![材料研究向けZEISS Axio Imager 2 材料研究向けZEISS Axio Imager 2]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axio-imager-z2_product_mrc.jpg"})
材料研究向けZEISS Axio Imager 2
カスタマイズ対応光学顕微鏡システムによる材料分析の自動化
先端材料研究における光学顕微鏡のワークフローに使いやすさが加わりました。材料研究向けのZEISS Axio Imager 2により、正確で再現性のある結果が得られます。アプリケーションに合ったシステムをお選びください。粒子解析や共焦点顕微鏡、相関顕微鏡向けの専用ソリューションを利用すれば、装置をさらに拡張できます。
![再現性のある結果 - 無振動の作業環境 再現性のある結果 - 無振動の作業環境]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.100.50.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.360.180.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.768.384.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1024.512.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1280.640.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1440.720.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit1-axio-imager_z2m_axiocam-mrc.jpg/_jcr_content/renditions/original.image_file.1904.952.0,0,1904,953.file/benefit1-axio-imager_z2m_axiocam-mrc.jpg"})
再現性のある結果
無振動の作業環境
優れた結果を得るには、システムの安定性が欠かせません。Axio Imager 2の安定したイメージング性能は、高倍率での作業や長時間にわたる観察に最適です。電動のAxio Imager 2なら、常に一定の条件下で作業しつつ、迅速に再現性のある結果を得られます。
![モジュラー設計 - 高い柔軟性 モジュラー設計 - 高い柔軟性]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.100.50.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.360.180.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.768.384.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1024.512.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1280.640.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original.image_file.1440.720.file/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg/_jcr_content/renditions/original./benefit2-axio-imager-2_particle-analyzer_axiocam-mrc_system.jpg"})
モジュラー設計
高い柔軟性
学術研究であれ、産業研究であれ、材料研究向けの顕微鏡は様々な課題に直面します。Axio Imager 2なら、それらの課題をクリアし、優れた結果が得られます。アプリケーションに適したユニットを取り付けることで、粒子解析や、非金属介在物(NMI)、液晶、半導体MEMSの解析が可能となります。共焦点顕微鏡や相関顕微鏡向けの専用ソリューションを使用し、装置をさらに拡張できます。
![優れた光学性能 - 高コントラスト・高分解能を達成 優れた光学性能 - 高コントラスト・高分解能を達成]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.100.50.file/axio-imager_nosepiece-turret_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.360.180.file/axio-imager_nosepiece-turret_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.768.384.file/axio-imager_nosepiece-turret_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1024.512.file/axio-imager_nosepiece-turret_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1280.640.file/axio-imager_nosepiece-turret_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original.image_file.1440.720.file/axio-imager_nosepiece-turret_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager_nosepiece-turret_1.jpg/_jcr_content/renditions/original./axio-imager_nosepiece-turret_1.jpg"})
優れた光学性能
高コントラスト・高分解能を達成
- 様々なコントラスト法を使用して、金属、複合材料、液晶などの多岐にわたる材料を検査できます。
- 反射光による試料の観察には、明視野、暗視野、微分干渉コントラスト(DIC)、円偏光微分干渉コントラスト(C-DIC)、偏光、蛍光を使用可能です。
- 透過光による試料の観察には、明視野、暗視野、微分干渉コントラスト(DIC)、偏光、円偏光が使用可能です。また、コントラストマネージャーが照明設定を忠実に再現します。
![人間工学に基づいた設計:様々な試料面に対応 人間工学に基づいた設計:様々な試料面に対応]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.100.56.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.360.203.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.768.432.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1024.576.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1280.720.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1440.810.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/control-buttons_axio-imager-2.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,180,1920,1260.file/control-buttons_axio-imager-2.jpg"})
人間工学に基づいた設計
様々な試料面に対応
Axio Imager.Z2mとAxio Imager.M2mのタッチスクリーンには、主要な機能が表示されるため、すべての電動ユニットを指一本で操作できます。フォーカスドライブ周辺にあるコントロールボタンは、人間工学に基づいて配置されており、触って識別しやすい設計になっています。Axio Imager.D2mにはあらかじめプログラムされた5つのボタン、Axio Imager.Z2mにはユーザーが設定できる10のボタンがあります。Axio Imager.A2mはエンコードされています。
![熱顕微鏡:温度変化をフレキシブルに記録 熱顕微鏡:温度変化をフレキシブルに記録]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.100.75.0,0,457,343.file/linkam_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.360.270.0,0,457,343.file/linkam_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/linkam_stage.jpg/_jcr_content/renditions/original.image_file.457.343.0,0,457,343.file/linkam_stage.jpg"})
熱顕微鏡
温度変化をフレキシブルに記録
金属、結晶、セラミックス、プラスチックの温度に伴う変化を観察したいとお考えですか?
ZEN coreとLinkam社の加熱ステージを使用することで、加熱実験や冷却実験が可能になります。タイムラプス撮影中の温度変化を記録すると、各タイムラプスイメージで温度と真空状態データの記録を取得できます。品質管理などにおける、加熱または冷却中の試料の変化観察にご利用ください。