system resources.Automated 3D serial imaging of HeLa cells with ZEISS Crossbeam FIB-SEM. Courtesy of Anna Steyer and Yannick Schwab, EMBL Heidelberg, Germany.