![ZEISS Solutions Lab]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.100.33.file/solution-lab-wallpaper-1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.360.120.file/solution-lab-wallpaper-1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.768.256.file/solution-lab-wallpaper-1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1024.341.file/solution-lab-wallpaper-1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1280.427.file/solution-lab-wallpaper-1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original.image_file.1440.480.file/solution-lab-wallpaper-1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/solution-lab-wallpaper-1.jpg/_jcr_content/renditions/original./solution-lab-wallpaper-1.jpg"} "ZEISS Solutions Lab")
ZEISS Solutions Lab
迅速なアプリケーション開発
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ZEISS Phase Contrast Enhancer for XRM
Solutions Labの金属部品製造向けソリューション
アーチファクトを明確にモデリングし、ボリューム全体にわたって3Dデコンボリューションすることで、位相アーチファクトを除去します。
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ZEISS Additive Manufacturing Powder Analyzer
Solutions Labの金属部品製造向けソリューション
1回クリックするだけで、生データから3Dボリューム全体の解析結果を取得できます。
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ZEISS DeepRecon for X-ray Reconstruction
スループットを10倍向上させるためのSolutions Labのソリューション
ZEISS Xradia X線顕微鏡での繰り返しワークフローを実行する機能です。
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ZEISS Calotte Grinding Workflow
Solutions Labのコーティング、膜および表面向けソリューション
膜や表面の耐摩耗性を判定します。
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ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement
Solutions Labのコーティング、薄膜および粗さ解析向けソリューション
光学顕微鏡による非接触の高さ測定を行います。
![ZEISS Phase Contrast Enhancer for XRM]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.100.56.0,139,662,511.file/ppcf_rawdata.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.360.203.0,139,662,511.file/ppcf_rawdata.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ppcf_rawdata.jpg/_jcr_content/renditions/original.image_file.662.372.0,139,662,511.file/ppcf_rawdata.jpg"} "ZEISS Phase Contrast Enhancer for XRM")
![ZEISS Additive Manufacturing Powder Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.100.56.36,0,1885,1040.file/ampa_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.360.203.36,0,1885,1040.file/ampa_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.768.432.36,0,1885,1040.file/ampa_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1024.576.36,0,1885,1040.file/ampa_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1280.720.36,0,1885,1040.file/ampa_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1440.810.36,0,1885,1040.file/ampa_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/ampa_1.jpg/_jcr_content/renditions/original.image_file.1849.1040.36,0,1885,1040.file/ampa_1.jpg"} "ZEISS Additive Manufacturing Powder Analyzer")
![ZEISS DeepRecon for X-ray Reconstruction]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.100.56.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.360.203.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.768.432.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1024.576.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/deep-recon_fdk-v-deeplearning.png/_jcr_content/renditions/original.image_file.1061.597.162,0,1223,597.file/deep-recon_fdk-v-deeplearning.png"} "ZEISS DeepRecon for X-ray Reconstruction")
![ZEISS Calotte Grinding Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.100.56.32,0,1396,767.file/calotte_grinding.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.360.203.32,0,1396,767.file/calotte_grinding.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.768.432.32,0,1396,767.file/calotte_grinding.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1024.576.32,0,1396,767.file/calotte_grinding.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1280.720.32,0,1396,767.file/calotte_grinding.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/calotte_grinding.png/_jcr_content/renditions/original.image_file.1364.767.32,0,1396,767.file/calotte_grinding.png"} "ZEISS Calotte Grinding Workflow")
![ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.100.56.0,3,2456,1385.file/tic-crosssection.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.360.203.0,3,2456,1385.file/tic-crosssection.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.768.432.0,3,2456,1385.file/tic-crosssection.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1024.576.0,3,2456,1385.file/tic-crosssection.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1280.720.0,3,2456,1385.file/tic-crosssection.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1440.810.0,3,2456,1385.file/tic-crosssection.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/tic-crosssection.jpg/_jcr_content/renditions/original.image_file.1920.1080.0,3,2456,1385.file/tic-crosssection.jpg"} "ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement")
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ZEISS Phase Contrast Enhancer for XRM
Solutions Labの金属部品製造向けソリューション
アーチファクトを明確にモデリングし、ボリューム全体にわたって3Dデコンボリューションすることで、位相アーチファクトを除去します。
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ZEISS Additive Manufacturing Powder Analyzer
Solutions Labの金属部品製造向けソリューション
1回クリックするだけで、生データから3Dボリューム全体の解析結果を取得できます。
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ZEISS Calotte Grinding Workflow
Solutions Labのコーティング、膜および表面向けソリューション
膜や表面の耐摩耗性を判定します。
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ZEISS Total Interference Contrast (TIC) for Thin Layer Measurement
Solutions Labのコーティング、薄膜および粗さ解析向けソリューション
光学顕微鏡による非接触の高さ測定を行います。
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ZEISS Dendrite Arm Spacing Workflow
光学顕微鏡によるデンドライトアーム間隔測定のためのSolutions Labのソリューション
画像処理と手動による微調整を組み合わせた自動機能です。
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ZEISS Point Counting Workflow
Solutions Labの光学顕微鏡向けソリューション
試料中の特定の構成要素の推定体積分率または重要な位相を判定します。
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ZEISS Microhardness Workflow
