Ace Slide Scanning on your ZEISS Axioscan 7

This workshop will cover all aspects of successfully generating whole slide images utilizing the ZEISS Axioscan 7. A deep dive into software features with application examples will be covered. Current owners of ZEISS Axioscan 7 with any level of operational knowledge will primarily benefit while Z1 customers will have a chance to work with the added benefits on Axioscan 7.

This is a four-hour remote session (with breaks) broadcasted from the ZEISS Microscopy Customer Center (ZMCC) in Dublin, CA. 

Topics that will be covered in this workshop include:

• System and software overview
  
• Configuring and optimizing Brightfield Scan Profiles
  • Scan profile wizard overview
  • Coarse and Fine focus strategies
  • Scan settings
  •  Z stack , EDF, image compression
• Configuring and optimizing Fluorescence Scan Profiles
  
  • Fluorescence scan settings
  • Generate shading references and shading correction

Who should attend?

• Existing users of ZEISS Axioscan Z1 or Axioscan 7
• Infrequent users looking for a refresher on slide scanning workflows and gain higher level of proficiency
• Lab managers or technicians looking to improve their own skill level to better support and/or train other users of the instrument

Learning objectives after completion of this workshop, attendees should:

• Possess an improved ability to select imaging parameters to yield high-quality images of their samples
• Have greater confidence with setting up scan profiles and troubleshooting on challenging sample types and analyzing acquired datasets
• Be connected with the North American Applications team who can support them as they work towards acquiring the best data possible

Preview the topics covered below and register for the workshop here.