Webinar
3D SEM
Large Volume Electron Microscopy Enabling Statistical Analysis
10 February 2021
· 60 min watch
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.100.100.0,1,389,390.file/joel_mancuso.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.360.360.0,1,389,390.file/joel_mancuso.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.389.389.0,1,389,390.file/joel_mancuso.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.389.389.0,1,389,390.file/joel_mancuso.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.389.389.0,1,389,390.file/joel_mancuso.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.389.389.0,1,389,390.file/joel_mancuso.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/joel_mancuso.jpg/_jcr_content/renditions/original.image_file.389.389.0,1,389,390.file/joel_mancuso.jpg"})
Author
Joel Mancuso
Life Science EM XRM Product Marketing Manager
ZEISS Microscopy
ZEISS Microscopy
Abstract
3D SEM – Large Volume Electron Microscopy Enabling Statistical Analysis
3DSEM refers to a group of techniques and products that acquires serial 2d images to create a 3D volume. This talk explains the strength and weakness of each of the techniques to help guide you in choosing the best solution for your applications. It also introduces some recent advancements in automating sample prep and image segmentation to help generate meaningful statistics from 3DSEM data.
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.100.56.0,9,1755,996.file/screensaver_3d-sem.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.360.203.0,9,1755,996.file/screensaver_3d-sem.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.768.432.0,9,1755,996.file/screensaver_3d-sem.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.1024.576.0,9,1755,996.file/screensaver_3d-sem.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.1280.720.0,9,1755,996.file/screensaver_3d-sem.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.1440.810.0,9,1755,996.file/screensaver_3d-sem.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver_3d-sem.jpg/_jcr_content/renditions/original.image_file.1755.987.0,9,1755,996.file/screensaver_3d-sem.jpg"})
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