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ZEISS Versa X-ray Microscopes

Discover More with 3D X-ray Imaging at Submicron Resolution

Experience the power of ZEISS Versa X-ray microscopes, the proven choice for researchers and scientists worldwide. Versa XRM feature intuitive user interfaces, ensuring that every user can maximize their productivity and achieve exceptional results. Prioritizing real resolution in practical settings, Versa XRM provide you with the capability to observe even the smallest details with unparalleled clarity. Renowned for their stability and precision, the ZEISS commitment to quality is evident in every aspect of Versa XRM. Trust that your investment will withstand the test of time, meeting your needs for years to come.

Unparallelled resolution with performance - ZEISS VersaXRM 730
Faster submicron imaging - ZEISS VersaXRM 615
Flexibility and ease of use - ZEISS Xradia 515 Versa

Perfect Tomographies. Every Sample. Every User. Every Time.

Introducing ZEISS VersaXRM 730

ZEISS presents our newest VersaXRM® 730 3D X-ray microscope (XRM) which offers a wider array of choices than any advanced XRM on the market.

New opportunities in a constantly shifting technology landscape require new capabilities. And dynamic workforce requirements demand an intuitive user environment.

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VersaXRM 730

ZEISS VersaXRM 730 offers a wider array of choices than any advanced XRM on the market. The system delivers breakthrough resolution performance, takes accessibility to the next level with an intuitive user experience, and accelerates productivity with faster throughput and time-to-results.
450 nm spatial resolution with performance

ZEN navx user-centered guidance and control

One-minute tomographies and end-to-end 3D
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VersaXRM 615

ZEISS VersaXRM 615 extends the limits of your exploration with innovative source and optics technology. Higher flux and AI-based recon deliver faster tomographies with industry-leading resolution and contrast.
500 nm spatial resolution with RaaD

25W fast activation sealed source

FAST Mode enabled by FPX
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Xradia 515 Versa

ZEISS Xradia 515 Versa delivers class-leading resolution in a workhorse platform, breaking the one-micron barrier for 3D imaging and making synchrotron-caliber research even more practical for mid-sized imaging centers and industrial laboratories.
500-nanometer spatial resolution

40 nm minimum achievable voxel

10-watt fast activation sealed source
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VersaXRM 730

ZEISS VersaXRM™ 730 offers submicron imaging with 450-500 nm resolution across 30-160 kV with the exclusive 40x-Prime objective. Its ZEN navx™ automated user guidance and control system and AI-driven DeepRecon Pro streamline workflows, optimize image quality, and speed throughput. Designed for accessibility, it supports a broad user spectrum, enabling advanced research capabilities with ease for your whole team.

_{Mouse models are valuable tools in genetic research since they closely resemble humans in terms of physiology and genetics. Non-destructive XRM is an ideal imaging technology for such a sample. This iodine-contrasted E15.5 mouse embryo was imaged using FAST Mode on VersaXRM 730 with a total scanning time of 6 minutes. Sample courtesy of Chih-Wei Logan Hsu, Baylor College of Medicine.}

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VersaXRM 730

Perfect tomographies.¹ Every user. Every sample. Every time.

Explore the limitless potential of the ZEISS VersaXRM 730, featuring the exclusive 40x-Prime objective and the award-winning ZEN navx. This system redefines submicron imaging with unparalleled resolution performance, unlocking groundbreaking capabilities for your research. ZEN navx streamlines workflows with intelligent system insights, ensuring efficient and effortless results. Benefit from AI-based reconstruction for superior image quality and increased throughput from DeepRecon Pro, while FAST Mode enables sub-one-minute tomographies. Experience a new era of understanding your samples with the ZEISS VersaXRM 730.

Revolutionize Your Research with Unmatched Resolution Performance

ZEISS 40x-Prime Objective

Exclusive to ZEISS VersaXRM 730, the 40x-Prime objective lens enables you to achieve unparalleled resolution performance of 450-500 nm across the full range of source voltage, from 30 kV to 160 kV. This unique feature unlocks entirely new application capabilities for researchers, pushing industry standards of submicron imaging resolution. And, with more X-ray photons available, achieve even faster time to results for varied samples with uncompromised resolution. Known for their ability to achieve Resolution at a Distance (RaaD™), ZEISS VersaXRM have always enabled high resolution imaging of a wide array of sample types and sizes over a long range of length scales. Now, experience submicron imaging like never before with the higher energy capabilities and exclusive 40x-Prime objective of VersaXRM 730.

FDK. Application of ZEISS PhaseEvolve to a pharmaceutical powder sample.

DeepRecon Pro. Application of ZEISS PhaseEvolve to a pharmaceutical powder sample.

left: FDK, right: DeepRecon Pro

AI-based Image Perfection

ZEISS DeepRecon Pro from the Advanced Reconstruction Toolbox

ZEISS DeepRecon Pro has become such a powerful tool for XRM reconstruction that the ART high performance workstation and DeepRecon Pro with a two-year license are included with your VersaXRM 730.

