Scout-and-Scan Instrument Control System
Scout-and-Scan Instrument Control System
Easily target regions of interest and specify scanning parameters with the intuitive and easy-to-use Scout-and-Scan Control System for Xradia Versa/Context instruments.
Regular updates to Scout-and-Scan’s functionality are part of ZEISS X-ray Microscopy’s ‘Protect Your Investment’ strategy – a commitment to delivering innovation that extends the lifetime and productivity of instruments in the field with upgradable modules and new capabilities.
Latest release: Scout-and-Scan Version 16.0
Scout-and-Scan V16.0 is the latest version of software for Xradia Versa and Context systems. It is fully compatible with Windows 10 and provides the following capabilities to our users:
- Enhanced Scout-and-Zoom Workflow
- ZEISS Predictive Service
- SmartShield Compatibility
- XRM Python API
- XRM DataExplorer
- Compatibility with Advanced Reconstruction Toolbox
Enhanced Scout-and-Zoom Workflows
Scout-and-Zoom is a unique capability of ZEISS X-ray Microscopy (XRM) instruments. It allows a user to perform a low resolution, large field of view, “Scout” scan to identify interior regions for higher resolution “Zoom” scans.
Now with Scout-and-Zoom (V15.0 & V16.0) in 3 simple steps, the user can:
- Open a reconstructed dataset in Scout-and-Scan software
- Use Position Selector tool to select the desired location and import coordinates into X, Y , Z axes.
- Hit "GO“ and DONE!
ZEISS Predictive Service
Once enabled*:
- Allows for continuous monitoring of your system’s health by XRM system experts via a Secure Connection
- Helps predict and prevent system failures to eliminate unscheduled downtime
- Reduces Mean Time to Repair (MTTR)
- Stay connected for future enhancements to improve system uptime
Download the ZEISS Predictive Service brochure to learn more
*Predictive Service requires a network connection and customer approval before being setup. This tool only monitors system health and does not log any customer acquisition/sample related information.
SmartShield Compatibility
SmartShield is a fully integrated hardware-software solution designed to create digital sample envelopes to assist the operator during the sample setup in their workflow. It is an automated protection system to help users confidently position their sample and instrument components for maximum efficiency and high-quality results.
With SmartShield installed on your instrument, Scout-and-Scan V16.0 provides benefits with:
- 3D awareness for sample and instrument safety
- Enhanced operator efficiency during sample setup
- Fully integrated with Scout-and-Scan V16.0 for fast model creation within 5 minutes
SmartShield is compatible, and field upgradable, on all Xradia 620/610/520/510 Versa and Xradia Context MicroCT platforms. Prerequisites include Windows 10 and Scout-and-Scan V16.0 or higher.
Sample Envelope Application Example
Compatibility with Advanced Reconstruction Toolbox
The Advanced Reconstruction Toolbox is an innovative platform for accessing advanced reconstruction technologies. Unique modules leverage deep understanding of both X-ray physics and customer applications to solve some of the hardest imaging challenges in new and innovative ways.
- Improve data collection and analysis for accurate and faster decision-making
- Greatly enhance image quality
- Achieve superior interior tomography or throughput on a broad class of samples
- Reveal subtle difference through improved contrast-to-noise
- Increase speed at an order of magnitude for sample classes requiring repetitive workflow
Download the Advanced Reconstruction Technologies brochure to learn more
Downloads
ZEISS Predictive Service
ZEISS Smartshield Upgrade
Advanced Reconstruction Technologies
Not all products are available in every country. Use of products for medical diagnostic, therapeutic or treatment purposes may be limited by local regulations. Contact your local ZEISS provider for more information.