![ZEISS Microscopy]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg"} "ZEISS Microscopy")
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ZEISS Microscopy
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顕微鏡メーカーのリーダーとして、ZEISSはライフサイエンス、材料研究、教育、臨床ルーチンにお役立ていただけるソリューションやサービスを提供しています。信頼できるZEISSのシステムは、世界各国でハイテク産業での製造や組み立て、原材料の調査や加工などに使用されています。
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![]({"xsmall":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.100.56.file/zeiss-fahnen-quer.jpg","small":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.360.203.file/zeiss-fahnen-quer.jpg","medium":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.768.432.file/zeiss-fahnen-quer.jpg","large":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.1024.576.file/zeiss-fahnen-quer.jpg","xlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.1280.720.file/zeiss-fahnen-quer.jpg","xxlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original.image_file.1440.810.file/zeiss-fahnen-quer.jpg","max":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/zeiss-fahnen-quer.jpg/_jcr_content/renditions/original./zeiss-fahnen-quer.jpg"})
![The new ZEISS Crossbeam 550 Samplefab FIB-SEM offers a fully-automated TEM sample preparation workflow from bulk sample to thinned lamella.]({"xsmall":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.100.56.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","small":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.360.203.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","medium":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.768.432.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","large":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1024.576.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","xlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1280.720.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","xxlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1440.810.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","max":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg"} "The new ZEISS Crossbeam 550 Samplefab FIB-SEM offers a fully-automated TEM sample preparation workflow from bulk sample to thinned lamella.")