ZEISS Atlas 5

• Combine a 16 bit scan generator and dual super-sampling signal acquisition hardware with image processing and control software.
• Acquire images up to 32 k x 32 k pixels on SEMs and up to 40 k x 50 k on FIB-SEMs.  
• Use dwell times from 100 ns to > 100 s, adjustable in 100 ns increments for image acquisition.
• Save your images with 8 or 16 bits of intensity.

• Reduce acquisition time and computational complexity by defining your ROI according to its real shape and acquiring a mosaic with a reduced number of tiles.
• Reduce stage motion delay and areal fraction of each image “lost” to overlap.
• Minimize beam damage and degradation of your sample by optimizing the number of overlap “seams”.

• Define your exact region of interest and scan only the designated areas with predefined imaging protocols.
• Profit from reproducible results by developing protocols with ideal imaging conditions.
• Keep images sharp during long acquisition times with the help of advanced auto-focus and auto-stigmation tools.
• Image your sample whenever and wherever you need: Atlas 5 supports multiple sessions on multiple instruments.
• Correlate images in Atlas 5’s sample-centric correlative workspace - bring together 2D images and 3D volume data from multiple instruments.
• Import and align data from light, X-ray, electron and FIB-SEM microscopes to produce a single, consistent picture of your sample.

• Correlate X-ray microscopy volume scans from your ZEISS X-ray microscope with surface features visible in your FIB-SEM.
• Use the X-ray data to virtually localize sub-surface features in 3D to the precisely targeted FIB sites - even if they are not visible in situ.
• Then navigate to those regions with confidence using your ZEISS FIB-SEM.

Get to know Atlas 5, its modules, their features and their configurability. Extend the capacity of your ZEISS SEM and FIB-SEM with Atlas 5 as an option. Benefit from advanced capabilities of further modules and learn how they are combined. Atlas 5 modules require Atlas 5. Optional Analytics Module requires ZEISS Oxford Instruments hardware and software package. The Analytics Module on FIB-SEM requires Atlas 5 3D Tomography.

• Easily define imaging sites for all sections with the Clone Tool.
• Detect the shape of the section automatically with the Snap Section tool.
• Manage acquisition sites efficiently and even define sub-sites across sections.
• Compile all images into a 3D volume with the image stack export tool and explore them with the image stack viewer.
• Benefit from 3D Stack alignment & image corrections.
  

• Export single or multiple datasets to a format that can be viewed in a regular web browser.
• Even measurements and annotations are possible.
• Create curated slideshows based on the data for presentation purposes and embed additional information like pdf files, images, spectra, movies or audio files.
• Let your colleagues, students or peers freely explore the dataset at its best resolution and share the data easily by exchanging flash drives or by hosting it on a server.
• The user can follow the slideshow or pause at any time to explore the data on their own.

You will execute tomography in three dimensions:

• Use the 3D FIB-SEM acquisition engine with automated sample preparation to achieve precise 3D visualizations.
• Measure and precisely control slice thickness during tomography and gain “True-Z” information to process your data accurately.
• Ensure an accurate, continuous, homogeneous tomogram of samples sensitive to charging, shrinking or beam damage leveraging the “Thin & Fast Tomography”.
• Get to high quality data faster using xROIs (Exact regions of interest), Advanced sample tracking, predictive drift correction and auto-tuning.
• Make use of the image stack viewer with 3D FIB-SEM stack alignment and image stack export including cropping.