Innovators In Electron Microscopy
Dr. Malcolm Thomas
Electron Microscopy Facility Manager
Cornell Center for Materials Research
Materials Science and Electron Microscopy
21 Years ZEISS-Specific EM Experience
Dr. Soumitra Ghoshroy
Director, Electron Microscopy Center
University of South Carolina
Plant Physiology
12 Years ZEISS-Specific EM Experience
Emma Bullock
Electron Microprobe Lab Manager
Earth & Planets Laboratory Carnegie
Institute for Science, Geochemistry and Meteoritics
6 Years ZEISS-Specific EM Experience
Kennedy Nguyen
Electron Microscopy Facility Manager
University of California Merced
Materials Science and Electron Microscopy
3 Years ZEISS-Specific EM Experience
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ZEISS GeminiSEM for the Microscopy Innovator
ZEISS Crossbeam
FIB-SEM for High Throughput 3D Analysis and Sample Preparation
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB). You may be working in a multi-user facility, as an academic or in an industrial lab. Take advantage of ZEISS Crossbeam’s modular platform concept and upgrade your system with growing needs, e.g. with the LaserFIB for massive material ablation. During milling, imaging or when performing 3D analytics Crossbeam will speed up your FIB applications.
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ZEISS GeminiSEM for the Microscopy Innovator
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