DeepRecon Pro is an innovative AI-based technology bringing superior throughput and image quality benefits across a wide range of applications. DeepRecon Pro is applicable to both unique samples as well as semi-repetitive and repetitive workflows. Customers can now self-train new machine learning network models on-site with an extremely easy-to-use interface. The one-click workflow of DeepRecon Pro eliminates the need for a machine learning expert and can be seamlessly operated by even a novice user.

Non-destructive three-dimensional grain map of an Armco iron sample

Unlocking Crystallographic Information

LabDCT Pro for diffraction contrast tomography (DCT)

LabDCT Pro for diffraction contrast tomography (DCT), an option available exclusively on ZEISS VersaXRM 730, enables nondestructive mapping of grain orientation and microstructure in 3D. Direct visualization of 3D crystallographic grain orientation opens up a new dimension in the characterization of polycrystalline materials like metal alloys, geomaterials, ceramics, or pharmaceuticals.

LabDCT Pro supports specimens with crystal structures from cubic symmetry to systems with lower symmetry such as monoclinic materials.
Acquire high resolution crystallographic information using the dedicated 4X DCT objective. For even larger samples, use large area mapping and increase your throughput with the Flat Panel Extension (FPX).
Obtain comprehensive 3D microstructure analysis from larger representative volumes and wide-ranging sample geometries.
Investigate microstructural evolution with 4D imaging experiments.
Combine 3D crystallographic information with 3D microstructural features.
Combine modalities to understand structure-property relationships.

A single energy scan shows that aluminum and silicon are virtually identical (left side), with very similar grayscale contrast.

DSCoVer exclusively available on ZEISS Xradia 620 Versa enables separation of the particles. 3D rendering shows Aluminum/green; Silicates/red

Gain an Edge in Contrast

Dual Scan Contrast Visualizer (DSCoVer), exclusive to VersaXRM 730, extends the detail captured in a single energy absorption image by combining information from tomographies taken at two different X-ray energies. DSCoVer takes advantage of how X-rays interact with matter based on effective atomic number and density. This provides you with a unique capability for distinguishing, for example, mineralogical differences within rocks as well as among difficult-to-discern materials such as silicon and aluminum.

ZEISS Xradia 620 Versa automated filter changer, filter wheel

Achieve New Degrees of Freedom

The flagship VersaXRM 730 offers additional unique features and imaging capabilities.

Improve scan speed and accuracy of large, flat, or irregular samples with advanced acquisition techniques such as High Aspect Ratio Tomography (HART).
Flexibly image larger samples with Wide Field Mode (WFM) to stitch projections horizontally to form an extended lateral field of view for either higher voxel density for a given field of view or a wide lateral field of view to provide larger 3D volume for large samples.
Automated Filter Changer (AFC) enables seamless filter changing without manual intervention, and your selection can be programmed and recorded for each recipe.

¹
The ability to consistently generate “perfect tomographies” by all users for all samples is made possible through the use of ZEN navx with its sample-oriented parameter and user guidance, built-in workflows, and system/sample intelligence and protection, combined with the use of DeepRecon Pro AI-based 3D reconstruction.

VersaXRM 615

Unlock new degrees of versatility for your scientific and industrial research with ZEISS VersaXRM 615. This cost-effective solution for a high-end X-ray microscope delivers advanced resolution and contrast, pushing non-destructive imaging further for accelerated research. With innovative source and optics technology, enjoy rapid tomography scans that maintain quality. Seamless workflows facilitate the discovery of high resolution interest areas without sample alteration.

_{Smart watch battery. ZEISS VersaXRM 615 scans the intact battery to identify areas of interest and zoom-in for high resolution imaging.}

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Visualization of semiconductor package C4 bumps, TSVs, and Cu-pillar microbumps in a 2.5D package, enabling high-resolution views from within the intact package, 1 μm/voxel

Discover New Levels of Versatility with ZEISS VersaXRM 615

Extending the Limits of Your Exploration

Unlock new degrees of versatility for your scientific discovery and industrial research with ZEISS VersaXRM 615. This cost-effective, high-end X-ray microscope is an ideal choice for the modern analytical laboratory. With its advanced resolution and contrast capabilities, VersaXRM 615 pushes the boundaries of non-destructive imaging, offering greater flexibility and accelerating your research.

Breakthrough innovations in source and optics technology provide higher X-ray flux, enabling faster tomography scans without sacrificing resolution and contrast. Innovative acquisition workflows empower you to locate high-resolution regions of interest without cutting your sample. Seamlessly move from exploration to discovery with VersaXRM 615.

