![]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.100.33.0,19,3850,1302.file/header_nanomaterials_test.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.360.120.0,19,3850,1302.file/header_nanomaterials_test.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.768.256.0,19,3850,1302.file/header_nanomaterials_test.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.1024.341.0,19,3850,1302.file/header_nanomaterials_test.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.1280.427.0,19,3850,1302.file/header_nanomaterials_test.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.1440.480.0,19,3850,1302.file/header_nanomaterials_test.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/header_nanomaterials_test.png/_jcr_content/renditions/original.image_file.1920.640.0,19,3850,1302.file/header_nanomaterials_test.png"})
Advancing Correlative Studies in Nanomaterials and Nanoelectronics
Solve the Multi-Scale Challenge
![Explore the correlative XRM-FIB/SEM Workflow Sample in Volume Analyis]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original.image_file.100.75.file/xrm-fib-sem-workflow_preview.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original.image_file.360.270.file/xrm-fib-sem-workflow_preview.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original./xrm-fib-sem-workflow_preview.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original./xrm-fib-sem-workflow_preview.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original./xrm-fib-sem-workflow_preview.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original./xrm-fib-sem-workflow_preview.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/xrm-fib-sem-workflow_preview.png/_jcr_content/renditions/original./xrm-fib-sem-workflow_preview.png"})
The Workflow in One Video
Finding the needle in the haystack explained in this video. Enjoy a brief introduction to lastest possibilities with correlative microscopy
![FIB-SEM tomography dataset acquired from a commercially purchased 3D NAND sample. FIB-SEM tomography dataset acquired from a commercially purchased 3D NAND sample.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.100.50.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.360.180.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.768.384.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.1024.512.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.1280.640.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.1440.720.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/nanomaterials_awarenesspage/applications_crossbeam_3d-nand_fib-sem-tomography-02.png/_jcr_content/renditions/original.image_file.1535.768.386,108,1921,876.file/applications_crossbeam_3d-nand_fib-sem-tomography-02.png"})
Applications in Electronics & Semiconductor
Optimize your material for further production in the electronics area.
![Fresnel zone plate, example for nanopatterning. Fresnel zone plate, example for nanopatterning.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.100.50.file/benefit_thin-film_background.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.360.180.file/benefit_thin-film_background.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.768.384.file/benefit_thin-film_background.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.1024.512.file/benefit_thin-film_background.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.1280.640.file/benefit_thin-film_background.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original.image_file.1440.720.file/benefit_thin-film_background.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_thin-film_background.png/_jcr_content/renditions/original./benefit_thin-film_background.png"})
Thin Films
Recent developments of nanotechnology have pushed the development of FE-SEMs and FIB-SEMs.
Caption: Co nanoparticles embedded in esoporous silica, STEM-EDS analysis, measured at 30 kV. High resolution EDS mapping of individual Co nanoparticles with approx. 10 nm size are resolved.
![FIB-SEM tomography dataset acquired from a commercially purchased 3D NAND sample. FIB-SEM tomography dataset acquired from a commercially purchased 3D NAND sample.]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.100.50.file/benefit_photonics_background.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.360.180.file/benefit_photonics_background.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.768.384.file/benefit_photonics_background.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.1024.512.file/benefit_photonics_background.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.1280.640.file/benefit_photonics_background.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original.image_file.1440.720.file/benefit_photonics_background.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/campaigns/materials-science/fy-22-23/nanomaterials/benefit_photonics_background.png/_jcr_content/renditions/original./benefit_photonics_background.png"})
Photonics
Discover how an FE-SEM enables research on gold platelets used in sensors and how to prepare TEM samples easily with a FIB-SEM.