Introducing ZEISS Crossbeam 550 - Overview, Applications and Experiments

With this webinar ZEISS Crossbeam 550 was introduced in 2017. It gives an overview over the Crossbeam family and showcases applications and, experiments done by the early adopters. Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.

Key Learnings:

• Maximize your SEM insights
• Increase your FIB sample throughput
• Experience best 3D resolution in your FIB-SEM analysis