ZEISS VersaXRM use a two-stage magnification architecture to enable submicron resolution imaging at large working distances—RaaD—for a diverse set of sample sizes and types. VersaXRM 615 obtains true spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm.

ZEISS VersaXRM use a two-stage magnification architecture to enable submicron resolution imaging at large working distances—RaaD—for a diverse set of sample sizes and types. VersaXRM 615 obtains true spatial resolution of 500 nm with a minimum achievable voxel size of 40 nm.

Advanced Features for Your ZEISS VersaXRM 615

ZEN navx Guidance and Control System to empower all of your users to achieve great results.
ZEN navx File Transfer Utility for automatic transfer of data to wherever you need it most.
Volume Scout for true 3D navigation.
SmartShield and SmartShield Lite to protect your system and your sample.
DeepRecon Pro 2-year license and high-performance workstation for increased throughput (up to 10X) or superior image quality.
40x objective option for 500 nm spatial resolution with a minimum achievable voxel size of 40 nm.
FAST Mode-enabled for one-minute tomographies, providing large field of view, high throughput macroscopic imaging. Requires optional Flat Panel Extension (FPX).
Upgrade to additional capabilities from the Advanced Reconstruction Toolbox based on your research requirements.

Xradia 515 Versa

Experience exceptional versatility in your scientific and industrial research with ZEISS Xradia 515 Versa, a trusted X-ray microscope for modern labs. Its hallmark Resolution at a Distance (RaaD) capability ensures class-leading resolution over longer working distances, fostering groundbreaking insights for a wide variety of sample types. Paired with powerful contrast and 4D/in situ capabilities for a variety of research needs, this flexible platform ensures a fast time to results.

_{Copper sulfide ore imaged with Versa, using Mineralogic 3D for classification of mineralogy}

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Traditional computed tomography relies on a single stage of geometric magnification and maintaining high resolution for larger samples is impossible due to the longer working distances required. ZEISS Versa XRM feature a unique two-stage process based on synchrotron caliber optics. Multilength-scale capabilities enable you to image the same sample across a wide range of magnifications.
SmartShield provides fully integrated rapid envelope creation within Scout-and-Scan to provide 3D awareness for sample and instrument safety.

Class-leading Resolution-at-a-Distance

Xradia 515 Versa

A class above microCT, ZEISS Xradia 515 Versa enables new levels of versatility for your scientific discovery and industrial research. A workhorse of an X-ray microscope, Xradia 515 Versa employs the signature Resolution at a Distance (RaaD) technology for which Versa XRM platforms are known. Leading researchers and scientists across the world rely on RaaD to ensure high resolution across longer working distances to generate remarkable scientific insights and discoveries. Combined with powerful contrast and 4D / in situ capabilities for diverse sample sizes, types, and research requirements, the flexible ZEISS Versa X-ray microscope delivers utility and a fast time to results for your lab.

Pear imaged with absorption contrast – no visibility of cell walls.

Pear imaged with phase contrast, showing details of cell walls in normal cells and stone cells.

ZEISS Versa XRM systems deliver flexible, high contrast imaging for even your most challenging materials–low atomic number (low Z) materials, soft tissue, polymers, fossilized organisms encased in amber, and other materials of low contrast.

ZEISS Xradia 515 Versa Features

Scout-and-Scan control system
500 nm spatial resolution and minimal achievable voxel size of 40 nm with the optional 40x objective
Two-stage magnification process based on synchrotron caliber optics
SmartShield for system / sample protection
System stability for highest performance
Optional Flat Panel Extension (FPX) for large field of view imaging
Optional Advanced Reconstruction Toolbox for enhanced performance
Optional accessories: Autoloader programmable robot for handling up to 14 samples, In Situ Interface Kit for in situ / 4D imaging

  
      Perfect Tomographies. Every user. Every sample. Every time.
      
    A quick view of the capabilities of ZEISS VersaXRM 730.

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The Versatile Advantage of RaaD

The two-stage magnification technique offered by ZEISS Xradia Versa uniquely achieves Resolution at a Distance, or RaaD, which enables you to effectively study the widest range of sample sizes, including those within in situ chambers.

Images are initially magnified via geometric projection as with conventional microCT. The projected image is cast onto a scintillator, converting X-rays to a visible light image which is then optically magnified by microscope optics before acquisition by a CCD detector.

Reducing dependence on geometric magnification enables ZEISS Xradia Versa solutions to maintain submicron spatial resolution down to 500 nm at large working distances.
Powering Accessibility with the Principles of Human-centered Design

ZEN navx Guidance and Control System

ZEISS researchers studied XRM users to develop a solid understanding of the issues and challenges you face, including your biases, how you compensate, and your workarounds. With that data in hand, our expert team developed systematic built-in guidance, automated workflows, and intelligent system insights to enable even novice users to achieve results more easily and efficiently. If you are an expert user, ZEN navx offers significant efficiency benefits, "unlocking" the system to allow you to explore the full versatility of ZEISS Versa XRM. ZEN navx also provides infographic-like visualization that helps you to understand the trade-offs of your choices, e.g., between resolution, field of view, and throughput.

