![ZEISS MultiSEM : Le microscope électronique à balayage le plus rapide au monde]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/multisem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/multisem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/multisem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/multisem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/multisem-stage.jpg"} "ZEISS MultiSEM : Le microscope électronique à balayage le plus rapide au monde")
ZEISS MultiSEM 505/506
Les microscopes électroniques à balayage les plus rapides au monde
Déclenchez la vitesse d'acquisition de 91 faisceaux d'électrons en parallèle pour capturer l'image d'échantillons à l'échelle des centimètres à une résolution nanométrique. Ce microscope électronique à balayage exclusif est conçu pour un fonctionnement continu et fiable 24h/24, 7j/7. Il suffit de définir votre processus d'acquisition des données à haut débit et MultiSEM capturera automatiquement des images à fort contraste.
![Coupe de cerveau de souris, vitesse d'acquisition maximale de 1,22 gigapixels/seconde. Avec l'aimable autorisation de J. Lichtman, Université de Harvard, Cambridge, MA, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit1.jpg/_jcr_content/renditions/original./multisem-benefit1.jpg"} "Coupe de cerveau de souris")
Révolutionnez la vitesse de la microscopie électronique
Des faisceaux d'électrons multiples fonctionnant en parallèle atteignent une vitesse d'imagerie brute sans précédent. L'acquisition d'une zone de 1 mm2 avec une taille de pixel de 4 nm ne nécessite que quelques minutes. Une vitesse d'acquisition sans égale de plus de 1 To par heure permet de réaliser l'imagerie de grands volumes (> 1 mm3) à une résolution nanométrique. Des détecteurs optimisés collectent très efficacement les signaux d'électrons secondaires afin d'offrir des images d'un contraste saisissant avec de faibles niveaux de bruit.
Légende : Coupe de cerveau de souris, vitesse d'acquisition maximale de 1,22 gigapixels/seconde. Avec l'aimable autorisation de J. Lichtman, Université de Harvard, Cambridge, MA, États-Unis.
![Des échantillons immenses à une résolution nanométrique]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit2.jpg/_jcr_content/renditions/original./multisem-benefit2.jpg"} "Des échantillons immenses à une résolution nanométrique")
Des échantillons immenses à une résolution nanométrique
Ne sacrifiez pas la taille de l'échantillon pour la résolution nanométrique. MultiSEM est équipé d'un porte-échantillon couvrant une surface de 10 cm x 10 cm et conçu pour fonctionner en continu, 24h/24 et 7j/7. Vous pouvez donc capturer l'image de l'échantillon entier afin d'étudier tous les détails susceptibles de répondre à vos investigations scientifiques. Obtenez une image détaillée sans perdre le contexte macroscopique.
![Microscopie électronique avec logiciel d'imagerie ZEN]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.100.50.file/multisem-benefit3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.360.180.file/multisem-benefit3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.768.384.file/multisem-benefit3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1024.512.file/multisem-benefit3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1280.640.file/multisem-benefit3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original.image_file.1440.720.file/multisem-benefit3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-benefit3.jpg/_jcr_content/renditions/original./multisem-benefit3.jpg"} "Microscopie électronique avec logiciel d'imagerie ZEN")
Microscopie électronique avec logiciel d'imagerie ZEN
En associant ZEN à MultiSEM, le logiciel standard des microscopes optiques ZEISS entre dans l'univers de la microscopie électronique. Contrôlez MultiSEM de façon simple et intuitive : des routines intelligentes de réglage automatique vous assistent pour capturer des images optimales à haute résolution et de grande qualité. Vous configurez rapidement des procédures d'acquisition automatisées, même complexes, parfaitement adaptées pour réaliser l'imagerie de vos échantillons.
La série ZEISS MultiSEM
|
MultiSEM 505
|
MultiSEM 506
|
|
|---|---|---|
|
Nombre de faisceaux |
61 |
91 |
|
Configuration du balayage |
La mosaïque d'images se compose de 61 images individuelles disposées en hexagone |
La mosaïque d'images se compose de 91 sous-images disposées en hexagone |
|
Champ d'observation à un pas de 12 µm |
108 µm |
132 µm |
|
Champ d'observation à un pas de 15 µm (en option) |
135 µm |
165 µm |
La technologie derrière ZEISS MultiSEM
![Multiple faisceaux d'électrons et détecteurs en parallèle]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.100.100.file/multisem-beampath.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.360.360.file/multisem-beampath.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.768.768.file/multisem-beampath.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1024.1024.file/multisem-beampath.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1280.1280.file/multisem-beampath.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original.image_file.1440.1440.file/multisem-beampath.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-beampath.png/_jcr_content/renditions/original./multisem-beampath.png"} "Multiple faisceaux d'électrons et détecteurs en parallèle")
Multiple faisceaux d'électrons et détecteurs en parallèle
MultiSEM utilise plusieurs faisceaux d'électrons (vert : trajet d'éclairage) et détecteurs en parallèle. Un trajet de détection (rouge) réglé avec précision collecte une récolte importante d'électrons secondaires (SE) pour l'imagerie. Chaque faisceau exécute une routine de balayage synchronisée sur une position de l'échantillon, ce qui produit une seule image individuelle. Les faisceaux d'électrons sont disposés selon un arrangement hexagonal. La fusion de toutes les mosaïques d'image forme l'image complète. L'enregistrement rapide des données est réalisé par une configuration d'ordinateurs en parallèle, augmentant ainsi la vitesse d'imagerie totale. Dans le système MultiSEM, la commande d'acquisition d'images est totalement séparée de celle du processus.
