![ZEISS SmartPI - Smart Particle Investigator ZEISS SmartPI - Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/smart-pi-stage_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/smart-pi-stage_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/smart-pi-stage_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/smart-pi-stage_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/smart-pi-stage_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/smart-pi-stage_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-stage_wallpaper.jpg/_jcr_content/renditions/original./smart-pi-stage_wallpaper.jpg"})
ソフトウェア
ZEISS SmartPI
Smart Particle Investigator
![エネルギー分散型X線分光法(EDS)による粒子分類 エネルギー分散型X線分光法(EDS)による粒子分類]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.100.100.161,0,576,415.file/eds-particle-classification.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.360.360.161,0,576,415.file/eds-particle-classification.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.415.415.161,0,576,415.file/eds-particle-classification.jpg"})
![エネルギー分散型X線分光法(EDS)による粒子分類 エネルギー分散型X線分光法(EDS)による粒子分類]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.100.56.file/eds-particle-classification.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original.image_file.360.203.file/eds-particle-classification.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/eds-particle-classification.jpg/_jcr_content/renditions/original./eds-particle-classification.jpg"})
エネルギー分散型X線分光法(EDS)による粒子分類
自動SEM粒子分析・分類ソリューション
粒子の検出、分析および分類
Smart Particle Investigator(SmartPI)は、高度な粒子分析および分類ソリューションであり、走査型電子顕微鏡を工業用清浄度検査や鉄鋼業界向けのターンキーソリューションにします。SmartPIは、SEM制御、イメージプロセッシング、および元素解析(EDS)のすべてを、単一のアプリケーション内に組み込んでいます。
- 単一のソフトウェアでSEM画像およびEDS分析の両方をコントロール
- 自動化された、無人の粒子分析を実行
- 再現性のあるデータと業界標準に準拠した報告書を作成
- SmartPIをZEISSの光学顕微鏡粒子分析ソリューションと組み合わせて、相関ワークフローを構成
- グローバルなZEISSサービスとシステム全体のサポートを活用可能
- ISO 16232 / VDA 19に準拠
SmartPIのアプリケーション例
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.100.25.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.360.90.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.768.192.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.256.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.320.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.360.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/smart-pi-workflow-wallpaper.jpg/_jcr_content/renditions/original.image_file.1700.425.0,1,1700,426.file/smart-pi-workflow-wallpaper.jpg"})
推奨されるSEMプラットフォーム
![EVO走査型電子顕微鏡 EVO走査型電子顕微鏡]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_product.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_product.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_product.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_product.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_product.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original./evo_product.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/evo_product.jpg/_jcr_content/renditions/original./evo_product.jpg"})
EVO走査型電子顕微鏡
EVOは、日常的な材料分析、産業品質保証および故障解析に最適な従来型SEMです。大型電動5軸ステージと使いやすいSmartSEMソフトウェアにより、EVOは粒子解析アプリケーションのための高度に設定可能なイメージングプラットフォームを提供します。EVOには可変圧力(VP)機能があり、導電性コーティングを施すことなく、フィルターなどの非導電性試料のイメージングと分析を可能にします。また、ラマンやFTIRなどを使用したその後の分析用に、フィルターをインタクトな状態で残すことができます。
![Sigma電界放出型走査電子顕微鏡 Sigma電界放出型走査電子顕微鏡]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.100.100.84,99,849,864.file/zeiss-sigma-500-small.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.360.360.84,99,849,864.file/zeiss-sigma-500-small.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/smartpi/new-images/zeiss-sigma-500-small.jpg/_jcr_content/renditions/original.image_file.765.765.84,99,849,864.file/zeiss-sigma-500-small.jpg"})
Sigma電界放出型走査電子顕微鏡
Sigmaは、ナノメートルスケールの粒子分析に高い分解能を必要とするユーザーに最適なSEMです。Geminiカラムテクノロジーを採用したSigmaは、電界放出型走査電子顕微鏡(FE-SEM)による優れたイメージングと分析結果を提供します。Gemini光学系により、元素分析、特に磁性試料の分析に非常に適したプラットフォームで最高レベルの分解能のイメージングが実現します。