ZEN navx includes an embedded 3D viewer to integrate Volume Scout capability for end-to-end 3D navigation. This streamlines access to your sample to pinpoint and identify specific regions of interest to target for higher resolution imaging.

Additional capabilities include the ZEN navx File Transfer Utility, or FTU, which puts your microscope data exactly where you need it, when you need it, without having to manually transfer from system to workstation, or to save on a hard-drive to carry from place to place. SmartShield works within ZEN navx to protect your system and your sample from damage.

Winner of the Red Dot 2024 Best of the Best Interface award, ZEN navx intuitive navigation follows the evolution of the XRM user base, revolutionizing X-ray navigation and control with seamless and integrated workflows. It also complements the planning and execution of advanced correlative workflows with other ZEISS platforms in the ZEN environment.

ZEN navx is available for advanced VersaXRM platforms: VersaXRM 730 and VersaXRM 615.
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One-Minute Tomographies with Fast Acquisition Scanning Technology

FAST Mode, enabled by Your Flat Panel Extension (FPX)

FAST Mode on ZEISS VersaXRM enables rapid 3D image acquisition for all samples through continuous motion scanning. Used with the optional flat panel detector (FPX), this mode allows non-stop sample rotation during X-ray image capture at various angles, eliminating the overhead delay of traditional step-and-shoot acquisition. Thus, dramatically faster scan times can be attained when exposure times are below 0.5 seconds, typical for the large, sensitive FPX detector. Expect acquisition times generally from <1 to 5 minutes, and even below 20 seconds for less stringent image quality needs.

FAST Mode enables true, nearly real-time 3D navigation for all samples thanks to full integration with the Volume Scout workflow in ZEN navx. FAST Mode acquisition integrates seamlessly with Volume Scout to allow for nearly immediate feedback and true 3D navigation to the correct region of interest in your complex samples.
Tensile testing of laser welded steel under increasing load.

Push the Limits of Scientific Advancement

ZEISS Versa X-ray microscopes provide the industry's premier 3D imaging solution for the widest variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

These studies require samples to be further away from the X-ray source to accommodate various types of in situ rigs. On traditional microCT systems, this significantly limits the resolution achievable for your samples. ZEISS Versa XRM are uniquely equipped with dual-stage magnification architecture with RaaD technology that enable the highest resolution for in situ imaging.

ZEISS Versa XRM platforms can accommodate a variety of in situ rigs, including user-customized designs. You can add the optional in situ Interface Kit to your ZEISS Xradia XRM, which includes a mechanical integration kit, a robust cabling guide, and other facilities (feed-throughs) along with recipe-based software that simplifies your control from within the Versa Scout-and-Scan or ZEN navx user interfaces. When your needs require pushing the resolution limits of your in situ experiments, convert your ZEISS Xradia microCT or XRM to VersaXRM 730 X-ray microscope and leverage RaaD technology for the maximum performance tomographic imaging of samples within in situ chambers or rigs.
Begin Your Multi-Scale, Multi-Modal, Multi-Dimensional Microscopy with Non-destructive 3D Imaging

Because of the non-destructive nature of X-rays and the versatile array of sample types and sizes they are able to image, correlative microscopy often begins with, or is enabled by, ZEISS Versa XRM.

Using the Scout-and-Zoom or Volume Scout capabilities of Versa, you are able to clearly define your region of interest (ROI) before sacrificing your sample to premature cutting or other sample prep. Rapidly scout at low resolution with a large field of view, and then zoom to the ROI at higher resolution, whether using the range of Versa objectives (up to 40x-P), nanoscale ZEISS Ultra XRM, or ZEISS light, electron, or FIB-SEM microscopes. This prevents premature sample destruction and allows for maximum workflow efficiency while combining full sample context with key sample information.

Additionally, the ability to perform interior tomography, or to clearly see inside your sample in 3D, further reduces the risk of losing sight of your ROI. Achieve greater efficiency by pinpointing a specific “address” to which to navigate for accurate and efficient next steps for interrogating your sample.

Finally, examine your sample under varying conditions and over time with in situ and 4D studies before performing further analysis — chemical, surface, etc.— with other ZEISS modalities.

Leverage the widest array of microscopy solutions available — exclusively from ZEISS — to perform multi-modal, multi-lengthscale, multi-dimensional analyses, by starting with non-destructive 3D X-ray microscopy.

