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XRM of Smartphone

Expanding the Horizons of Resolution Performance

Discover Updates to XRM for Academic and Industrial Research

The horizons of what users are able to achieve from their research are growing - enabled by the newest 3D X-ray microscope (XRM) from ZEISS.

Known for their ability to accomplish Resolution at a Distance (RaaD), the ZEISS Xradia Versa family is now expanded by ZEISS Xradia 630 Versa.

Explore the following benefits:
  • Achieve Breakthrough Resolution Performance with RaaD 2.0
  • Accelerated Productivity with an Intuitive User Experience
  • Boost Your Throughput Using Game-Changing AI

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This video shows a X-ray tomography scan of a Lithium-ion battery, acquired with ZEISS Xradia 630 Versa using a 40X-P Objective. The scan was performed non-destructively without opening the battery.

Breakthrough Resolution Performance with RaaD 2.0

Unlocking Entirely New Application Capabilities

The ability to maintain resolution over long distances, known as Resolution at a Distance, has been possible ever since the introduction of the Versa X-ray microscope. It allows you to image an unprecedented range of samples, sizes and length scales at high resolution.  

Enter the next level and benefit from RaaD 2.0, now using ZEISS Xradia 630 Versa with higher energy capabilities and the new objective 40X Prime.  

Benefit from unique capabilities of non-destructive, high-resolution X-ray microscopes, now with unparalleled resolution performance of 450-500 nm across the full range of energy (from 30 kV to 160 kV).  

Unlock entirely new application capabilities within your 3D X-ray tomography.

Learn more in a short presentation

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Click to play the video: 3D dataset of an A12 processor. Seamlessly delivering resolution across large fields of view (FOV) with throughput, this is DeepScout at work.

Achieve Higher Throughput

Increase the speed of your data acquisition with AI-based reconstruction

Discover a reconstruction engine for highest resolution over large fields of view. ZEISS DeepScout uses high-resolution 3D data as training data for lower resolution, larger field of view datasets and upscales the larger volume data using a neural model.

Now you can take your large overview scan, feed it through the ZEISS DeepScout reconstruction algorithm and get image information that approaches the resolution of a Zoom scan, but over a much larger lateral field.

Learn about the latest techniques in 3D X-ray reconstruction
Polymer Electrolyte Fuel Cell (PEFC) imaged without DeepScout (left) and with DeepScout (right).

Discover High Image Quality

With AI-based Deep Learning Reconstruction


DeepScout combines with ZEISS DeepRecon Pro, a deep learning reconstruction for superior throughput (up to 10X) or image quality for repetitive workflows,
to form your novel AI Supercharger package.  

Learn more about DeepScout in a short presentation
NavX guides users through automated workflows

NavX guides users through automated workflows

Evolving the User Experience

The Physics of X-ray Imaging Can Be Complex

After having studied user habits, ZEISS employed human-centered design (HCD) principles to enable even the newest user in a busy lab to be immediately productive.

The novel control system NavX™ guides users through automated workflows with prompts and suggestions to set up an experiment more easily and efficiently, while also leaving the control system unlocked for the expert user to explore the full versatility of ZEISS Xradia 630 Versa.

Additionally, the NavX File Transfer Utility (FTU) takes the data that is being produced by the microscope and automatically transfers it to other locations so that users have their data where they need it, when they need it.

Discover NavX in a short presentation

Advancing correlative studies in materials research

Identify, Access, Prepare and Analyze With Precise Navigational Guidance

Correlate multiple scales and modalities, perform X-ray guided site selection and get insights into representativeness of the chosen sample site.
Use a unique correlative LaserFIB workflow to identify, access, prepare and analyze your needle in the haystack.
Perform analyses with the imaging or analytical capabilities of the fs laser powered FIB-SEM (LaserFIB) or prepare samples for further analysis using techniques such as nanoCT.

Learn about new game-changing areas & capabilities for research

Learn more in 3 short presentations

and discover a workflow connecting XRM and LaserFIB, providing powerful, precise sample preparation

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Explore what the presentations will be about

Discover Advancing Correlative Studies in Materials Research Including Innovations in AI-Driven X-Ray & Laserfib 3D Microscopy

  • Finding the Needle in a Haystack

    From integrated materials engineering of microelectronics components and deformation in advanced alloys and composites to pore transport and ionic mobility in lithium-ion batteries or other energy materials, many problems in materials science can only be fully understood in 3D. The main thrust of materials science is to connect macroscale material properties with specific micro- and nanoscale structures. In this light, it has long been the goal of materials researchers across a wide range of application areas to identify and analyze critical nanoscale features buried deep within bulk samples.
      

