ZEISS Crossbeam FIB-SEM for High Throughput 3D Analysis and Sample Preparation
ZEISS Microscopy is revolutionizing the field of engineering materials by offering a comprehensive portfolio for analyzing and enhancing materials at the micro and nanometer scale. Our advanced microscopy solutions, including SEM, FIB-SEM, and X-ray microscopy, enable precise imaging and analysis across multiple scales. From improving aluminum alloys to optimizing surface finishes for better wear resistance and aesthetic appeal, ZEISS technologies support critical R&D and quality assurance processes. With high-resolution, non-destructive imaging options, and advanced analytics, researchers and engineers can push the boundaries of material science, paving the way for innovations in construction, transportation, and beyond.