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![Scanning Electron & Ion Microscopes – For Scientific and Routine Research]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.100.33.0,21,1664,576.file/sem-mic-overview.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.360.120.0,21,1664,576.file/sem-mic-overview.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.768.256.0,21,1664,576.file/sem-mic-overview.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.1024.341.0,21,1664,576.file/sem-mic-overview.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.1280.427.0,21,1664,576.file/sem-mic-overview.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.1440.480.0,21,1664,576.file/sem-mic-overview.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-mic-overview.jpg/_jcr_content/renditions/original.image_file.1664.555.0,21,1664,576.file/sem-mic-overview.jpg"} "Scanning Electron & Ion Microscopes – For Scientific and Routine Research")