Full correlative sample workflow for the project. Initial XRM scans highlight key areas for higher resolution imaging and target locations for thin section orientation within the volume. Subsequent 2D analysis includes electron and light microscopy, leading to correlation with in situ microanalytical data.
Investment Protection

Continuous improvement and upgradeability

As your imaging needs evolve, so should your instrument. The ZEISS Versa XRM family is built on the established ZEISS Versa 3D X-ray microscope platform that is upgradeable, expandable, and reliable, paving the way for future enhancements and protecting your investment. Select the system that is right for you today and expand as your needs require.

To make certain your system offers the latest capabilities and remains serviceable, you can field-convert your platform to the latest X-ray technology: your ZEISS Context microCT can become a CrystalCT^® or higher performance Versa X-ray microscope. Your CrystalCT can become VersaXRM 730 with LabDCT. And every mid-tier Versa platform can be upgraded to the most advanced VersaXRM from ZEISS.

In addition to instrument conversions at your facility, new modules are continuously developed that will enhance your instrument to provide advanced capabilities such as in situ sample environments, unique imaging modalities, and productivity enhancing modules. Also, periodic major software releases include important new features that are made available to existing instruments, thereby enhancing and extending the capabilities of your research.
Protect your investment by upgrading your system at any time with the latest capabilities and innovations
Constant development means that you can add advanced capabilities such as in situ sample environments, unique imaging modalities, and productivity enhancing modules
Field conversion from basic systems up to most advanced systems in most instances

Making Your Versa More Powerful

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Advanced Reconstruction Toolbox

Your Easy Access to the Latest Reconstruction Technology

The Advanced Reconstruction Toolbox (ART) is an innovative platform through which you can continuously access state-of-the-art reconstruction technologies from ZEISS to enrich your research and increase the return on investment of your ZEISS Xradia 3D XRM..

These unique offerings from ZEISS leverage AI and a deep understanding of both X-ray physics and customer applications to solve some of the hardest imaging challenges in new and innovative ways. These optional modules are workstation-based solutions that provide easy access and usability.

ART modules includes:

DeepRecon Pro: Up to 10X throughput improvement for both repetitive and non-repetitive workflows. DeepRecon Pro delivers superior image quality compared to standard reconstruction. Now included with your VersaXRM 730 or VersaXRM 615.

DeepScout: Reconstruct large volumes at high resolution powered with AI-based deep learning. DeepScout enables large field of view high-resolution images at high throughput.
Materials Aware Reconstruction Solution (MARS): Metal artifact reduction made easy. MARS reduces multi-material artifacts, e.g., metal implants in bone and tissue, or solder balls on semiconductor packages.
PhaseEvolve: Enhanced image contrast for low-medium density samples/high-resolution imaging applications. Improve segmentation by removing phase contrast fringes.
OptiRecon: For your interior tomographies, select from up to 4X-10X improved throughput at an acceptable image quality, or, improved image quality at the same level of throughput as standard (FDK) reconstruction.

ART modules are now available in four convenient packages:

AI Supercharger: DeepScout and DeepRecon Pro
Artifact Reduction package: PhaseEvolve and Material Aware Reconstruction Solution (MARS)
Recon package: OptiRecon and DeepRecon Pro

More about Advanced Reconstruction Toolbox
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Watch this video and gain insights into the workflow guided by SmartShield.

SmartShield

Easily Protect Your Sample to Optimize Experiment Setup

SmartShield is a solution that protects your sample and your microscope. This automated collision avoidance system works within the ZEN navx and Scout-and-Scan control systems. It enables you to navigate Versa more confidently than ever. With the click of a button SmartShield creates a digital protective layer based on the dimensions of your sample.

Use SmartShield Lite in ZEN navx for VersaXRM 730 and VersaXRM 615 for instant protection of highly transparent, reflective, and flat samples, or samples smaller than 1 mm in diameter.

With SmartShield, you benefit from:

3D awareness for sample and instrument safety

Improved operator efficiency enabled by a streamlined sample setup
Enhanced user experience for novice and advanced users
Protection of your valuable samples and your investment
Uncompromising scan quality
Fully integrated rapid envelope creation within ZEN navx

Application Examples

ZEISS VersaXRM at work

Flux grown layered KBiS2 semiconductor crystal. 3D volume rendering shows the complex 3D microstructure consisting of rod and needle structure. Sample courtesy of Prof. Daniel Shoemaker, UIUC

Flux grown layered KBiS2 semiconductor crystal. 3D volume rendering shows the complex 3D microstructure consisting of rod and needle structure. Sample courtesy of Prof. Daniel Shoemaker, UIUC

Materials Research

Experience the unique benefits of ZEISS VersaXRM, including non-destructive views of deeply buried microstructures, compositional contrast for studying challenging materials, and the ability to maintain RaaD for in situ imaging.
Enjoy fast and intuitive 3D navigation technology for macro-scale inspection and easily identify regions of interest for high-resolution imaging.
Benefit from faster throughput, improved image quality, and resolution performance, allowing for better data, increased sample statistics, more users, and enhanced instrument utilization.
Segmented active ingredient particles in an antihistamine tablet. Following imaging on a ZEISS Versa XRM, the data was reconstructed using ZEISS DeepRecon Pro to improve contrast between similar low density materials for better segmentation. Widest width of tablet is 5 mm.

