![藻類の化石アプリケーション例]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original.image_file.100.100.file/geo_nanofossil_-algae-bf_fl-tie.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original.image_file.360.360.file/geo_nanofossil_-algae-bf_fl-tie.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original.image_file.768.768.file/geo_nanofossil_-algae-bf_fl-tie.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original./geo_nanofossil_-algae-bf_fl-tie.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original./geo_nanofossil_-algae-bf_fl-tie.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original./geo_nanofossil_-algae-bf_fl-tie.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_nanofossil_-algae-bf_fl-tie.jpg/_jcr_content/renditions/original./geo_nanofossil_-algae-bf_fl-tie.jpg"} "岩石学的な地層の年代を特定し、その時代の環境を解明")
天然資源向け顕微鏡ソリューション
古生物学および花粉学
岩石学的な地層の年代を特定し、その時代の環境を解明
現代の顕微鏡ソリューションにより、これまで不可能だった2Dおよび3D検査において、より詳細な情報の解明が可能になりました。鮮明で解像度の高い画像のおかげで、化石のより正確な識別が可能となり、微細な特徴の観察に役立ちます。
ZEISSの顕微鏡ソリューションを活用して、古代の生命、生態系、環境の秘密を解き明かし、人類の過去に対する理解を深める方法を学びましょう。
化石標本の顕微鏡による2Dおよび3D検査は、以下のような点で役立ちます。
古生物学
微細なテクスチャや鉱物化パターンを調べることで、古生物学者は化石化に成功する条件をより深く理解し、偏りを特定して解釈の改善に役立てることができます。ZEISSの顕微鏡技術により、化石が小さくても、また断片的なものであっても詳細な検査が可能となり、その構造や形態に関する貴重なインサイトが得られます。これにより、完全な生物の再構築や、限られた化石の残骸に基づく生物の理解を深められます。代えのきかない試料の非破壊イメージングは、マルチスケール3D X線顕微鏡を使用することで実現可能です。これにより、試料に一切手を加えることなく、内部構造の3D形態計測を行うことができます。
![化石花粉粒]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.100.56.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.360.203.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.768.432.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.1024.576.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.1280.720.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.1440.810.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/natural-resources/geo_paleo_foram_lightsheet7.jpg/_jcr_content/renditions/original.image_file.1914.1077.0,168,1914,1247.file/geo_paleo_foram_lightsheet7.jpg"} "花粉学")
花粉学
花粉学者は、様々な顕微鏡技術を使用することで、花粉粒や胞子を同定・分類し、形態的特徴を研究し、それらが由来する植物についての推論を行うことができます。ZEISSの顕微鏡ソリューションにより、化石化した花粉粒や胞子の検査が可能となり、植物の進化、生態学、環境変化に関する貴重なインサイトが得られます。
![ZEISS EVO - 直感的操作、ルーチン検査および研究アプリケーション向けのモジュラーSEMプラットフォーム]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "ZEISS EVO")
![ZEISS GeminiSEMファミリー]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.100.100.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.360.360.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.768.768.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/geminisem/zeiss_gemini-sem-stage.jpg/_jcr_content/renditions/original.image_file.1353.1353.285,86,1638,1439.file/zeiss_gemini-sem-stage.jpg"} "ZEISS GeminiSEMファミリー")
![ZEISS Lightsheet 7]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/lightsheet7-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/lightsheet7-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/lightsheet7-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original./lightsheet7-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original./lightsheet7-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original./lightsheet7-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/light-sheet/lightsheet-7/lightsheet7-stage.jpg/_jcr_content/renditions/original./lightsheet7-stage.jpg"} "ZEISS Lightsheet 7")
![ZEISS Sigma]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/sigma360-stage.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/sigma360-stage.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/sigma360-stage.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/sigma360-stage.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma360-stage.png/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/sigma360-stage.png"} "ZEISS Sigma")
![ZEISS Xradia Context microCT]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/context_product.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/context_product.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/context_product.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/context_product.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-context-microct/context_product.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/context_product.jpg"} "ZEISS Xradia Context microCT")
![ZEISS VersaXRM 730]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.100.100.26,26,916,916.file/versaxrm_730_zen-navx.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.360.360.26,26,916,916.file/versaxrm_730_zen-navx.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.768.768.26,26,916,916.file/versaxrm_730_zen-navx.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/xradia/xradia-versa/versaxrm-730/versaxrm_730_zen-navx.jpg/_jcr_content/renditions/original.image_file.890.890.26,26,916,916.file/versaxrm_730_zen-navx.jpg"} "ZEISS VersaXRM 730")
![地質学研究向けZEISS Axioscan 7]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.53,53,906,906.file/axioscan-geo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.53,53,906,906.file/axioscan-geo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.53,53,906,906.file/axioscan-geo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.853.853.53,53,906,906.file/axioscan-geo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.853.853.53,53,906,906.file/axioscan-geo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.853.853.53,53,906,906.file/axioscan-geo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/imaging/axioscan-7-geo/axioscan-geo_stage.jpg/_jcr_content/renditions/original.image_file.853.853.53,53,906,906.file/axioscan-geo_stage.jpg"} "地質学研究向けZEISS Axioscan 7")
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