![ZEISS Solutions Lab]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.100.33.file/solution-lab-wallpaper-1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.360.120.file/solution-lab-wallpaper-1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.768.256.file/solution-lab-wallpaper-1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1024.341.file/solution-lab-wallpaper-1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1280.427.file/solution-lab-wallpaper-1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1440.480.file/solution-lab-wallpaper-1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original./solution-lab-wallpaper-1.jpg"} "ZEISS Solutions Lab")
ソフトウェア
ZEISS Solutions Lab
迅速なアプリケーション開発
![ZEISS Phase Contrast Enhancer for XRM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.100.56.0,139,662,511.file/ppcf_rawdata.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.360.203.0,139,662,511.file/ppcf_rawdata.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg"} "ZEISS Phase Contrast Enhancer for XRM")
![ZEISS Additive Manufacturing Powder Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.100.56.36,0,1885,1040.file/ampa_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.360.203.36,0,1885,1040.file/ampa_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.768.432.36,0,1885,1040.file/ampa_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1024.576.36,0,1885,1040.file/ampa_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1280.720.36,0,1885,1040.file/ampa_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1440.810.36,0,1885,1040.file/ampa_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1849.1040.36,0,1885,1040.file/ampa_1.jpg"} "ZEISS Additive Manufacturing Powder Analyzer")
![ZEISS DeepRecon for X-ray Reconstruction]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.100.56.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.360.203.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.768.432.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1024.576.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png"} "ZEISS DeepRecon for X-ray Reconstruction")
![ZEISS Calotte Grinding Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.100.56.32,0,1396,767.file/calotte_grinding.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.360.203.32,0,1396,767.file/calotte_grinding.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.768.432.32,0,1396,767.file/calotte_grinding.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1024.576.32,0,1396,767.file/calotte_grinding.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1280.720.32,0,1396,767.file/calotte_grinding.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png"} "ZEISS Calotte Grinding Workflow")
![ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.100.56.0,3,2456,1385.file/tic-crosssection.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.360.203.0,3,2456,1385.file/tic-crosssection.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.768.432.0,3,2456,1385.file/tic-crosssection.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1024.576.0,3,2456,1385.file/tic-crosssection.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1280.720.0,3,2456,1385.file/tic-crosssection.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1440.810.0,3,2456,1385.file/tic-crosssection.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,3,2456,1385.file/tic-crosssection.jpg"} "ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement")
![ZEISS Dendrite Arm Spacing Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.100.56.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.360.203.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.768.432.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1024.576.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1280.720.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg"} "ZEISS Dendrite Arm Spacing Workflow")
![ZEISS Point Counting Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.100.56.30,0,1402,772.file/point-counting.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.360.203.30,0,1402,772.file/point-counting.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.768.432.30,0,1402,772.file/point-counting.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1024.576.30,0,1402,772.file/point-counting.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1280.720.30,0,1402,772.file/point-counting.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png"} "ZEISS Point Counting Workflow")
![ZEISS Microhardness Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.100.56.0,31,1428,834.file/microhardness.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.360.203.0,31,1428,834.file/microhardness.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.768.432.0,31,1428,834.file/microhardness.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1024.576.0,31,1428,834.file/microhardness.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1280.720.0,31,1428,834.file/microhardness.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png"} "ZEISS Microhardness Workflow")
![ZEISS Pseudo 3D Micrograph Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.100.56.0,60,640,420.file/pseudo-3d_micrograph-1.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.360.203.0,60,640,420.file/pseudo-3d_micrograph-1.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png"} "ZEISS Pseudo 3D Micrograph Workflow")
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.100.56.0,17,1249,720.file/lib-sea_recovery-analysis.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.360.203.0,17,1249,720.file/lib-sea_recovery-analysis.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.768.432.0,17,1249,720.file/lib-sea_recovery-analysis.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1024.576.0,17,1249,720.file/lib-sea_recovery-analysis.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.100.56.16,0,1413,786.file/grain-size-color-map-1.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.360.203.16,0,1413,786.file/grain-size-color-map-1.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.768.432.16,0,1413,786.file/grain-size-color-map-1.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1024.576.16,0,1413,786.file/grain-size-color-map-1.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1280.720.16,0,1413,786.file/grain-size-color-map-1.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1397.786.16,0,1413,786.file/grain-size-color-map-1.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1397.786.16,0,1413,786.file/grain-size-color-map-1.png"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.100.56.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.360.203.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.768.432.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1024.576.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1280.720.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1440.810.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1757.988.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png"})
詳細をご希望ですか？
以下のフォームよりお問い合わせください
ZEISSが解決をサポートできる課題
- イメージングプロセスまたはワークフローの自動化
- 高度な画像解析と補正
- 関心領域検索の自動化
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