![Análisis microestructurales revolucionarios de acero y aleaciones]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/mic-solutions_steel_singapore-bridge.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/mic-solutions_steel_singapore-bridge.jpg"} "Análisis microestructurales revolucionarios de acero y aleaciones")
Análisis microestructurales revolucionarios de acero y aleaciones
Resuelva los retos de caracterización rutinaria y de investigación en la metalurgia
El acero sigue siendo fundamental en el desarrollo mundial de infraestructuras, transporte y conectividad. El acero está en constante innovación, desde novedosos aceros avanzados de alta resistencia (AHSS, por sus siglas en inglés), sobre todo para aplicaciones de automoción de última generación, hasta nuevas aleaciones para el sector de la construcción y aleaciones más fuertes y resistentes. La microscopía es necesaria en todos los pasos del proceso, desde el análisis rutinario hasta la investigación y el desarrollo, para proporcionar datos multidimensionales sobre todos los aspectos de su microestructura.
Las soluciones de ZEISS desvelan los secretos del acero.
![Captura de imágenes 3D a escala nanométrica de características subyacentes]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.100.75.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.360.270.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original.image_file.768.576.file/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/applications/h-bar-lamella-preparation_on_a_copper-semi-circle.jpg/_jcr_content/renditions/original./h-bar-lamella-preparation_on_a_copper-semi-circle.jpg"} "Captura de imágenes 3D a escala nanométrica de características subyacentes")
Captura de imágenes 3D a escala nanométrica de características subyacentes
Los metales y aleaciones son tridimensionales y requieren un enfoque tridimensional para caracterizar su microestructura. A veces las características más diminutas tienen un gran impacto en el rendimiento macroestructural.
El microscopio electrónico de barrido de haz de iones focalizados (FIB-SEM) con láser de femtosegundo ZEISS Crossbeam abre un gran abanico de nuevas posibilidades analíticas para comprender plenamente sus muestras en tres dimensiones.
- Localice su región de interés con los microscopios de rayos X de alta resolución de ZEISS para determinar y analizar de forma precisa las características subyacentes
- Vuelva a localizar las características en el ZEISS Crossbeam y prepare secciones transversales muy pulidas a través de las regiones de interés
- El fresado tan rápido de láser ZEISS Crossbeam permite eliminar regiones de la muestra para llegar más rápidamente a las características subyacentes
- Prepare de forma rápida y fiable laminillas para la microscopía electrónica de transmisión
- Seccione y capture imágenes de las características de interés: cree una imagen completa en 3D combinando imágenes, mapas EDS o mapas EBSD de cada sección
- Evalúe aceros avanzados, uniones desiguales, inclusiones, precipitados, aleaciones bifásicas y otras microestructuras complejas
Impacto de las inclusiones no metálicas en acero y aleaciones
Las inclusiones no metálicas están presentes en todos los grados de acero y de sus aleaciones. Afectan al comportamiento del acero durante el funcionamiento, por lo general de forma negativa, y pueden reducir la resistencia a la rotura, disminuir la absorción de la energía de impacto y reducir localmente la resistencia a la corrosión. Las inclusiones de gran tamaño (normalmente producidas por la contaminación) pueden conllevar incluso fallos catastróficos del acero. Determinar el tamaño, el tipo y la distribución de las inclusiones es importante para el control de calidad rutinario y para entender las propiedades del acero.
Los módulos de inclusiones no metálicas (NMI, por sus siglas en inglés) de ZEISS ZEN agilizan el análisis con un flujo de trabajo sencillo y una vista de galería fácil de usar de las inclusiones, además de la inspección de campos e inclusiones individuales. El ajuste totalmente automatizado de los umbrales de color, la eliminación de artefactos y la detección automática de la dirección del laminado del acero hacen que la detección y el mapeo de las inclusiones sea más fiable, lo que evita problemas con la preparación de la muestra. La gran precisión y reproducibilidad del hardware permiten mapear grandes áreas con fiabilidad, al mismo tiempo que le permiten volver automáticamente a cualquier campo o inclusión de interés para realizar un análisis más profundo o una reclasificación.
Además, podrá potenciar su investigación en las NMI en el microscopio electrónico de barrido capturando imágenes y caracterizando inclusiones concretas con alta resolución y flexibilidad analítica.
![Análisis de minerales y productos sinterizados]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,1278,959.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,1278,959.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.576.0,0,1278,959.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.768.0,0,1278,959.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1278.959.0,0,1278,959.file/met67-10x-bf--03.jpg"} "Análisis de minerales y productos sinterizados")
![Análisis de minerales y productos sinterizados]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.100.75.file/met67-10x-bf--03.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.360.270.file/met67-10x-bf--03.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.768.575.file/met67-10x-bf--03.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original.image_file.1024.767.file/met67-10x-bf--03.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/met67-10x-bf--03.jpg/_jcr_content/renditions/original./met67-10x-bf--03.jpg"} "Análisis de minerales y productos sinterizados")
Análisis de minerales y productos sinterizados
El aumento de la demanda de acero ejerce presión sobre el mercado para encontrar aleaciones ferrosas y no ferrosas avanzadas, lo que comporta retos a nivel tecnológico, medioambiental y social en la producción de metales. Trabajar con mineralogía más compleja y minerales de menor calidad para concentrar los compuestos deseados requiere mucha energía y tiempo. Las fracciones de mineral relativas utilizadas en la sinterización de hierro y la calidad del coque o carbón utilizado para la producción y la fundición de hierro afectan a la eficiencia del proceso, así como a la cantidad o el tipo de escoria y residuos producidos.
Con el fin de mejorar estos procesos, reducir el consumo de energía y comprender mejor la mineralogía, es necesario examinar su muestra de mineral y producto sinterizado.
Con las soluciones de ZEISS de mineralogía y sinterización, podrá combinar los siguientes procesos:
- procesamiento de la imagen
- mapeo en 3D
- muestreo de núcleo
- EDS cuantitativo basado en estándares
- análisis de imágenes
- kits de herramientas para la elaboración de informes para examinar las muestras más complejas
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![ZEISS Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "ZEISS Sigma")
![ZEISS Xradia Context microCT]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/context_product.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/context_product.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/context_product.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/context_product.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg"} "ZEISS Xradia Context microCT")
![ZEISS Xradia Ultra]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.100.100.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.360.360.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.768.768.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.125,114,1742,1731.file/xradia-810-ultra_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-ultra/xradia-810-ultra/xradia-810-ultra_stage.jpg/_jcr_content/renditions/original.image_file.1617.1617.125,114,1742,1731.file/xradia-810-ultra_stage.jpg"} "ZEISS Xradia Ultra")
![ZEISS VersaXRM 730]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.100.100.26,26,916,916.file/versaxrm_730_zen-navx.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.360.360.26,26,916,916.file/versaxrm_730_zen-navx.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.768.768.26,26,916,916.file/versaxrm_730_zen-navx.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg"} "ZEISS VersaXRM 730")
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