Solutions Labの金属向けソリューション
微小硬度ワークフローによって、冶金学的試験を実施して金属の硬度を判定できます。
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ZEISS Calotte Grinding Workflow
Solutions Labのコーティング、膜および表面向けソリューション
膜や表面の耐摩耗性を判定します。
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ZEISS Pseudo 3D Micrograph Workflow
2D画像から3D構造のビジュアライゼーションを作成するためのSolutions Labのソリューション
2D画像から3D構造のビジュアライゼーションを作成するためのSolutions Labのソリューション
![ZEISS Dendrite Arm Spacing Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.100.56.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.360.203.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.768.432.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1024.576.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1280.720.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/dendrites-in-failed-autogenous-alloy.jpg/_jcr_content/renditions/original.image_file.1388.781.0,130,1388,911.file/dendrites-in-failed-autogenous-alloy.jpg"} "ZEISS Dendrite Arm Spacing Workflow")
![ZEISS Point Counting Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.100.56.30,0,1402,772.file/point-counting.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.360.203.30,0,1402,772.file/point-counting.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.768.432.30,0,1402,772.file/point-counting.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1024.576.30,0,1402,772.file/point-counting.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1280.720.30,0,1402,772.file/point-counting.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/point-counting.png/_jcr_content/renditions/original.image_file.1372.772.30,0,1402,772.file/point-counting.png"} "ZEISS Point Counting Workflow")
![ZEISS Microhardness Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.100.56.0,31,1428,834.file/microhardness.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.360.203.0,31,1428,834.file/microhardness.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.768.432.0,31,1428,834.file/microhardness.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1024.576.0,31,1428,834.file/microhardness.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1280.720.0,31,1428,834.file/microhardness.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/microhardness.png/_jcr_content/renditions/original.image_file.1428.803.0,31,1428,834.file/microhardness.png"} "ZEISS Microhardness Workflow")
![ZEISS Pseudo 3D Micrograph Workflow]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.100.56.0,60,640,420.file/pseudo-3d_micrograph-1.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.360.203.0,60,640,420.file/pseudo-3d_micrograph-1.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/pseudo-3d_micrograph-1.png/_jcr_content/renditions/original.image_file.640.360.0,60,640,420.file/pseudo-3d_micrograph-1.png"} "ZEISS Pseudo 3D Micrograph Workflow")
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ZEISS Liberation & Surface Exposure Analyzer
Solutions Labの3D鉱物単体分離分析ソリューション
鉱業分野向けの自動化された3D単体分離分析、表面積分析を行います。
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ZEISS Point Counting Workflow
Solutions Labの光学顕微鏡向けソリューション
試料中の特定の構成要素の推定体積分率または重要な位相を判定します。
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ZEISS Grain Size Color Map Workflow
Solutions Labの粒度分布可視化ソリューション
Solutions Labの粒度分布可視化ソリューション
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ZEISS Pseudo 3D Micrograph Workflow
2D画像から3D構造のビジュアライゼーションを作成するためのSolutions Labのソリューション
2D画像から3D構造のビジュアライゼーションを作成するためのSolutions Labのソリューション
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ZEISS DeepRecon for X-ray Reconstruction
スループットを10倍向上させるためのSolutions Labのソリューション
ZEISS Xradia X線顕微鏡での繰り返しワークフローを実行する機能です。
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ZEISS Maximum Birefringence Projector
光学顕微鏡を使用したSolutions Labの鉱物学ソリューション
に基づいて自動岩石光学顕微鏡で鉱物分類を行うためのワークフローです。
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.100.56.0,17,1249,720.file/lib-sea_recovery-analysis.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.360.203.0,17,1249,720.file/lib-sea_recovery-analysis.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.768.432.0,17,1249,720.file/lib-sea_recovery-analysis.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1024.576.0,17,1249,720.file/lib-sea_recovery-analysis.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/lib-sea_recovery-analysis.png/_jcr_content/renditions/original.image_file.1249.703.0,17,1249,720.file/lib-sea_recovery-analysis.png"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.100.56.16,0,1413,786.file/grain-size-color-map-1.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.360.203.16,0,1413,786.file/grain-size-color-map-1.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.768.432.16,0,1413,786.file/grain-size-color-map-1.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1024.576.16,0,1413,786.file/grain-size-color-map-1.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1280.720.16,0,1413,786.file/grain-size-color-map-1.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1397.786.16,0,1413,786.file/grain-size-color-map-1.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/grain-size-color-map-1.png/_jcr_content/renditions/original.image_file.1397.786.16,0,1413,786.file/grain-size-color-map-1.png"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.100.56.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.360.203.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.768.432.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1024.576.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1280.720.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1440.810.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zeiss-solutionslab/maxbirefringence_cross-pol_crystal_2.png/_jcr_content/renditions/original.image_file.1757.988.0,17,1757,1005.file/maxbirefringence_cross-pol_crystal_2.png"})
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