  • Advancing Correlative Studies in Materials Research

    In three presentations, you will learn how exciting innovations in 3D X-ray, LaserFIB and AI-driven microscopy can advance your materials research studies. Integrating a femtosecond laser with FIB-SEM (LaserFIB) provides powerful, precise sample preparation. Correlative X-ray microscopy enables intentional sample site selection for representativeness of the chosen site. Coupling Deep Learning algorithms with X-ray microscopy enhances XRM image quality all-round, keeping the context of the field of view and achieving higher resolution for the details while offering improved automation, precision, repeatability, and speed, letting you work in minutes rather than hours.

  • Prepare FIB-SEM Ready Structures

    With High Accuracy and Speed

    Learn how to  access regions of interest (ROI) that are hidden under the surface directly, revealing all structural details in a wide range of material types. Whether a hard or soft material, nanoscience, engineering or energy materials, conducting or insulating material: LaserFIB machines your sample at unprecedented speed.

  • Discover the just recently unveiled
    ZEISS Xradia Versa 630

    and the new features its coming with

    The newest addition to the Versa family breaks resolution performance barriers, delivers an intuitive user experience, and accelerates productivity for all with easy, guided workflows and higher throughput. Discover the game-changing AI for reconstruction, announced as a new feature to the X-ray Microscope for academic and industrial use. Explore an unprecedented range of samples in the fields of materials science, battery research, advanced electronics, life science and many more.

Speaker Dr. Stephen Kelly Market Sector Manager, Energy Materials - ZEISS Microscopy

Stephen Kelly, Ph.D., is the Market Sector Manager for Energy Materials at ZEISS RMS. He has been working in the energy materials space for over 20 years and has extensive experience with materials characterization and fabrication across the energy materials space. He has been with ZEISS RMS since 2014.

Speaker Dr. Olena Vertsanova Market Sector Manager, Nanoscience and Nanomaterials – ZEISS Microscopy

Olena Vertsanova, Ph.D., is the Market Sector Manager for Nanoscience and Nanomaterials at ZEISS RMS since September 2022. After her Ph.D. in Solid-Sate Electronics in 2001 from the National Technical University of Ukraine (NTUU KPI) she has been working as Associate Professor at the Department of Micro- and Nanoelectronics of NTUU KPI. Her research interests were electron and photoacoustic microscopy, non-destructive testing, defects characterization, advanced semiconductor and new materials for nanoelectronics.

Speaker Dr. Hrishikesh Bale Market Sector Manager, Engineering Materials - ZEISS Microscopy

Hrishikesh Bale, Ph.D., is the Market Sector Manager for Engineering Materials at ZEISS RMS. He specializes in applications development for laboratory 3D X-ray imaging techniques. His research focus lies in 3D diffraction contrast tomography and in situ micro- and nano-mechanical testing using X-ray computed tomography. He has a strong background in materials science and mechanical engineering, with over a decade of experience in synchrotron X-ray microscopy and tomography.

Speaker Dr. Stephen Kelly Market Sector Manager, Energy Materials - ZEISS Microscopy

Stephen Kelly, Ph.D., is the Market Sector Manager for Energy Materials at ZEISS RMS. He has been working in the energy materials space for over 20 years and has extensive experience with materials characterization and fabrication across the energy materials space. He has been with ZEISS RMS since 2014.

Speaker Dr. Olena Vertsanova Market Sector Manager, Nanoscience and Nanomaterials – ZEISS Microscopy

Olena Vertsanova, Ph.D., is the Market Sector Manager for Nanoscience and Nanomaterials at ZEISS RMS since September 2022. After her Ph.D. in Solid-Sate Electronics in 2001 from the National Technical University of Ukraine (NTUU KPI) she has been working as Associate Professor at the Department of Micro- and Nanoelectronics of NTUU KPI. Her research interests were electron and photoacoustic microscopy, non-destructive testing, defects characterization, advanced semiconductor and new materials for nanoelectronics.

Speaker Dr. Hrishikesh Bale Market Sector Manager, Engineering Materials - ZEISS Microscopy

Hrishikesh Bale, Ph.D., is the Market Sector Manager for Engineering Materials at ZEISS RMS. He specializes in applications development for laboratory 3D X-ray imaging techniques. His research focus lies in 3D diffraction contrast tomography and in situ micro- and nano-mechanical testing using X-ray computed tomography. He has a strong background in materials science and mechanical engineering, with over a decade of experience in synchrotron X-ray microscopy and tomography.

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