Los microscopios electrónicos de barrido (SEM) escanean una muestra con un haz de electrones focalizado y obtienen imágenes con información sobre la topografía y la composición de las muestras.
Los CSEM (SEM convencionales con fuente térmica de electrones) y los FE-SEM (SEM de emisión de campo con una fuente de electrones de emisión de campo) de ZEISS ofrecen una captura de imágenes de alta resolución y un contraste de los materiales superior.
● Información sensible a la superficie y de alta resolución y contraste de materiales.
● Muy usados en nanotecnología, investigación de materiales, ciencias de la vida, semiconductores, materias primas e industria.
![Scanning Electron Microscopes (SEM)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/sem-wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/sem-wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/sem-wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/sem-wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/sem-wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/sem-wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/overview/sem-wallpaper.jpg/_jcr_content/renditions/original./sem-wallpaper.jpg"} "Scanning Electron Microscopes (SEM)")
![ZEISS SmartSEM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo-smartsem-controller.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo-smartsem-controller.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo-smartsem-controller.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/upgrades/fib-sem/new-images/evo-smartsem-controller.jpg/_jcr_content/renditions/original./evo-smartsem-controller.jpg"} "ZEISS SmartSEM")