![ZEISS SmartPI - Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/nanoscale-correlative-analysis_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/nanoscale-correlative-analysis_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/nanoscale-correlative-analysis_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/nanoscale-correlative-analysis_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/nanoscale-correlative-analysis_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/nanoscale-correlative-analysis_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original./nanoscale-correlative-analysis_wallpaper.jpg"} "ZEISS SmartPI - Smart Particle Investigator")
ソフトウェア
ナノスケール/相関分析
要件に合わせて構成可能な粒子解析向けのカスタムソリューション
ZEISSシステムでフィルター上の粒子を解析し、材料の化学組成について詳しく理解しましょう。電子顕微鏡とSmartPIを使用し、最大20万個の粒子の解析を完全に自動化できます。相関粒子解析システムは、光学顕微鏡と電子顕微鏡法を用いた解析を結びつけるための最適なソリューションです。規格ISO 16232とVDA19をサポート。
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg"})
SmartPI
![SmartPI：自動粒子解析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.100.100.48,116,1315,1383.file/evo_system_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.360.360.48,116,1315,1383.file/evo_system_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.768.768.48,116,1315,1383.file/evo_system_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1024.1024.48,116,1315,1383.file/evo_system_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg"} "SmartPI：自動粒子解析")
SmartPI：自動粒子解析
SmartPI が化学組成のEDS分析を含むナノメータレンジの粒径解析を自動化。境界上の粒子も正確にカウント。EDSとSEMを同じインターフェースで操作。様々な評価手法、オフライン解析を用い、測定結果や統計から粒子を取り除くことで、解析のレベルを適切にし、良くまとめられた優れたレポート作成が可能です。今のシステムを相関粒子解析（correlative particle analysis：CAPA）にアップグレードも可能です。
ナノスケールの自動粒子解析向けのZEISS SmartPIには、以下が含まれます。
- EVO、SIGMA、MERLIN、ParticleSCAN、JetSCANなどの電子顕微鏡
- SmartPIソフトウェア
CAPA
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.100.56.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.360.203.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.768.432.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1024.576.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1280.720.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1440.810.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1639.922.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg"} "Correlative Particle Analyzer")
Correlative Particle Analyzer
高速粒子解析
- 化学粒子解析には、高分解能のZEISSバンドルが最適
- 最大10倍の速さで結果を取得
- 光学顕微鏡で反射(金属など）および無反射粒子を大きさで分類し繊維を同定
- 電子顕微鏡で粒子をリロケートしEDS分析を自動実行
- 光学顕微鏡と電子顕微鏡の解析結果を１つのレポートに結合
- 粒子解析の規格ISO 16232とVDA19をサポート
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1820.1365.114,0,1934,1365.file/corrmic_particle-analyzer.jpg"} "Correlative Particle Analyzer")
粒子解析用のCorrelative Particle Analyzerには、以下が含まれます。
- 電子顕微鏡EVO MA 10
- 完全電動ズーム顕微鏡Axio Zoom.V16
- 相関解析用試料ホルダー
- AxioVision Correlative Particle Analyzerソフトウェア
![Correlative Particle Analysisのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/a6e1505c-3fec-4fef-9eb3-a92583ba9947/EN_product-info_Correlative-Particle-Analysis_rel-1.1.pdf.jpg"} "Correlative Particle Analysisをダウンロード")
![Particle Analyzerのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/17cab5cc-952b-4122-9446-84dc8a590c07/EN_product-info_Particle-Analyzer_rel-3-3.pdf.jpg"} "Particle Analyzerをダウンロード")
![Automated Microscopic Particle Measurement in the Pharmaceutical Industryのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/fcff38ee-b53a-4b66-9664-caabe5da1c9e/EN_wp_Automated-Microscopic-Particle-Measurement.pdf.jpg"} "Automated Microscopic Particle Measurement in the Pharmaceutical Industryをダウンロード")
![Microscope and Measurement Systems for Quality Assurance and Quality Controlのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/9aaaa250-a1ac-4b74-9e1c-c2d1e7afa583/lowres_EN_42_010_001_industrial_routine_solutions_brochure.pdf.jpg"} "Microscope and Measurement Systems for Quality Assurance and Quality Controlをダウンロード")