![ZEISS Microscopy]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/home/zeiss-microscopy-stage.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/zeiss-microscopy-stage.jpg"} "ZEISS Microscopy")
あなたのパートナー
ZEISS Microscopy
最先端の顕微鏡
顕微鏡メーカーのリーダーとして、ZEISSはライフサイエンス、材料研究、教育、臨床ルーチンにお役立ていただけるソリューションやサービスを提供しています。信頼できるZEISSのシステムは、世界各国でハイテク産業での製造や組み立て、原材料の調査や加工などに使用されています。
多彩な光学顕微鏡、共焦点顕微鏡、電子顕微鏡およびX線顕微鏡の中から、作業やアプリケーションに最適なソリューションをお選びいただけます。
![The new ZEISS Crossbeam 550 Samplefab FIB-SEM offers a fully-automated TEM sample preparation workflow from bulk sample to thinned lamella.]({"xsmall":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.100.56.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","small":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.360.203.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","medium":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.768.432.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","large":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1024.576.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","xlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1280.720.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","xxlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1440.810.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg","max":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,420,1920,1500.file/crossbeam_550_samplefab_hero_w_desk_print_right_v3_prev.jpg"} "The new ZEISS Crossbeam 550 Samplefab FIB-SEM offers a fully-automated TEM sample preparation workflow from bulk sample to thinned lamella.")
![The semiconductor microscopy applications lab is located within the ZEISS Innovation Hub Dresden]({"xsmall":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.100.56.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","small":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.360.203.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","medium":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.768.432.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","large":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.1024.576.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","xlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.1280.720.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","xxlarge":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.1440.810.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg","max":"https://www.zeiss.com/content/dam/newsroom/pressphotos/products/microscopy/dresden-innovation-hub_prev.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,100,1920,1180.file/dresden-innovation-hub_prev.jpg"})