The two-stage magnification technique offered by ZEISS Xradia Versa uniquely achieves Resolution at a Distance, or RaaD, which enables you to effectively study the widest range of sample sizes, including those within  in situ  chambers.

Images are initially magnified via geometric projection as with conventional microCT. The projected image is cast onto a scintillator, converting X-rays to a visible light image which is then optically magnified by microscope optics before acquisition by a CCD detector.

Reducing dependence on geometric magnification enables ZEISS Xradia Versa solutions to maintain submicron spatial resolution down to 500 nm at large working distances.

ZEN navx Guidance and Control System

ZEISS researchers studied XRM users to develop a solid understanding of the issues and challenges you face, including your biases, how you compensate, and your workarounds. With that data in hand, our expert team developed systematic built-in guidance, automated workflows, and intelligent system insights to enable even novice users to achieve results more easily and efficiently. If you are an expert user, ZEN navx offers significant efficiency benefits, "unlocking" the system to allow you to explore the full versatility of ZEISS Versa XRM. ZEN navx also provides infographic-like visualization that helps you to understand the trade-offs of your choices, e.g., between resolution, field of view, and throughput.

ZEN navx includes an embedded 3D viewer to integrate Volume Scout capability for end-to-end 3D navigation. This streamlines access to your sample to pinpoint and identify specific regions of interest to target for higher resolution imaging.

Additional capabilities include the ZEN navx File Transfer Utility, or FTU, which puts your microscope data exactly where you need it, when you need it, without having to manually transfer from system to workstation, or to save on a hard-drive to carry from place to place. SmartShield works within ZEN navx to protect your system and your sample from damage.

FAST Mode, enabled by Your Flat Panel Extension (FPX)

FAST Mode on ZEISS VersaXRM enables rapid 3D image acquisition for all samples through continuous motion scanning. Used with the optional flat panel detector (FPX), this mode allows non-stop sample rotation during X-ray image capture at various angles, eliminating the overhead delay of traditional step-and-shoot acquisition. Thus, dramatically faster scan times can be attained when exposure times are below 0.5 seconds, typical for the large, sensitive FPX detector. Expect acquisition times generally from <1 to 5 minutes, and even below 20 seconds for less stringent image quality needs.

FAST Mode enables true, nearly real-time 3D navigation for all samples thanks to full integration with the Volume Scout workflow in ZEN navx. FAST Mode acquisition integrates seamlessly with Volume Scout to allow for nearly immediate feedback and true 3D navigation to the correct region of interest in your complex samples.

ZEISS Versa X-ray microscopes provide the industry's premier 3D imaging solution for the widest variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

These studies require samples to be further away from the X-ray source to accommodate various types of in situ rigs. On traditional microCT systems, this significantly limits the resolution achievable for your samples. ZEISS Versa XRM are uniquely equipped with dual-stage magnification architecture with RaaD technology that enable the highest resolution for in situ imaging.

ZEISS Versa XRM platforms can accommodate a variety of in situ rigs, including user-customized designs. You can add the optional in situ Interface Kit to your ZEISS Xradia XRM, which includes a mechanical integration kit, a robust cabling guide, and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Versa Scout-and-Scan or ZEN navx user interfaces. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia microCT or XRM to VersaXRM 730 X-ray microscope and leverage RaaD technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.