Product

ZEISS Xradia Context MicroCT The Industry’s Most Advanced MicroCT Platform

ZEISS Xradia Context® micro-computed tomography (microCT) is an easy-to-use system for analysis of all types of samples. A high-array detector enables high resolution of fine details even with relatively large imaging volumes. The system features a large field of view, rapid sample mounting and alignment, streamlined acquisition workflow and fast exposure and data reconstruction times.

Obtain 3D data on entire intact electronic components, large materials samples, or biological specimens.
Perform non-destructive failure analysis to identify internal defects without cutting your sample or workpiece.
Characterize and quantify performance-defining heterogeneities in your geo samples, like porosity, cracks, inclusions, defects, or multiple phases.
Perform 4D evolutionary studies, through ex situ treatment or in situ sample manipulation.
Connect to the ZEISS correlative microscopy environment and perform nondestructive 3D imaging to identify regions of interest for subsequent analysis.

Virtual cutaway view of the interior of an intact catalytic converter

Full Context 3D Imaging

Xradia Context provides you with superb image quality, stability, and usability, along with an efficient workflow environment and high throughput scanning
Resolve fine details in their full 3D context, even within a relatively large imaging volume, with a high pixel density detector of six megapixels
Visualize buried structures non-destructively in 3D for process analysis, construction analysis and failure analysis
Maximize geometric magnification with small samples to identify and characterize micron-scale structures with high contrast and clarity
Take advantage of a streamlined acquisition workflow fast exposure times and data reconstruction

_{Virtual cutaway view of the interior of an intact catalytic converter}

Context microCT scan of intact smart watch.

Based on Proven Xradia Platform

With Xradia Context microCT, you benefit from years of development and proven stability as it is built on the same platform as the Xradia Versa series
Gain from a system targeted at advances in high resolution, high quality data acquisition and reconstruction
The user-friendly Scout-and-Scan control system provides you with an efficient workflow environment
Mount and align your specimens rapidly or expand your system with an optional Autoloader for automated handling and sequential scanning of up to 14 samples
With the in situ kit, perform 4D and in situ studies to measure changes in the microstructure of materials under varying conditions
Add the Advanced Reconstruction Toolkit for even faster throughput with excellent image quality

_{Context microCT scan of intact smart watch.}

Full field of view imaging of a bear jaw

Convertible to Xradia Versa Microscope (XRM)

As your imaging needs evolve, so should your instrument. Xradia Context joins the ZEISS X-ray imaging portfolio, benefiting from the ongoing ZEISS commitment to extend the capabilities and functionality of its systems in the field.
This opens up 3D tomographic imaging that's ready to grow with your needs: your Xradia Context microCT is the only microCT that can be converted at any time, to CrystalCT, or a 5XX platform, all the way up to ZEISS Xradia 620 Versa 3D X-ray microscope (XRM).

_{Full field of view imaging of a bear jaw}

Fields of Application

Electronics

3D Context microCT scan of smart speaker. Visualize buried structures and defects non-destructively in 3D across a wide range of samples sizes with class-leading resolution at chosen field of view.
Manufacturing

3D rendering of a light bulb. Context can be used to perform full sample scanning to check internal structures or identify defects in manufactured components.
Life Sciences

Cutaway view of 3D rendering of a mouse embryo embedded in paraffin. Internal structures are visible with high contrast. Sample courtesy of Massachusetts General Hospital.
Geosciences

Virtual cross section through a heterogeneous rock sample revealing multiple phases and porosity.
Materials Science

Virtual cross section through a cycled and de-packaged lithium ion battery, revealing damage in the current collector and cathode layers. Sample courtesy of Prof. D. U. Sauer and Prof. E. Figgemeier, ISEA, RWTH Aachen University
Metals

3D rendering of results from a rapid scan of a turbine blade to evaluate geometry and inspect for internal defects or cracks.

Xradia Context microCT is built on the established and proven Xradia Versa platform.

Image Quality Based on Proven Technology

Experience excellent contrast and image clarity, enabling easy differentiation of different phases and features to support downstream segmentation and quantification of your data.

