![ZEISS SmartPI - Smart Particle Investigator]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.100.33.file/nanoscale-correlative-analysis_wallpaper.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.360.120.file/nanoscale-correlative-analysis_wallpaper.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.768.256.file/nanoscale-correlative-analysis_wallpaper.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1024.341.file/nanoscale-correlative-analysis_wallpaper.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1280.427.file/nanoscale-correlative-analysis_wallpaper.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original.image_file.1440.480.file/nanoscale-correlative-analysis_wallpaper.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/nanoscale-correlative-analysis_wallpaper.jpg/_jcr_content/renditions/original./nanoscale-correlative-analysis_wallpaper.jpg"} "ZEISS SmartPI - Smart Particle Investigator")
ソフトウェア
ナノスケール/相関分析
要件に合わせて構成可能な粒子解析向けのカスタムソリューション
ZEISSシステムでフィルター上の粒子を解析し、材料の化学組成について詳しく理解しましょう。電子顕微鏡とSmartPIを使用し、最大20万個の粒子の解析を完全に自動化できます。相関粒子解析システムは、光学顕微鏡と電子顕微鏡法を用いた解析を結びつけるための最適なソリューションです。規格ISO 16232とVDA19をサポート。
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迅速なナノスケール/化学/相関粒子解析
部品や製造工程の記述的な清浄度を監視する作業があります。機械部品は摩擦無く稼働させなければなりません。ひびからの漏れを避け、ノズルやフィルタの目詰まりを削減し、ポンプやバルブの故障を抑えなければなりません。
保守の費用を最小化し、稼働時間を最大化します。
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ナノスケールの完全に自動化された粒子解析向けZEISS SmartPI
電子顕微鏡でフィルタ上の粒子を最大20万個解析し、材料の化学組成についても知ることができます。SmartPIでは全てが自動化されています。
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ZEISS相関粒子解析
光学顕微鏡と電子顕微鏡を用いて、最大200個の重要な粒子を測定、解析します。高速で非常に効率的です。粒子のEDS分析のための、この相関粒子解析システムはISO 16232とVDA19をサポートします。
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/capa_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.6,0,1994,1491.file/capa_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/brightfield_metallic-particle_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.10,0,1990,1485.file/brightfield_metallic-particle_particle-analyzer.jpg"})
![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/edx-analysis_chemical-element_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1920.1440.0,20,2048,1556.file/edx-analysis_chemical-element_particle-analyzer.jpg"})
SmartPI
![SmartPI：自動粒子解析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.100.100.48,116,1315,1383.file/evo_system_1.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.360.360.48,116,1315,1383.file/evo_system_1.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.768.768.48,116,1315,1383.file/evo_system_1.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1024.1024.48,116,1315,1383.file/evo_system_1.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/new-images/evo_system_1.jpg/_jcr_content/renditions/original.image_file.1267.1267.48,116,1315,1383.file/evo_system_1.jpg"} "SmartPI：自動粒子解析")
SmartPI：自動粒子解析
SmartPI が化学組成のEDS分析を含むナノメータレンジの粒径解析を自動化。境界上の粒子も正確にカウント。EDSとSEMを同じインターフェースで操作。様々な評価手法、オフライン解析を用い、測定結果や統計から粒子を取り除くことで、解析のレベルを適切にし、良くまとめられた優れたレポート作成が可能です。今のシステムを相関粒子解析（correlative particle analysis：CAPA）にアップグレードも可能です。
ナノスケールの自動粒子解析向けのZEISS SmartPIには、以下が含まれます。
- EVO、SIGMA、MERLIN、ParticleSCAN、JetSCANなどの電子顕微鏡
- SmartPIソフトウェア
CAPA
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.100.56.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.360.203.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.768.432.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1024.576.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1280.720.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1440.810.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/correlative_microscopy_materials_with-monitor.jpg/_jcr_content/renditions/original.image_file.1639.922.133,0,1772,923.file/correlative_microscopy_materials_with-monitor.jpg"} "Correlative Particle Analyzer")
Correlative Particle Analyzer
高速粒子解析
- 化学粒子解析には、高分解能のZEISSバンドルが最適
- 最大10倍の速さで結果を取得
- 光学顕微鏡で反射(金属など）および無反射粒子を大きさで分類し繊維を同定
- 電子顕微鏡で粒子をリロケートしEDS分析を自動実行
- 光学顕微鏡と電子顕微鏡の解析結果を１つのレポートに結合
- 粒子解析の規格ISO 16232とVDA19をサポート
![Correlative Particle Analyzer]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.100.75.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.360.270.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.768.576.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1024.768.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1280.960.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1440.1080.114,0,1934,1365.file/corrmic_particle-analyzer.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/nanoscale-and-correlative-analysis/corrmic_particle-analyzer.jpg/_jcr_content/renditions/original.image_file.1820.1365.114,0,1934,1365.file/corrmic_particle-analyzer.jpg"} "Correlative Particle Analyzer")
粒子解析用のCorrelative Particle Analyzerには、以下が含まれます。
- 電子顕微鏡EVO MA 10
- 完全電動ズーム顕微鏡Axio Zoom.V16
- 相関解析用試料ホルダー
- AxioVision Correlative Particle Analyzerソフトウェア
製品紹介動画をご覧ください
ダウンロード
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Correlative Particle Analysis
Quickly Characterize and Classify Particles Supporting ISO 16232 by Light and Electron Microscopy
ファイルサイズ: 2 MB -
Particle Analyzer
Analyze Tiny Particles: Accurately and Reproducibly
ファイルサイズ: 5 MB
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Automated Microscopic Particle Measurement in the Pharmaceutical Industry
ファイルサイズ: 5 MB -
Microscope and Measurement Systems for Quality Assurance and Quality Control
Capture the essentials of your component. Quickly. Simply. Comprehensively.
ファイルサイズ: 4 MB
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![Correlative Particle Analysisのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/e8b43e4f-cc05-4e0f-9061-cf9bc82dba6f/EN_product-info_Correlative-Particle-Analysis_rel-1.1.pdf.jpg"} "Correlative Particle Analysisをダウンロード")
![Particle Analyzerのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/be519bab-aee7-4f33-91c8-a54b53004837/EN_product-info_Particle-Analyzer_rel-3-3.pdf.jpg"} "Particle Analyzerをダウンロード")
![Automated Microscopic Particle Measurement in the Pharmaceutical Industryのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/5ea777bb-5865-4719-8f69-f368b8df361d/EN_wp_Automated-Microscopic-Particle-Measurement.pdf.jpg"} "Automated Microscopic Particle Measurement in the Pharmaceutical Industryをダウンロード")
![Microscope and Measurement Systems for Quality Assurance and Quality Controlのプレビュー画像]({"max":"https://asset-downloads.zeiss.com/catalogs/preview/mic/22bbc002-274d-4300-aadf-263d64fea42b/lowres_EN_42_010_001_industrial_routine_solutions_brochure.pdf.jpg"} "Microscope and Measurement Systems for Quality Assurance and Quality Controlをダウンロード")