Product

ZEISS EVO – Automate and Correlate The Smart Alternative to TTSEMs for Materials Analysis

The latest generation ZEISS EVO brings all the benefits of a compact SEM, but with functionality, analytical options, data quality and laboratory connectivity not possible in a tabletop instrument.

Easy to use for non-expert users
Short time to result and high throughput
Small footprint in the laboratory
Lower costs compared to conventional SEMs
Future assurance with Service, Support, and Upgradability

FAQs

Do I need to be an electron optics expert to jump into SEM?
Why is region of interest targeting and contextual data reporting so critical in SEM?
Tabletop/desktop form factor provides utility for portable and remote applications, so why go for a floor model system instead?
Tabletop/desktop systems provide an attractive price point for entry into the EM application space, does this mean floor model systems are out of reach?

ZEISS EVO with ZEN core for the connected laboratory

Workflow Solutions for ZEISS EVO

EVO offers workflow solutions for guided acquisition, automated analysis of routine sample types, machine learning powered segmentation for complex microstructures, and multimodal correlation across instruments and labs.

How-to Video

ZEN Intellesis
How-to Video

ZEN Core
How-to video

ZEN Connect
A How-to Video

SmartSEM Touch

Connect to Productivity. Connect the digital and real world

ZEISS AR Metrology App

The "ZEISS AR Metrology" app links the digital world by using augmented reality. The app lets you expierence ZEISS measuring equipment interactively.

All you need is a smartphone or tablet

Only 3 simple steps to get the AR experience

ZEISS EVO

The materials industries’ stable, intuitive, uncompromising SEM for:

Structural characterization
Spectroscopy of materials, alloys and impurities
Phase and grain analysis and crystallography
Surface topography, contamination and corrosion
Inclusion, particle, weld and failure analysis
Easy and seamless correlative microscopy
Imaging and analysis of heavy and bulky samples
Optional LaB6 emitter and high definition backscatter detection for superior imaging
Class leading geometry for highest throughput and efficiency of EDS analysis

Easy to use even for non-microscopists

SmartSEM Touch UI puts interactive workflow control directly at your fingertips. It is quick and easy to learn, dramatically reducing training effort and costs. Within minutes, even new users will begin capturing stunning images. EVO also supports industrial operators who require automated workflows for repeatable inspection tasks, and multiskilled metals researchers using SEM as one of multiple tools.

Rapid high resolution insights with high productivity

EVO needs only about 1 minute to vent the vacuum chamber, so you can exchange samples and resume imaging within a very short time. Additionally, automation functions and incredible stability let you make the most of your valuable laboratory time, utilizing long unattended analysis runs. Its heavy-duty stage, analytical capability, and adaptability for an array of accessories, means it has the power to support your research or quality control.

EVO can also be used in small laboratories

The space requirement for EVO is only slightly greater than that of tabletop solutions. To determine the space actually required, you also must consider the size of the operator workstation, which on EVO can be adjusted individually, so that even smaller laboratories do not have to do without the power of a full-featured SEM. The neat plinth-based design gives superior stability and integration.

EVO provides a superior price-performance ratio

Would it surprise you to know that the EVO portfolio has options that are price competitive with tabletop SEM? EVO offers greater versatility, your needs are far less likely to outgrow its capability and your investment is futureproof. Huge upgrade possibilities enable you to tailor a SEM solution to meet your immediate – and future – requirements.

The EVO Family

Vacuum Chamber Size Options

	ZEISS EVO 10	ZEISS EVO 15	ZEISS EVO 25
	Choose EVO 10—with optional backscatter detector and Element EDS system—to be your entry point to scanning electron microscopy, at a remarkably affordable price. Even this smallest of EVO vacuum chambers is well differentiated from tabletop SEMs. Your investment in EVO now assures that you are ready for applications that require more space and ports than you anticipate today.	EVO 15 demonstrates the flexibility concept of the EVO family and excels in analytical applications. Opt for the larger vacuum chamber of the EVO 15, and add variable pressure for imaging and analysis of non-conductive samples or parts, and you have a versatile, multi-purpose solution for central microscopy facilities or industrial quality assurance laboratories.	EVO 25 is the industrial workhorse solution with enough space to accommodate even the largest parts and assemblies. Expand EVO 25 capabilities further with an optional 80 mm Z travel stage that can handle weights up to 2 kg even with tilt. Additionally, the large chamber will accommodate multiple analytical detectors for the most demanding microanalysis applications.
Maximum specimen heights	100mm	145 mm	210 mm
Maximum specimen diameter	230 mm	250 mm	300 mm
Motorized stage travel XYZ	80 x 100 x 35 mm	125 x 125 x 50 mm	130 x 130 x 50(or 80) mm
High Vacuum (HV) mode Best quality imaging and analysis on conductive samples	✔	✔	✔
Variable Pressure (VP) mode High quality imaging and analysis on uncoated, non-conductive samples	✔	✔	✔
Extended Pressure (EP) mode Environmental imaging of hydrated or contaminated samples in their natural state	✔	✔	✔

Outstanding performance and quality features

The superior price–performance ratio of EVO becomes particularly clear when compared to the limited possibilities of a tabletop (TTSEM) system:

	ZEISS EVO	Tabletop Systems
Large chamber Examine large samples or multiple samples to increase efficiency.	✔	X
5-axis motorized stage View samples from different angles – up to 90° tilt – without time-consuming rearrangement.	✔	X
Better navigation Identify regions of interest faster. Low magnification (5x) overview imaging make navigation easier.	✔	X
Higher resolution Examine your samples in detail down to the range of a few nanometers.	✔	X
Additional detectors Run advanced analysis with additional detectors to characterize your samples more comprehensively.	✔	X
Lowest acceleration voltage of 200 V Investigate non-conductive samples without the need for coating or other preparation methods.	✔	X
High acceleration voltage of above 15KV and up to 30KV Investigate your metallurgic samples at above 15KV to achieve best performance levels from your EDS detector.	✔	X
High magnification imaging Characterize the structural properties of your materials sample even further with magnifications up to 1,000,000x.	✔	X
Extendable system Expand your system to add new capabilities, like automated particle analysis, EBSD to study crystalline or polycrystalline materials.	✔	X
Correlative microscopy Integrate EVO into multimodal workflows with light or X-ray microscopes and benefit from more meaningful data.	✔	X
Longevity of your EVO SEM Get the most out of your investment from 'an instrument that can deliver well beyond 10 years of usage'	✔	X

Experience the imaging and analytics capability of EVO

Materials Research Application Examples

Alpha and beta phase brass with inclusions, secondary electron imaging
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Vermicular graphite and inclusions in cast iron, backscattered electron imaging
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Sulphide inclusion in chromium-molybdenum alloy special steel
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Titanium nitride precipitate in single phase nickel superalloy, secondary electron imaging
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Layered EDS analysis of inclusions in rolled aluminum, suitable for particle analysis applications
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Inclusions in rolled aluminum, secondary electron imaging
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Thermally sprayed aluminum on steel, EDS mapping of iron-rich and aluminum-rich layers; oxides visible in coating and substrate, carbon visible only in mounting resin
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Thermally sprayed aluminum on steel, showing coating porosity and oxide inclusions in the steel, backscattered electron imaging
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