SEEING THE INVISIBLE Identifying buried particles using a correlated 3D X-ray and LaserFIB workflow
Analyzing Sparse and Small Buried Particles
Hitting defects accurately
How can you accurately identify and analyze micron-sized defects buried within millimeter volumes of material?
Discover a game-changing correlative workflow combining submicron-resolution 3D X-ray microscopy and FIB-SEM with an integrated femtosecond laser (LaserFIB) for streamlined, precise analysis and results available the same day.
Download this case study to learn how we characterized two isolated particles buried within a small iron plate and understand how you can apply this workflow to a variety of applications from life science to semiconductors.
Explore Related Applications
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Targeted Sample Preparation and Analysis of Advanced Packaging using Correlated X-ray Microscopy and Laser FIB
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Rapid Sample Preparation for EBSD-analysis
Enabled by the LaserFIB
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Ceramics Pre-preparation for FIB-investigation
Using ZEISS Crossbeam laser
File size: 3 MB -
Combined light-microscope
FIB/SEM failure analysis on automotive body parts
File size: 5 MB -
Resolution of a 3D X-ray Microscope
Defining Meaningful Resolution Parameters
File size: 932 KB
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