Excellent data quality relies on several factors including source characteristics, beam energy tuning, detector geometry and sensitivity, environmental control, motion and vibrational stability, careful system calibration, and reconstruction accuracy. Xradia Context microCT is built on the same platform as the proven Xradia Versa X-ray microscope series, inheriting the same advancements that helped Xradia Versa set the standard in high-performance 3D X-ray imaging in the laboratory.

Superior high purity X-ray filters to match samples for beam hardening control
Enhanced automated drift correction modes
Advanced beam hardening reduction algorithms
Additional proprietary advanced algorithms to ensure optimal image quality
Easily Protect Your Sample to Optimize Experiment Setup

SmartShield is a solution that protects your sample and your microscope. This automated collision avoidance system works within the Scout-and-Scan Control System. It enables you to navigate Xradia Versa more confidently than ever. With the click of a button SmartShield creates a digital protective layer based on the dimensions of your sample.

With SmartShield, you benefit from:

Improved operator efficiency enabled by a streamlined sample setup
Enhanced user experience for novice and advanced users
Protection of your valuable samples and your investment
Uncompromising scan quality
Wide Field Mode

Wide Field Mode (WFM) can be used to image across an extended lateral field of view. The wide lateral field of view can provide 3x larger 3D volume for large samples, or give a higher voxel density for a standard field of view. All Xradia Versa systems are capable of WFM with the 0.4x objective. In combination with Vertical Stitching, WFM enables you to image larger samples at exceptional resolution.

Accessories

Upgrade your microscope with additional accessories to enhance its capabilities

3D X-ray dataset of a camera lens acquired using ZEISS Xradia 620 Versa and DeepRecon Pro.

Advanced Reconstruction Toolbox

Higher Throughput with Image Quality

Artificial intelligence (AI)-driven reconstruction technologies for your ZEISS Xradia systems. A deep understanding of both X-ray physics and applications enable you to solve some of the hardest imaging challenges in new and innovative ways.

Autoloader

Maximize Your Instrument’s Utilization

Maximize use and minimize user intervention with the optional ZEISS Autoloader. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 sample stations, which can support up to 70 samples, queue, and allow to run all day, or off-shift.

In Situ Interface Kit

Push the Limits of Scientific

ZEISS Xradia platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

Visualization and Analysis

ZEISS Recommends Dragonfly Pro

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy. Available exclusively through ZEISS, ORS Dragonfly Pro offers an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. Dragonfly Pro allows for navigation, annotation, creation of media files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

Articles Related to Xradia Context microCT

7 May 2021

Concrete Imaging with X-ray Microscopy

Webinar - 16 min watch

Dr. Bill Fadgen

Accelerating Nuclear Energy Research with Advanced Microscopy Techniques

15 July 2021

Advanced Packaging Analysis Solutions

Webinar - 51 min watch

Cheryl Hartfield

13 May 2020

Advanced Ceramics Used as Modern Building Materials in 2D and 3D

Webinar - 32 min watch

Dr. Benjamin Tordoff

Related Applications

Downloads

ZEISS Xradia Context microCT

Your X-ray System for Today with Assurance for Tomorrow in English

8 MB

Download

3D X-ray Microscope Field Conversion and Upgrade Options

2 MB

Download

Flyer: ZEISS Xradia Context microCT

Advance your R&D with high resolution, non-destructive 3D imaging

792 KB

Download

Flyer: ZEISS Xradia Context microCT

Increase your profitability and productivity with class-leading performance

825 KB

Download

ZEISS Mineralogic 3D for Mining - Flyer

Your geometallurgy goals realized with maximum efficiency

677 KB

Download

ZEISS PhaseEvolve

Reveal contrast that has never been seen before

2 MB

Download

ZEISS Solutions for Semiconductor Development, Manufacturing, and Analysis

Accelerating Digital Transformation and Innovation for Semiconductor Electronics

13 MB

Download
Resolution of a 3D X-ray Microscope

Defining Meaningful Resolution Parameters

932 KB

Download

3D X-ray Imaging in Life Science Research

An Introduction to Capturing the 3D Structure of Biological Specimens Using X-rays

3 MB

Download

The building blocks of our solar system

Studying the Winchcombe meteorite

3 MB

Download