![Sectionnement automatique]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.100.56.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.360.203.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.768.432.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1024.576.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1280.720.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1440.810.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/atumtome_sectioning_multisem.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,2,1920,1082.file/atumtome_sectioning_multisem.jpg"} "Sectionnement automatique")
![Mise en place de l'échantillon]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.100.56.file/multisem-wafer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.360.203.file/multisem-wafer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.768.432.file/multisem-wafer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1024.576.file/multisem-wafer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1280.720.file/multisem-wafer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original.image_file.1440.810.file/multisem-wafer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-wafer.jpg/_jcr_content/renditions/original./multisem-wafer.jpg"} "Mise en place de l'échantillon")
![Configuration de l'expérience]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.100.56.431,151,1215,593.file/multisem-software-screenshot.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.360.203.431,151,1215,593.file/multisem-software-screenshot.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.768.432.431,151,1215,593.file/multisem-software-screenshot.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/multisem-software-screenshot.jpg/_jcr_content/renditions/original.image_file.784.441.431,151,1215,593.file/multisem-software-screenshot.jpg"} "Configuration de l'expérience")
![Échantillon du col du fémur, décapé de manière sélective pour découper les ostéocytes, dissimulés auparavant dans la matrice osseuse. Échantillon : avec l'aimable autorisation de M. Knothe Tate, Université de Nouvelles-Galles du Sud, Australie, et U. Knothe, Cleveland, OH, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-human-bone.jpg"} "Échantillon du col du fémur")
![Coupe de cerveau de souris, vitesse d'acquisition maximale de 1,22 gigapixels/seconde. Avec l'aimable autorisation de J. Lichtman, Université de Harvard, Cambridge, MA, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-mouse-brain.jpg"} "Coupe de cerveau de souris")
![Échantillon de roche de schiste à maturité avancée dont la surface est usinée par un large faisceau d'ions. Avec l'aimable autorisation de L. Hathon, Université d'Houston, Texas, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-shale-rock.jpg"} "Échantillon de roche de schiste à maturité avancée")
![Film de séparation d'une batterie recyclée avec des précipités côté anodique. Image capturée avec une faible énergie d'impact de 1 keV et une taille de pixel de 4 nm, couvrant un champ d'observation de 108 μm × 94 μm.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-battery.jpg"} "Film de séparation d'une batterie recyclée avec des précipités côté anodique.")
![Circuit intégré du processeur graphique, technologique 65 nm, réduit à son substrat de silicium par une gravure à l'acide HF.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.75.80,0,1360,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.270.80,0,1360,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.576.80,0,1360,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1024.768.80,0,1360,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.1280.960.80,0,1360,960.file/multisem-processor.jpg"} "Circuit intégré du processeur graphique, technologique 65 nm")
![Échantillon du col du fémur, décapé de manière sélective pour découper les ostéocytes, dissimulés auparavant dans la matrice osseuse. Échantillon : avec l'aimable autorisation de M. Knothe Tate, Université de Nouvelles-Galles du Sud, Australie, et U. Knothe, Cleveland, OH, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.100.67.file/multisem-human-bone.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.360.240.file/multisem-human-bone.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.768.512.file/multisem-human-bone.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1024.683.file/multisem-human-bone.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original.image_file.1280.853.file/multisem-human-bone.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-human-bone.jpg/_jcr_content/renditions/original./multisem-human-bone.jpg"} "Échantillon du col du fémur")
![Coupe de cerveau de souris, vitesse d'acquisition maximale de 1,22 gigapixels/seconde. Avec l'aimable autorisation de J. Lichtman, Université de Harvard, Cambridge, MA, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-mouse-brain.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-mouse-brain.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-mouse-brain.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-mouse-brain.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-mouse-brain.jpg"} "Coupe de cerveau de souris")
![Échantillon de roche de schiste à maturité avancée dont la surface est usinée par un large faisceau d'ions. Avec l'aimable autorisation de L. Hathon, Université d'Houston, Texas, États-Unis.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-shale-rock.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-shale-rock.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-shale-rock.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-shale-rock.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-shale-rock.jpg"} "Échantillon de roche de schiste à maturité avancée")
![Film de séparation d'une batterie recyclée avec des précipités côté anodique. Image capturée avec une faible énergie d'impact de 1 keV et une taille de pixel de 4 nm, couvrant un champ d'observation de 108 μm × 94 μm.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-battery.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-battery.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-battery.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-battery.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-battery.jpg"} "Film de séparation d'une batterie recyclée avec des précipités côté anodique.")
![Circuit intégré du processeur graphique, technologique 65 nm, réduit à son substrat de silicium par une gravure à l'acide HF.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.100.100.240,0,1200,960.file/multisem-processor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.360.360.240,0,1200,960.file/multisem-processor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.768.768.240,0,1200,960.file/multisem-processor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/multisem/applications/multisem-processor.jpg/_jcr_content/renditions/original.image_file.960.960.240,0,1200,960.file/multisem-processor.jpg"} "Circuit intégré du processeur graphique, technologique 65 nm")
Publications externes
- Brain mapping in high resolution (nature.com)
- Connectomics (Cell Press Nucleus)
- High throughput data acquisition with a multi-beam SEM
- Mission (im)possible – mapping the brain becomes a reality
- High-resolution, high-throughput imaging with MultiSEM 505
- Multiple-Beam Scanning Electron Microscopy (Microscopy Today)
- Further advancing the throughput of a multi-beam SEM
![Image d’aperçu de ZEISS MultiSEM]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/e76e1e51-fe54-413e-8422-9ea56b9aabf6/EN_product-info_MultiSEM.pdf.jpg"} "Télécharger ZEISS MultiSEM")
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