FIB-SEM para simplificar la preparación automatizada de muestras de TEM
Logre una preparación de muestras de TEM totalmente automatizada y sin necesidad de ser supervisada en su laboratorio de semiconductores gracias a ZEISS Crossbeam 550 Samplefab, un FIB-SEM preconfigurado y robusto de alta gama. Obtenga la mejor calidad de muestras y una automatización de alta fiabilidad con elevadas tasas de éxito de laminillas, sobre todo para preparaciones en varios centros. Disfrute de una interfaz de usuario intuitiva, diseñada para aprender rápidamente y lograr una eficiencia óptima sin comprometer la flexibilidad.
Aproveche el potencial de la productividad de su laboratorio
Consiga criterios de valoración fiables y precisos
Benefíciese de una promesa de rendimiento de la automatización superior al 90 % para el procesamiento de láminas delgadas sin supervisión desde muestras voluminosas hasta rejillas TEM
Simplifique la preparación de sus muestras en láminas delgadas TEM
y experimente el rendimiento de automatización líder en el sector
Contenido de terceros bloqueado
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El FIB totalmente automatizado de la preparación de muestras de TEM, desde el fresado en volumen hasta la extracción y el adelgazamiento, se proporciona mediante un flujo de trabajo segmentado que se puede vincular, si se desea, para flujos de trabajo de extracción in situ o ex situ.
Interfaz fácil de usar
para un funcionamiento sencillo
La interfaz de usuario Crossbeam 550 Samplefab ha sido completamente rediseñada para facilitar un rápido aprendizaje y un funcionamiento intuitivo tanto para principiantes como para usuarios expertos, lo que garantiza una experiencia sin complicaciones. El software de control mejorado aumenta la estabilidad y facilidad de uso, lo que permite agilizar aún más el proceso operativo.
Contenido de terceros bloqueado
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Preparación automatizada de muestras de TEM
para lograr resultados optimizados
El proceso de preparación de láminas delgadas TEM sin manos del microscopio ZEISS Crossbeam 550 Samplefab puede crear 10 láminas delgadas en menos de 8 horas, ahorrando un tiempo y recursos valiosos. Su tecnología de extracción patentada proporciona un rendimiento de automatización superior y la capacidad de adelgazar hasta en 100 nm una gran variedad de tipos de muestra de semiconductores y así garantizar siempre resultados de alta calidad.
Rendimiento de automatización superior
para lograr las máximas tasas de éxito
La automatización basada en recetas promete un rendimiento de automatización superior al 90 % para el procesamiento de láminas delgadas sin supervisión desde muestras voluminosas hasta rejillas TEM, sin necesidad de intervención del operador. Las comprobaciones automatizadas permiten que las intervenciones humanas aseguren que no se pierde ninguna laminilla durante el procesamiento, lo que acerca las tasas de éxito de laminillas al 100 %.
Flujo de trabajo estable y eficiente
para una mayor productividad
El flujo de trabajo Crossbeam Samplefab es tan estable que se pueden crear docenas de laminillas mediante una sola punta de sonda, que solo se tiene que remodelar tras múltiples días de uso intensivo. Esto aumenta significativamente el tiempo de funcionamiento productivo de la herramienta y reduce los costes en consumibles, es decir, le ahorra tiempo y dinero.
Para abordar la creciente demanda de la industria en la preparación de muestras de TEM, hemos diseñado un FIB-SEM específico para ello, el Crossbeam 550 Samplefab. Nos centramos en ofrecer la automatización más estable disponible actualmente en el mercado, que permite la preparación sin ningún tipo de supervisión de laminillas de hasta 100 nm con una gran precisión y un alto rendimiento.
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Obtenga más detalles en el prospecto de ZEISS Crossbeam 550 Samplefab.
![ZEISS Crossbeam 550 Samplefab]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-samplefab_w_monitor-left.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-samplefab_w_monitor-left.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-samplefab_w_monitor-left.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-samplefab_w_monitor-left.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-samplefab_w_monitor-left.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-samplefab_w_monitor-left.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-550-samplefab_w_monitor-left.jpg/_jcr_content/renditions/original./crossbeam-550-samplefab_w_monitor-left.jpg"} "ZEISS Crossbeam 550 Samplefab")
![Imagen de la interfaz de usuario del ZEISS Crossbeam 550]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.100.100.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.360.360.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.768.768.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1024.1024.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1280.1280.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1438.1438.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/crossbeam-samplefab_user-interface.jpg/_jcr_content/renditions/original.image_file.1438.1438.241,0,1679,1438.file/crossbeam-samplefab_user-interface.jpg"} "Imagen de la interfaz de usuario del ZEISS Crossbeam 550")
![Gráfico que muestra la estadística de un experimento reciente con 100 laminillas]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original.image_file.100.100.file/automation-yield-promise.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original.image_file.360.360.file/automation-yield-promise.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/automation-yield-promise.jpg/_jcr_content/renditions/original./automation-yield-promise.jpg"} "Gráfico que muestra la estadística de un experimento reciente con 100 laminillas")
![Imagen de perfil de Dr. Thomas Rodgers]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.100.100.29,47,503,521.file/thomas-rodgers-headshot.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.360.360.29,47,503,521.file/thomas-rodgers-headshot.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/thomas-rodgers-headshot.jpg/_jcr_content/renditions/original.image_file.474.474.29,47,503,521.file/thomas-rodgers-headshot.jpg"} "Dr. Thomas Rodgers, jefe del sector de negocio de electrónica de ZEISS Microscopy")
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam-samplefab/en_product-flyer_crossbeam_550_samplefab_cover.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/en_product-flyer_crossbeam_550_samplefab_cover.jpg"})
![ZEISS Crossbeam: FIB-SEM para un alto rendimiento en el análisis en 3D y la preparación de muestras]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.100.100.file/crossbeam-550-system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.360.360.file/crossbeam-550-system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.768.768.file/crossbeam-550-system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/crossbeam-550-system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/crossbeam-550-system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/crossbeam-550-system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/fib-sem/crossbeam/crossbeam-550-system.jpg/_jcr_content/renditions/original./crossbeam-550-system.jpg"} "ZEISS Crossbeam")