3D rendering of a bund le of Rayon polymer fibers that have been imaged in propagation phase contrast mode. The 3D rendering shows a high-resolution 3D dataset processed using ZEISS PhaseEvolve to enhance the microvoids in individual fibers. Color represents void volume.

Tomography and segmentation of multiple phases in a high density concrete nuclear reactor vessel. 3D view shows segmentation of pores (red) and high-density minerals titanomagnetite and ilmenite (yellow) in chips of dolerite within the concrete. Concrete core 15 mm diameter. Sample courtesy of Giacomo Torelli, University of Sheffield, UK

Carbon fiber reinforced polymer composite.
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3D dataset of a mouse brain that was imaged with the 40×-P objective of ZEISS Versa XRM and reconstructed using ZEISS DeepRecon Pro. Sample courtesy of Dr. Kevin Boergens, the University of Illinois at Chicago, US

Life Sciences

Capture whole samples at multiple length scales with ZEISS VersaXRM, utilizing RaaD and FAST Mode to easily navigate and capture high-resolution regions of interest.
Overcome limitations in imaging large sample volumes by leveraging ZEISS DeepScout, generating high-resolution overviews that were previously unreachable.
Benefit from high-contrast images acquired with VersaXRM, enabling precise identification of structures of interest for fail-proof segmentation and localization for higher resolution acquisition using electron microscopy.
Dragonfly, imaged in its native structure without any sample preparation and sectioning.

Greyscale image is a single slice from a 3D dataset of a mouse brain that was imaged with the 40×-P objective of ZEISS Versa XRM and reconstructed using ZEISS DeepRecon Pro. Sample courtesy of Dr. Kevin Boergens, the University of Illinois at Chicago, US.

The XRM micrograph of a blossom reveals its components in a new 3D view. Sepals (yellow) and petals (purple) can be distinguished.

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Embedded plant root in soil: the root can be recognized as a dominant structure within the soil which consists of grains of different sizes and shapes. Voxel size: 5.5 µm.
Porosity and permeability measurements in key sedimentary rocks for carbon capture and storage can be made with detailed characterization of porous media in 3D. High resolution data allow for detailed analysis of connected (green) and isolated (red) porosity.

Porosity and permeability measurements in key sedimentary rocks for carbon capture and storage can be made with detailed characterization of porous media in 3D. High resolution data allow for detailed analysis of connected (green) and isolated (red) porosity.

Geological Research

Experience the fast and precise nanoscale tomography imaging capabilities of ZEISS VersaXRM for geological samples, enabling detailed examination of samples from Earth and beyond.
Benefit from the accurate 3D nanoscale support for in situ studies, fluid flow analysis, mineral reactivity studies, mineral phase segmentation, and diffraction contrast tomography with ZEISS LabDCT Pro.
Enjoy high throughput multiscale imaging and characterization of rock and fossil samples, leading to improved efficiencies and more time for data interpretation.
Achieve higher quality data for enhanced image analysis and AI applications, and combine the power of ZEISS Versa XRM with automated segmentation software for CT automated quantitative mineralogy.
Granulite facies metagabbro sample from the Lewisian complex that has been analyzed using Mineralogic 3D software for quantitative analysis of mineralogy, grain size, shape, and distributions, as well as mineral relationships, inclusion assemblages and more all prior to destructive sample preparation.

Quantitative XRM give a unique opportunity to identify key minerals in the battery raw materials supply chain. Spodumene and plagioclase feldspar can be clearly differentiated, and segmentation provides associated heavy mineral relationships.

Cu-Ni ore: 4-minute FAST Mode scan with DeepRecon Pro AI-assisted automated mineralogy with Mineralogic 3D provides particle analysis and mineral identification direct from XRM data for process mineralogy, liberation, and locking.

Segmentation of heavy minerals (orange) in a silicate-rich Vesta meteorite sample
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Comprehensive characterization of an AM aluminum gear wheel reveals inclusions, pores, and deviation of dimensions relative to the CAD model. Sample courtesy of Timo Bernthaler, University of Aalen, Germany.

Additive Manufacturing

Utilize Scout-and-Zoom technology to swiftly access inner structures without any sample manipulation, saving time and effort.
Enhance the speed of inspection throughout the additive manufacturing process chain, ensuring high-quality results.
Benefit from class-leading submicron resolution to thoroughly analyze process parameters and material characteristics with precision.
Surface roughness evaluation of an AM printed duct (Ti-6Al-4V); high resolution scan acquired at ~1.7 mm voxel over a ~3.4 mm area.

