ZEISS Crossbeam 550
Samplefab FIB-SEM
Explore the Advanced Features of
Crossbeam 550 Samplefab
As a semiconductor industry professional, you understand that high-quality TEM imaging depends on producing accurate, repeatable, and high-throughput lamellae.
However, achieving this can be a time-consuming and challenging process.
The new ZEISS Crossbeam 550 Samplefab offers an automated solution to produce multiple TEM lamellae and requires only minimal operator setup and supervision.
With our solution, you can streamline your TEM sample preparation and dramatically improve the efficiency of your semiconductor lab.
To address the growing industry need for TEM sample preparation, we have built a dedicated FIB-SEM, the Crossbeam 550 Samplefab. Our focus is to offer the most robust automation available on the market today, allowing fully unsupervised operation of down to 100 nm thin lamellae with high accuracy and throughput.