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Astrogeología
Profundice en la astrogeología con técnicas de análisis avanzadas
La astrogeología consiste en el estudio de material geológico procedente de objetos celestes diferentes a la Tierra. Estas valiosas muestras de roca nos ayudan a comprender la formación y evolución de nuestro sistema solar, y pueden haber caído a la Tierra de forma natural o haber sido recogidas en misiones de muestras tripuladas o robotizadas. El estudio del material extraterrestre (desde meteoritos hasta granos presolares) precisa herramientas avanzadas de análisis correlativo multimodal y multiescala.
El análisis microscópico permite a los científicos identificar y caracterizar las fases minerales, sus estructuras de cristal y sus composiciones químicas, lo cual ayuda a desentrañar las complejidades de los materiales del planeta. Las muestras obtenidas son mucho menos abundantes que las rocas terrestres, por lo que se hace especial hincapié en el uso inicial de técnicas no destructivas que maximicen la información cuantitativa.
Análisis estructural y químico de meteoritos
Las soluciones de microscopía para astrogeología proporcionan datos que informan a los científicos sobre las variaciones que pueden observarse dentro de la muestra extraterrestre y ofrecen una estimación rápida de la cantidad de materiales diferentes que pueden encontrarse en dicha muestra. Las tecnologías de aprendizaje profundo permiten el análisis detallado de las imágenes y la segmentación, que se combinan con otros datos para evaluar los procesos que ocurren dentro de nuestro sistema solar.
La identificación cuantitativa del mineral y la orientación del cristal utilizando microscopía mejorada de rayos X de aprendizaje profundo generan una caracterización completa en 3D de muestras de enorme valor. Las técnicas de microscopía electrónica se centran en maximizar el análisis cuantitativo de las variaciones microestructurales para el análisis de elementos traza a nanoescala.
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![ZEISS VersaXRM 730]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.100.100.26,26,916,916.file/versaxrm_730_zen-navx.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.360.360.26,26,916,916.file/versaxrm_730_zen-navx.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.768.768.26,26,916,916.file/versaxrm_730_zen-navx.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg"} "ZEISS VersaXRM 730")
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