Imaging of different A205 AM powder qualities at 3.9 µm voxel resolution.

Display lattice metal additive manufacturing manifold. Sample courtesy from Penn United Technologies Inc.

Additive manufactured lattice structure.

Inner structure of an AM manufactured aluminum gear wheel; 3 µm voxel resolution imaging is used to see unmelted particles, high-Z inclusions, and small voids.
3D view of a radio frequency package acquired at 1.2 µm voxel resolution with FAST Mode acquisition for 10 min scan.

3D view of a radio frequency package acquired at 1.2 µm voxel resolution with FAST Mode acquisition for 10 min scan.

Electronics and Semiconductor Packaging

Harness groundbreaking RaaD capability and AI-enabled fast scans to non-destructively image IC packages and internal defects.
Simplify and optimize your experience with the intuitive ZEN navx user interface, which improves operational efficiency through built-in onscreen guidance, sample intelligence, and streamlined workflows.
Achieve faster time-to-results with faster throughput at a large field of view (FOV), enabling quicker identification of failures, root causes, and facilitating more sample runs for failure analysis, packaging development, and competitive analysis applications.
Visualization of C4 bumps, TSVs, and Cu-pillar micro bumps in a 2.5D package, enabling high-resolution views from within the intact package, 1 µm/voxel.

2D slice view of solder fatigue cracks in a thermal cycled smartphone control board at 2.5 μm voxel resolution.

Non-destructive visualization and characterization of solder fatigue cracks in a thermal cycled smartphone control board at 2.5 μm voxel resolution.

3D visualization at 1 μm voxel resolution of the defective Cu pillar solder pins in a fingerprint sensor device.
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X-ray microscopy scan of a medical device, a dry powder inhaler. A cross-sectional virtual slice of a scan obtained using FPX is shown on the left and a clipped 3D rendering on the right. Different grayscale values on the left side c orrespond to different density materials.

Industrial Inspection and Quality Control

Empower fast access to internal features of a part without the need for destruction or disassembly, thanks to Volume Scout technology embedded in ZEN navx.
Achieve high-quality inspection of manufactured parts and assembled devices with faster throughput, while preserving their integrity.
Conduct detailed analysis of microstructures in parts and evaluate their material characteristics with the class-leading submicron resolution.
Asthma inhaler, showing details of a drug particulates blockage at the exit of the actuator. 2D slice in the center was obtained from a full 3D scan of the device using FPX.

3D printed plastic lattice imaged in 17 seconds in FAST Mode on FPX.

Twisted iron honeycomb prepared by hydrogel infusion additive manufacturing (HIAM).
Number of DCT projections: 16652
Number of grains: > 100,000
Sample courtesy: Dr. Sammy Shaker, CalTech

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X-ray microscopy scan of a small carburetor with a semi-transparent visualization of a 3D rendering showing its components, segmented in false colors, including porosity details segmented in red.
3D renderings and 2D slice view of rechargeable lithium ion 2025 coin cell battery.

Lithium Ion Batteries

Achieve high-resolution imaging of intact pouch and cylindrical cells for longitudinal studies of aging effects across hundreds of charge cycles with Resolution at a Distance.
Benefit from the unmatched fidelity of the only tool capable of looking into an intact battery.
Identify the region of interest for high-resolution investigations using Scout-and-Zoom.
Enjoy dramatically reduced high-resolution scan times with VersaXRM.
Conduct high-resolution interior tomographies across larger samples with ZEISS DeepScout.
Intact cylinder cell (160 kV) – welding burrs, metallic inclusions, folds and kinks in conductive layers.

Small pouch cell (80 kV) – in situ microstructure, aging effect at cathode grain level, separator layer.

Small pouch cell: 0.4x overview scan; 4x Resolution at a Distance; 20x RaaD.

3D volume of materials within black mass, a powder generated from the crushing & shredding of recycled batteries. Cathode particles (blue) and residual foils (turquoise) individually segmented using Mineralogic 3D for quantification and analyses.

Accessories

Upgrade your microscope with additional accessories to enhance its capabilities

Flat Panel Extension (FPX)

Large Sample, High Throughput Scanning

FPX enhances imaging flexibility and creates workflow efficiencies for industrial and academic research. Scout-and-Zoom is a unique capability of ZEISS Versa X-ray microscopes that leverages FPX to perform a low resolution, large field of view, scout-scan to identify interior regions for higher resolution zoom-scans on a variety of different sample types. The Volume Scout workflow streamlines this process within ZEN navx. On ZEISS VersaXRM 730 and VersaXRM 615 platforms, FPX enables FAST Mode, allowing for sub-one-minute tomographies for efficient 3D navigation and rapid sample inspection. Combine with Volume Scout for end-to-end 3D navigation.

