Perfect Tomographies. Every Sample. Every User. Every Time.
Introducing ZEISS VersaXRM 730
ZEISS presents our newest VersaXRM® 730 3D X-ray microscope (XRM) which offers a wider array of choices than any advanced XRM on the market.
New opportunities in a constantly shifting technology landscape require new capabilities. And dynamic workforce requirements demand an intuitive user environment.
Discover the Updates
Whats New on ZEISS VersaXRM 730
Download the Product Flyer here ↓
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Discover the Advantages in Your Research Area
ZEISS VersaXRM 730 - Microscopic Solutions for all Applications
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Materials Research
- Experience the unique benefits of ZEISS VersaXRM 730, including non-destructive views of deeply buried microstructures, compositional contrast for studying challenging materials, and the ability to maintain RaaD for in situ imaging.
- Enjoy fast and intuitive 3D navigation technology for macro-scale inspection and easily identify regions of interest for high-resolution imaging.
- Benefit from faster throughput, improved image quality, and resolution performance, allowing for better data, increased sample statistics, more users, and enhanced instrument utilization.
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Life Sciences
- Capture whole samples at multiple length scales with ZEISS VersaXRM 730, utilizing RaaD and FAST Mode to easily navigate and capture high-resolution regions of interest.
- Overcome limitations in imaging large sample volumes by leveraging ZEISS DeepScout, generating high-resolution overviews that were previously unreachable.
- Benefit from high-contrast images acquired with VersaXRM 730, enabling precise identification of structures of interest for fail-proof segmentation and localization for higher resolution acquisition using electron microscopy.
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Geological Research
- Experience the fast and precise nanoscale tomography imaging capabilities of ZEISS VersaXRM 730 for geological samples, enabling detailed examination of samples from Earth and beyond.
- Benefit from the accurate 3D nanoscale support for in situ studies, fluid flow analysis, mineral reactivity studies, mineral phase segmentation, and diffraction contrast tomography with ZEISS LabDCT Pro.
- Enjoy high throughput multiscale imaging and characterization of rock and fossil samples, leading to improved efficiencies and more time for data interpretation.
- Achieve higher quality data for enhanced image analysis and AI applications, and combine the power of ZEISS Versa XRM with automated segmentation software for CT automated quantitative mineralogy.
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Additive Manufacturing
- Utilize Scout-and-Zoom technology to swiftly access inner structures without any sample manipulation, saving time and effort.
- Enhance the speed of inspection throughout the additive manufacturing process chain, ensuring high-quality results.
- Benefit from class-leading submicron resolution to thoroughly analyze process parameters and material characteristics with precision.
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Electronics and Semiconductor Packaging
- Harness groundbreaking RaaD capability and AI-enabled fast scans to non-destructively image IC packages and internal defects.
- Simplify and optimize your experience with the intuitive ZEN navx user interface, which improves operational efficiency through built-in onscreen guidance, sample intelligence, and streamlined workflows.
- Achieve faster time-to-results with faster throughput at a large field of view (FOV), enabling quicker identification of failures, root causes, and facilitating more sample runs for failure analysis, packaging development, and competitive analysis applications.
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Industrial Inspection and Quality Control
- Empower fast access to internal features of a part without the need for destruction or disassembly, thanks to Volume Scout technology embedded in ZEN navx.
- Achieve high-quality inspection of manufactured parts and assembled devices with faster throughput, while preserving their integrity.
- Conduct detailed analysis of microstructures in parts and evaluate their material characteristics with the class-leading submicron resolution.
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Lithium Ion Batteries
- Achieve high-resolution imaging of intact pouch and cylindrical cells for longitudinal studies of aging effects across hundreds of charge cycles with Resolution at a Distance.
- Benefit from the unmatched fidelity of the only tool capable of looking into an intact battery.
- Identify the region of interest for high-resolution investigations using Scout-and-Zoom.
- Enjoy dramatically reduced high-resolution scan times with VersaXRM 730.
- Conduct high-resolution interior tomographies across larger samples with ZEISS DeepScout.
Learn About the Use Cases of the New X-ray Microscope
We have to 2 webinars in store for you
A New Era of Lab X-ray Microscopy
From Pushing the Limits in 3D Imaging to Making it Accessible and Easy
Join us for this webinar where we will explore the advancements in X-ray microscopy, including non-destructive 3D characterization and time-dependent in situ studies. Discover how deep learning algorithms and novel hardware have pushed the boundaries of high-resolution imaging over a larger field-of-view. Learn about the user-centered microscope interface that puts researchers in complete control, allowing for seamless navigation and utilization of cutting-edge capabilities. Don't miss out on the opportunity to stay at the forefront of 3D imaging technology.
Join us on 25 of September 2024 at 4:00 PM CEST.
Exploring Batteries and Other Energy Materials
With Advanced X-ray Microscopy
Join our webinar to explore the crucial role of batteries in the energy transition and their impact on device performance and longevity. Learn about the importance of safety, service life, performance, and cost in battery technologies. Discover how efficient and environmentally friendly processes can enable a circular economy by reusing valuable metals from spent batteries. Gain insights into the composition of black mass and its influence on efficient metal recovery. Don't miss out on this opportunity to stay informed about the future of battery technology.
Join us on 26 of September 2024 at 4:00 PM CEST.