![使用蔡司Sigma 300进行软磁复合材料的定量EBSD研究]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.100.100.230,0,824,594.file/screensaver-routine-metallography-3.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.360.360.230,0,824,594.file/screensaver-routine-metallography-3.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/resource-center/insights-hub/thumbnails/screensaver-routine-metallography-3.jpg/_jcr_content/renditions/original.image_file.594.594.230,0,824,594.file/screensaver-routine-metallography-3.jpg"} "使用蔡司Sigma 300进行软磁复合材料的定量EBSD研究")
用于常规金相学的显微镜解决方案
革新性常规金相学
探索用于金属分析的前沿显微镜解决方案
金属特性及其在使用中的行为主要受其微观结构影响。所有关键的机械特性、腐蚀行为和疲劳性能都受到晶粒尺寸、成分、相尺寸/分布、夹杂物和局部微观结构变化的综合影响。
针对这一需求，蔡司提供先进的解决方案产品组合，涵盖了用于常规金相学和质量控制的各种显微镜技术：
![使用机器学习增强图像分析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.100.67.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.360.240.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.768.512.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.960.640.0,65,960,705.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg"} "使用机器学习增强图像分析")
![使用机器学习增强图像分析]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.100.80.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.360.289.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original.image_file.768.616.file/rapid-machine-learning-segmentation-of-duplex-ss.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/rapid-machine-learning-segmentation-of-duplex-ss.jpg/_jcr_content/renditions/original./rapid-machine-learning-segmentation-of-duplex-ss.jpg"} "使用机器学习增强图像分析")
使用机器学习增强图像分析
在进行图像或三维数据集的定量分析时，分割步骤必不可少。分割是将图像划分为多个区域并以某种方式将其相互区分的操作。分割完成后，便可对这些区域进行分析，以获取实际可操作的数据——这些区域可以是单个晶粒、夹杂物、气孔、不同的相、层或任何需要检查的对象。
多区域分割可能极具挑战
- 不同区域可能具有相似的颜色/对比度
- 不同区域可能只有纹理不同
- 伪影/划痕可能会产生错误信息
- 三维数据集中的噪声会影响分割精度
- 多通道（RGB或更多）图像的分析越来越复杂
![蔡司ZEN Intellesis使用向导式机器学习来克服这些分割问题。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.100.75.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.360.270.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.768.576.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.960.720.0,51,960,771.file/zen-intellesis-monitor_2021.jpg"} "蔡司ZEN Intellesis使用向导式机器学习来克服这些分割问题。")
![蔡司ZEN Intellesis使用向导式机器学习来克服这些分割问题。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.100.104.file/zen-intellesis-monitor_2021.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.360.375.file/zen-intellesis-monitor_2021.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original.image_file.768.800.file/zen-intellesis-monitor_2021.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/applications/raw-materials-industrial-r-d/metals/zen-intellesis-monitor_2021.jpg/_jcr_content/renditions/original./zen-intellesis-monitor_2021.jpg"} "蔡司ZEN Intellesis使用向导式机器学习来克服这些分割问题。")
蔡司ZEN Intellesis使用向导式机器学习来克服这些分割问题。通过用户在简洁图形工作流中提供的训练输入，它可利用30多个不同的参数来评估每个像素，并将其正确归类。该过程重复进行，旨在训练机器学习模型，从而不断提升其性能和精度。随后，用户便可将机器学习自动应用到整个数据集中，将数百幅图像或三维数据集分割成易于分析的格式。借助蔡司ZEN Intellesis，日常显微镜用户无需具备机器学习的专业知识，便能充分利用人工智能的力量。
![促销：一年免费的软件维护协议为ZEN core保驾护航]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.100.100.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.360.360.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.768.768.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.1024.1024.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.1280.1280.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.1440.1440.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/software/zen/zen-core-sma/zeiss_sma_zen_core_keyvis.jpg/_jcr_content/renditions/original.image_file.1920.1920.0,579,4500,5079.file/zeiss_sma_zen_core_keyvis.jpg"} "促销：一年免费的软件维护协议为ZEN core保驾护航")
![用于材料分析的蔡司Axioscope]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axioscope-for-materitals/axioscope-5-polarization_system-side2.jpg/_jcr_content/renditions/original.image_file.1080.1080.420,0,1500,1080.file/axioscope-5-polarization_system-side2.jpg"} "用于材料分析的蔡司Axioscope")
![用于材料研究的蔡司Axio Imager 2]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.100.100.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.360.360.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.768.768.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1024.1024.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1082.1082.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1082.1082.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/light/widefield/axio-imager-2-for-materials/axio-imager-z2_product_mrc.jpg/_jcr_content/renditions/original.image_file.1082.1082.420,0,1502,1082.file/axio-imager-z2_product_mrc.jpg"} "用于材料研究的蔡司Axio Imager 2")
![蔡司EVO——操作直观的模块化扫描电子显微镜平台，适用于日常检测与研究应用]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.100.100.file/evo_stage.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.360.360.file/evo_stage.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.768.768.file/evo_stage.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/evo_stage.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/evo_stage.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/evo_stage.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/evo/evo_stage.jpg/_jcr_content/renditions/original./evo_stage.jpg"} "蔡司EVO")
![蔡司ZEN core]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.100.100.0,0,1390,1390.file/zen-core_cover-image_2.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.360.360.0,0,1390,1390.file/zen-core_cover-image_2.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.768.768.0,0,1390,1390.file/zen-core_cover-image_2.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.1024.1024.0,0,1390,1390.file/zen-core_cover-image_2.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.1280.1280.0,0,1390,1390.file/zen-core_cover-image_2.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.1390.1390.0,0,1390,1390.file/zen-core_cover-image_2.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/service-support/software-maintenance-agreement/zen-core_cover-image_2.jpg/_jcr_content/renditions/original.image_file.1390.1390.0,0,1390,1390.file/zen-core_cover-image_2.jpg"} "蔡司ZEN core")