
Succeed on Your FE-SEM: Establishing Imaging Workflows
A ZMCC SkillBuilder Workshop
Workshop Details
Workshop Overview & Agenda
This virtual workshop will cover methods and supporting theory to enable attendees to become more comfortable and competent operating their ZEISS Sigma FE-SEMs under varying conditions and sample types. Some prior SEM imaging background will be helpful but not required to attend. It is recommended that attendees secure time on their instruments after the workshop sessions to apply the shared methods on their own challenging samples. Attendees are strongly encouraged to share their images from individual sessions and interact with our Applications team through independent email threads for further optimization.
This is a three-hour online workshop streamed live from the ZEISS Sigma 360 FESEM located at the ZEISS Microscopy Customer Center (ZMCC) in Dublin, CA. Through screen-sharing from the instrument and multiple cameras, the complete operation of the instrument will be visible as our SEM Application experts cover a the itinerary of training topics as detailed below.
Who should attend?
- Existing users of ZEISS Sigma FESEMs (Sigma 360/560, Sigma 300/500, Sigma VP/HD/HD VP).
- Infrequent SEM users in need of a refresh of theory and techniques related to gun and beam alignment, SE vs BSE detector imaging, sample-beam interaction, high-resolution vs high-throughput imaging techniques, and efficiency gains through customization of SmartSEM
- Lab managers or technicians looking to improve their own skill level to better support and/or train other users of the instrument.
Learning objectives after completion of this workshop, attendees should:
- Attendees will learn to customize the SmartSEM interface and manage workflows using macros and recipes.
- Participants will gain skills in optimizing imaging parameters and techniques for different scenarios.
- Attendees will understand how to utilize various image collection conditions and detectors for effective imaging.
This is a paid workshop.
Spots are limited.
Preview the topics covered below and register for the workshop here.
Part 1: SmartSEM Customization for Workflow Development
- Customizing data zone and toolbar
- Basic macros and linking them to toolbar buttons
- Stage Points, Center Pointing, and Horizontal Align
- Recipe Ingredient Editor, Saving and Recalling Recipes
- Image Navigation and Registration
Part 2: Optimization of Imaging and Creating Imaging Workflows
- Sample Navigation, Recalling Stage Points - Sample Mounting and Preparation Considerations
- Auto-functions vs Manual Correction for Focus and Astigmatism Correction
- Choosing Ideal Accelerating Voltage and Aperture Selection – Use of Recipes to Quickly Recall Settings
- Ideal imaging parameters in high vacuum for high resolution vs high-throughput vs analytical
- Utilizing different image collection conditions (line average, line scan, point, and drift correction) and saving them as macros
- Detectors: SE vs InLens vs BSDs – how and when to best use them and switch between them
After the workshop sessions, the attendees are strongly encouraged to attempt the methods shown on their own systems with their own samples. Screen sharing sessions to review the data can be setup with the applications team through independent email threads. Our support team will assist in further optimization and answer any questions to help attendees acquire the best data possible.

Nathaniel joined the ZEISS Applications team in 2019 covering both Context and Versa XRM systems. Since 2020, he's expanded to cover SEM Applications on both the EVO C-SEM and Sigma and GeminiSEM FE-SEMs. Prior to working at ZEISS, Nate utilized electron microscopy techniques while studying protein biophysics at FSU and UCSD, and was an associate faculty of Chemistry at MiraCosta and Grossmont Colleges in San Diego.
Register for the workshop
This workshop costs $400 per attendee. Please fill out the form below to initiate your registration, and be sure to submit your payment at the link in the automated follow-up email to finalize your registration.