Autoloader

Maximize Your Instrument’s Utilization

Maximize use and minimize user intervention with the optional ZEISS Autoloader. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 sample stations, which can support up to 70 samples, queue, and allow to run all day, or off-shift.

In Situ Interface Kit

Push the Limits of Scientific Discovery

ZEISS Versa platforms can accommodate a variety of in situ rigs, from high-pressure flow cells to tension, compression, and thermal stages, to user-customized designs. Moving beyond the three dimensions of space, leverage the non-destructive nature of X-ray investigation to extend your studies into the dimension of time with 4D experiments.

Mouse embryo arivis Pro segmentation. Courtesy Baylor College of Medicine, USA — Baylor College of Medicine, USA

ZEISS arivis Pro

ZEISS arivis Pro empowers you to automate image analysis and visualization pipelines. Leverage traditional methods or AI models effortlessly to create pipelines for any image size, dimension, or modality without the need to code.

Learn more

Segment, classify, and denoise images based on deep learning algorithms accessible through a dedicated user interface for training AI models

ZEN AI Toolkit including Intellesis

Machine learning can exponentially increase the throughput of image analysis and reduce the risk of human error. This toolkit contains solutions for image denoising, image segmentation, and object classification.

Learn more

Dragonfly 3D World ZEISS edition

An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray, FIB-SEM, SEM and helium ion microscopy. Available exclusively through ZEISS, 3D World ZEISS edition an intuitive, complete, and customizable toolkit for visualization and analysis of large 3D grayscale data. 3D World allows for navigation, annotation, creator files, including video production, of your 3D data. Perform image processing, segmentation, and object analysis to quantify your results.

Related Applications

Downloads

40×-Prime Objective from ZEISS

Enhance Resolution and Image Quality On ZEISS Xradia VersaXRM

3 MB

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Class-leading resolution at a distance.

ZEISS Xradia 515 Versa 3D X-ray Microscope

1 MB

Download

Extending the Frontiers of Semiconductor Failure Analysis

ZEISS Versa 3D X-ray Microscope Family

1 MB

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Extend the Limits of Your Exploration with Advanced 3D X-ray Microscopy

ZEISS VersaXRM 615

1 MB

Download

Identify, Access, Prepare, Analyze Your Sample with Precise Navigational Guidance

ZEISS Sample-in-Volume Analysis Workflow

651 KB

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LabDCT Pro on ZEISS VersaXRM 730

Product Accessories

4 MB

Download

Metrology Extensionfor ZEISS Xradia Versa

Adding measurement accuracy to X-ray microscopy.

812 KB

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One-Minute Tomography

FAST Mode on FPX

2 MB

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Perfect Tomographies. Every sample. Every user. Every time.

ZEISS VersaXRM 730

1 MB

Download

ZEISS AI Supercharger

Enabling AI-based Reconstruction for Your ZEISS X-ray microscope

3 MB

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ZEISS Mineralogic 3D

The next dimension in automated mineralogy

2 MB

Download

ZEISS Mineralogic 3D for Mining - Flyer

Your geometallurgy goals realized with maximum efficiency

539 KB

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ZEISS PhaseEvolve

Reveal contrast that has never been seen before

1 MB

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ZEISS Versa X-ray Microscope Offerings

679 KB

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ZEISS Xradia 515 Versa3D X-ray Microscope

Non-destructive imaging for advanced packaging.

995 KB

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ZEISS ZEN AI Toolkit

Segmentation and Classification by Machine Learning

1 MB

Download
$Preview image of Diffraction Contrast Tomography$

Diffraction Contrast Tomography

Unlocking Crystallographic Information from Laboratory X-ray Microscopy

1 MB

Download

Originally Published at ISTFA 2022

A Correlative Microscopic Workflow for Nanoscale Failure Analysis and Characterization of Advanced Electronics Packages

5 MB

Download

Resolution of a 3D X-ray Microscope

Defining Meaningful Resolution Parameters

932 KB

Download

X-ray Nanotomography in the Laboratory

with ZEISS Xradia Ultra 3D X-ray Microscopes

6 MB

Download

3D X-ray Imaging in Life Science Research

An Introduction to Capturing the 3D Structure of Biological Specimens Using X-rays

3 MB

Download

4D Study of Silicon Anode Volumetric Changes in a Coin Cell Battery using X-ray Microscopy

1 MB

Download

ZEISS Microscopy Solutions for Geoscience

Understanding the fundamental processes that shape the universe expressed at the smallest of scales

15 MB

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ZEISS Microscopy Solutions for Oil & Gas

Understanding reservoir behavior with pore scale analysis

7 MB

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ZEISS Xradia Versa X-ray microscopes

3D Quantitative Histology of Zebraish

1 MB

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