Webinar
Massive Material Removal and Ultrafast Site-Specific Sample Preparation
Combining Crossbeam Laser and X-ray Microscopy
7 May 2021
· 45 min watch
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original.image_file.100.100.file/gnauck-peter.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/authors/gnauck-peter.jpg/_jcr_content/renditions/original./gnauck-peter.jpg"})
Author
Dr. Peter Gnauck
Business Development Manager
ZEISS Microscopy
ZEISS Microscopy
Abstract
Massive Material Removal and Ultrafast Site-Specific Sample Preparation
In this webinar, the details of the femtosecond laser, integration of the system and the workflow using the Crossbeam laser together with a X-ray Microscope will be presented along with application examples focusing on geoscience, electronics, battery research and additive manufacturing.
Key Learnings:
- Innovative 3 beam concept for fast and easy sample preparation of various material classes
- Dual chamber approach: Massive material removal without contamination
- Integrated correlative workflow with X-ray Microscopy
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![Finalists of the ZEISS Microscopy Young Researcher Award | Germany]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.100.56.file/young-researcher-award-2023-clean.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.360.203.file/young-researcher-award-2023-clean.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.768.432.file/young-researcher-award-2023-clean.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original.image_file.1024.576.file/young-researcher-award-2023-clean.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/towards-the-future-of-battery-research-with-ai/young-researcher-award-2023-clean.png/_jcr_content/renditions/original./young-researcher-award-2023-clean.png"} "Finalists of the ZEISS Microscopy Young Researcher Award | Germany")
![NiMH Cylindrical Cell under the X-ray Microscope]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.100.56.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.360.203.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.768.432.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1024.576.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/user-story/enhancing-battery-reliability-efficiency-and-safety/nimh-cylindrical-cell2_1280px.png/_jcr_content/renditions/original.image_file.1280.720.0,67,1280,787.file/nimh-cylindrical-cell2_1280px.png"} "NiMH Cylindrical Cell under the X-ray Microscope")
![Paul Shearing, University of Oxford]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.100.56.0,0,1080,608.file/paul_shearing.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.360.203.0,0,1080,608.file/paul_shearing.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.768.432.0,0,1080,608.file/paul_shearing.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1024.576.0,0,1080,608.file/paul_shearing.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/sector-independent/fy-22-23/microscopy-ai-hub/paul_shearing.png/_jcr_content/renditions/original.image_file.1080.608.0,0,1080,608.file/paul_shearing.png"} "Paul Shearing, University of Oxford")
![ZEISS Crossbeam - FIB-SEM for High Throughput 3D Analysis and Sample Preparation]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "ZEISS Crossbeam")