
Join us on EMC | 26 - 30 August 2024
Remote Microscope Demo Sessions
Experience the Latest Innovations in Microscopy
Visit ZEISS booth at EMC to discover the latest microscopy innovations. Explore new technologies in virtual reality and demo ZEISS microscopes by connecting with our customer centers worldwide.
Choose the microscope that best suits your research needs and schedule your demonstration today. Get ready to elevate your research to the next level with the unmatched quality and precision of ZEISS!
Remote Demo Sessions Overview
We will offer several remote demo sessions of our unique portfolio, combining cutting-edge microscopy solutions and modular software solutions for a wide-range of applications across various sectors. Please do not hesitate to visit our booth A1 and reach out to our on-site colleagues to explore the live-demo offering and experience our full-range portfolio.
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Monday 26. AugustTuesday 27. AugustWednesday 28. AugustThursday 29. AugustFriday 30. August
10 - 11
Lightsheet 7 with arivis Pro
Lightsheet 7 with arivis Pro
Lightsheet 7 with arivis Pro
Lightsheet 7 with arivis Pro
Lightsheet 7 with arivis Pro
11 - 12
GeminiSEM 360 with Volutome
GeminiSEM 360 with Volutome
GeminiSEM 360 with Volutome
13 - 14
Lattice Lightsheet 7
Lattice Lightsheet 7
Lattice Lightsheet 7
Lattice Lightsheet 7
Lattice Lightsheet 7
14 - 15
LSM 980 with Dynamics Profiler
LSM 980 with Dynamics Profiler
LSM 980 with Dynamics Profiler
LSM 980 with Dynamics Profiler
15 - 16
Celldiscoverer 7
Celldiscoverer 7
Celldiscoverer 7
Celldiscoverer 7
16 - 17
GeminiSEM 360 with Volutome
GeminiSEM 360 with Volutome
Lightsheet 7
Light sheet fluorescence microscopy for non-invasive imaging of living model organisms, tissues, and cells over extended periods. ZEISS arivis software ecosystem to maximize the potential of your datasets and simplify analysis.
Lattice Lightsheet 7
The Lattice Lightsheet 7 enables observation of cellular processes in 3D with subcellular resolution and a minimum light dosage. It also includes full environmental control and a stable optical setup, allowing for observation of living specimens for hours or days.Dynamics Profiler
Dynamics Profiler function can be added to a ZEISS confocal with the Airyscan detector, allowing proficient confocal microscopy users to collect molecular concentration and dynamics information about a protein of interest.Celldiscoverer 7
ZEISS Celldiscoverer 7 ensures high-quality data acquisition without requiring microscopy expertise. By inserting your sample, the system auto-calibrates for optimal conditions and reproducible results. Even when operated remotely, it provides impartial data that meets high standards without manual adjustments.GeminiSEM 360 with Volutome
Serial-Block-Face never was this fun - Live demonstration of Serial-Block-Face SEM on an “impossible” sample. Watch me obtain great images with no visible charging despite vast areas of empty resin. -
Monday 26. AugustTuesday 27. AugustWednesday 28. AugustThursday 29. AugustFriday 30. August
10 - 11
Advanced VersaXRM
Crossbeam 350 Laser
Advanced VersaXRM
Sigma 360
Advanced VersaXRM
11 - 12
GeminiSEM 460
GeminiSEM 460
Crossbeam 350 Laser
Crossbeam 350 Laser
Crossbeam 350 Laser
13 - 14
GeminiSEM 460
Advanced VersaXRM
Crossbeam 350 Laser
Advanced VersaXRM
14 - 15
Advanced VersaXRM
Crossbeam 350 Laser
Advanced VersaXRM
Sigma 360
15 - 16
GeminiSEM 460
GeminiSEM 460
Advanced VersaXRM
Advanced VersaXRM
16 - 17
Advanced VersaXRM
Crossbeam 350 Laser
Sigma 360
Sigma 360 - Correlative Light and Electron Microscopy
Correlation of different modalities offers unique insights. ZEISS ZEN Connect offers the possibility to correlate light microscopy and electron microscopy data in a convenient and productive way. Further, additional analysis data can be incorporated into one project to be used for navigation and documentation.GeminiSEM 460
Analysis of battery materials presents unique challenges due to the diverse chemical identities of different components within a battery cell. Several questions need to be addressed, such as determining the chemical composition of the anode material and examining the surface structure of an insulating separator foil.Crossbeam 350 Laser
Fast and predictive FIB with rapid laser ablation and correlative Crossbeam and X-ray microscopy. ZEISS LASER FIB can be employed to generate a large cross-section with a high-quality surface on battery samples. Combining X-ray microscopy with ZEISS LASER FIB in one correlative workflow greatly improves productivity and predictivity.Advanced VersaXRM
Discover the newest innovations in non-destructive 3D X-ray microscopy that enable perfect tomographies for every sample, every user, every time.
Often the first step in a correlative, multiscale workflow due to its non-destructive nature, XRM also provides powerful benefits for in-situ imaging, under varying conditions. VersaXRM enables the highest resolution across the widest range of energy, fast data acquisition over full field of view, an award-winning interface enabling all users to get the most from their sample.