Leveraging Your ZEISS Crossbeam FIB-SEM

This workshop is intended as an introduction to the FIB milling capabilities of the ZEISS Crossbeam FIB-SEM. The goal is to demonstrate their effective use to improve milling results and increase throughput. A basic understanding of scanning electron microscopy (SEM), basic experience with SmartSEM and SmartFIB software and basic experience with Ga+ focused ion beam (FIB) milling are required.​

This is a 3-hour workshop during which best known methods for FIB milling on a variety of materials will be demonstrated. Attendees will improve their understanding of FIB parameter selection, learn how to create and effectively use custom milling recipes, and learn how to leverage FastMill and automated milling capabilities to increase throughput. ​

It is recommended that attendees secure time on their own instruments after the workshop session to practice what was shown using their own samples.

Who should attend?​

• FIB-SEM owners that want to understand how effectively leverage the capabilities of their ZEISS FIB-SEM .​
• Infrequent FIB-SEM users in need of a refresher on a variety of SmartFIB capabilities.​
• Lab managers, engineers or technicians looking to enhance their FIB knowledge and/or increase throughput using automated FIB milling capabilities.​

Learning objectives: after completion of this workshop, attendees should:​

• Have an improved understanding of basic and advanced FIB milling capabilities on a ZEISS Crossbeam tool.​
• Understand how to create and calibrate custom FIB milling recipes.​
• Be able to increase milling efficiency by selecting ideal milling parameters.​
• Be able to increase throughput by using FastMill and Automated Site Preparation (ASP) for bulk milling and TEM lamella bulk-site preparation.​
• Understand how to perform serial slice-and-image acquisition of 3D volumes.​

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This is a paid workshop. ​

Spots are limited.